• Title/Summary/Keyword: Vector-valued process capability index

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Bootstrapping Vector-valued Process Capability Indices

  • Cho, Joong-Jae;Park, Byoung-Sun
    • Communications for Statistical Applications and Methods
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    • v.10 no.2
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    • pp.399-422
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    • 2003
  • In actual manufacturing industries, process capability analysis often entails characterizing or assessing processes or products based on more than one engineering specification or quality characteristic. Since these characteristics are related, it is a risky undertaking to represent variation of even a univariate characteristic by a single index. Therefore, the desirability of using vector-valued process capability index(PCI) arises quite naturally. In this paper, some vector-valued ${PCI}_p$ ${C}_p$=(${C}_{px}$, ${C}_{py}$),${C}_{pk}$=(${C}_{pkx}$, ${C}_{pky}$) and ${C}_{pm}$=(${C}_{pmx}$, ${C}_{pmy}$) considering univariate PCIs ${C}_p$,${C}_{pk}$ and ${C}_{pm}$ are studied. First, we propose some asymptotic confidence regions of our vector-valued PCIs with bootstrap. And we examine the performance of asymptotic confidence regions of our vector-valued PCIs ${C}_p$ and ${C}_{pk}$ under the assumption of bivariate normal distribution BN($\mu_{x}$, $\mu_{y}$, $\sigma_{x}^{2}$, $\sigma_{y}^{2}$, $\rho$) and bivariate chi-square distribution Bivariate $x^2$(5,5,$\rho$).

On the Plug-in Estimator and its Asymptotic Distribution Results for Vector-Valued Process Capability Index Cpmk (2차원 벡터 공정능력지수 Cpmk의 추정량과 극한분포 이론에 관한 연구)

  • Cho, Joong-Jae;Park, Byoung-Sun
    • Communications for Statistical Applications and Methods
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    • v.18 no.3
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    • pp.377-389
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    • 2011
  • A higher quality level is generally perceived by customers as improved performance by assigning a correspondingly higher satisfaction score. The third generation index $C_{pmk}$ is more powerful than two useful indices $C_p$ and $C_{pk}$ that have been widely used in six sigma industries to assess process performance. In actual manufacturing industries, process capability analysis often entails characterizing or assessing processes or products based on more than one engineering specification or quality characteristic. Since these characteristics are related, it is a risky undertaking to represent the variation of even a univariate characteristic by a single index. Therefore, the desirability of using vector-valued process capability index(PCI) arises quite naturally. In this paper, we consider more powerful vector-valued process capability index $C_{pmk}$ = ($C_{pmkx}$, $C_{pmky}$)$^t$ that consider the univariate process capability index $C_{pmk}$. First, we examine the process capability index $C_{pmk}$ and plug-in estimator $\hat{C}_{pmk}$. In addition, we derive its asymptotic distribution and variance-covariance matrix $V_{pmk}$ for the vector valued process capability index $C_{pmk}$. Under the assumption of bivariate normal distribution, we study asymptotic confidence regions of our vector-valued process capability index $C_{pmk}$ = ($C_{pmkx}$, $C_{pmky}$)$^t$.

On the Confidence Region of Vector-valued Process Capability Indices $C_p$& $C_pk$ (2차원 벡터 공정능력지수 $C_p$$C_pk$의 근사 신뢰영역)

  • 박병선;이충훈;조중재
    • Journal of Korean Society for Quality Management
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    • v.30 no.4
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    • pp.44-57
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    • 2002
  • In this paper we study two vector-valued process capability indices $C_{p}$=($C_{px}$, $C_{py}$ ) and $C_{pk}$=( $C_{pkx}$, $C_{pky}$) considering process capability indices $C_{p}$ and $C_{pk}$. First, we derive two asymptotic distributions of plug-in estimators (equation omitted) and (equation omitted) under. some proper. conditions. Second, we examine the performance of asymptotic confidence regions of our process capability indices $C_{p}$=( $C_{px}$ , $C_{py}$ ) and $C_{pk}$=( $C_{pkx}$, $C_{pky}$) under BN($\mu$$_{x}$, $\mu$$_{y}$, $\sigma$$^2$$_{x}$, $\sigma$$^2$$_{y}$,$\rho$)$\rho$)EX>)EX>)EX>)

On Statistical Estimation of Multivariate (Vector-valued) Process Capability Indices with Bootstraps)

  • Cho, Joong-Jae;Park, Byoung-Sun;Lim, Soo-Duck
    • Communications for Statistical Applications and Methods
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    • v.8 no.3
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    • pp.697-709
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    • 2001
  • In this paper we study two vector-valued process capability indices $C_{p}$=($C_{px}$, $C_{py}$ ) and C/aub pm/=( $C_{pmx}$, $C_{pmy}$) considering process capability indices $C_{p}$ and $C_{pm}$ . First, two asymptotic distributions of plug-in estimators $C_{p}$=($C_{px}$, $C_{py}$ ) and $C_{pm}$ =) $C_{pmx}$, $C_{pmy}$) are derived.. With the asymptotic distributions, we propose asymptotic confidence regions for our indices. Next, obtaining the asymptotic distributions of two bootstrap estimators $C_{p}$=($C_{px}$, $C_{py}$ )and $C_{pm}$ =( $C_{pmx}$, $C_{pmy}$) with our bootstrap algorithm, we will provide the consistency of our bootstrap for statistical inference. Also, with the consistency of our bootstrap, we propose bootstrap asymptotic confidence regions for our indices. (no abstract, see full-text)see full-text)e full-text)

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Statistical Estimation for Hazard Function and Process Capability Index under Bivariate Exponential Process (이변량 지수 공정 하에서 위험함수와 공정능력지수에 대한 통계적 추정)

  • Cho, Joong-Jae;Kang, Su-Mook;Park, Byoung-Sun
    • Communications for Statistical Applications and Methods
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    • v.16 no.3
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    • pp.449-461
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    • 2009
  • Higher sigma quality level is generally perceived by customers as improved performance by assigning a correspondingly higher satisfaction score. The process capability indices and the sigma level $Z_{st}$ ave been widely used in six sigma industries to assess process performance. Most evaluations on process capability indices focus on statistical estimation under normal process which may result in unreliable assessments of process performance. In this paper, we consider statistical estimation for bivariate VPCI(Vector-valued Process Capability Index) $C_{pkl}=(C_{pklx},\;C_{pklx})$ under Marshall and Olkin (1967)'s bivariate exponential process. First, we derive some limiting distribution for statistical inference of bivariate VPCI $C_{pkl}$. And we propose two asymptotic normal confidence regions for bivariate VPCI $C_{pkl}$. The proposed method may be very useful under bivariate exponential process. A numerical result based on our proposed method shows to be more reliable.