Dislocation Analysis of CVD Single Crystal Diamond Using Synchrotron White Beam X-Ray Topography (가속기 백색광 X-Ray Topography를 이용한 CVD 단결정 다이아몬드 내부 전위 분석)
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- Journal of the Korean Institute of Electrical and Electronic Material Engineers
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- v.32 no.3
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- pp.192-195
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- 2019