• Title/Summary/Keyword: Vce-sat

Search Result 13, Processing Time 0.017 seconds

Study on the Electrical Characteristics of 600 V Trench Gate IGBT with Single N+ Emitter (600 V급 IGBT Single N+ Emitter Trench Gate 구조에 따른 전기적 특성)

  • Shin, Myeong Cheol;Yuek, Jinkeoung;Kang, Ey Goo
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.32 no.5
    • /
    • pp.366-370
    • /
    • 2019
  • In this paper, a single N+ emitter trench gate-type insulated gate bipolar transistor (IGBT) device was studied using T-CAD, in order to achieve a low on-state voltage drop (Vce-sat) and high breakdown voltage, which would reduce power loss and device reliability. Using the simulation, the threshold voltage, breakdown voltage, and on-state voltage drop were studied as a function of the temperature, the length of time in the diffusion process (drive-in) after implant, and the trench gate depth. During the drive-in process, a $20^{\circ}C$ change in temperature from 1,000 to $1,160^{\circ}C$ over a 150 minute time frame resulted in a 1 to 4 V change in the threshold voltage and a 24 to 2.6 V change in the on-state voltage drop. As a result, a 0.5 um change in the trench depth of 3.5 to 7.5 um resulted in the breakdown voltage decreasing from 802 to 692 V.

Analysis of the electrical characteristics of the novel IGBT with additional nMOS (새로운 구조의 nMOS 삽입형 IGBT의 전기적 특성 분석)

  • Shin, Samuell;Son, Jung-Man;Park, Tea-Ryoung;Koo, Yong-Seo
    • Journal of IKEEE
    • /
    • v.12 no.4
    • /
    • pp.255-262
    • /
    • 2008
  • In this paper, we proposed the novel IGBT with an additional n-type MOS structure to achieve the improved trade-off between turn-off and on-state voltage drop(Vce(sat)). These low on-resistance and the fast switching characteristics of the proposed IGBT are caused by an enhanced electron current injection efficiency which is caused by additional n-type MOS structure. In the simulation result, the proposed IGBT has the lower on state voltage of 2.65V and the shorter turn-off time of 4.5us than those of the conventional IGBT(3.33V, 5us).

  • PDF

Analysis of the electrical characteristics of the novel TIGBT with additional pMOS (새로운 구조의 pMOS 삽입형 TIGBT의 전기적 특성 분석)

  • Lee, Hyun-Duck;Won, Jong-Il;Yang, Yil-Suk;Koo, Yong-Seo
    • Journal of IKEEE
    • /
    • v.14 no.1
    • /
    • pp.55-64
    • /
    • 2010
  • In this paper, we proposed the novel TIGBT with an additional p-type MOS structure to achieve the improved trade-off between turn-off and on-state voltage drop(Vce(sat)). These low on-resistance and the fast switching characteristics of the proposed TIGBT are caused by an enhanced electron current injection efficiency which is caused by additional p-type MOS structure. In the simulation result, the proposed TIGBT has the lower on state voltage of 1.67V and the shorter turn-off time of 3.1us than those of the conventional TIGBT(2.25V, 3.4us).