Influence of the epitaxial-layer defects on the breakdown characteristics of the SiC schottky diode (에피박막 결함이 탄화규소 쇼트키 다이오드소자의 항복전압 특성에 미치는 영향)
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- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 2004.11a
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- pp.285-288
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- 2004