• Title/Summary/Keyword: Vacuum Glass

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Growth and Characterization of Graphene Controlled by Cooling Profile Using Near IR CVD

  • Park, Yun-Jae;Im, Yeong-Jin;Kim, Jin-Hwan;Choe, Hyeon-Gwang;Jeon, Min-Hyeon
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.207-207
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    • 2013
  • 기존의 그래핀 성장에 관한 연구는 열화학기상증착법(Chemical vapor deposition; CVD)을 이용한다. 그래핀 성장 제어 요소로는 촉매 기판인 전이 금속[Ru, Ir, Co, Re, Pt, Pd, Ni, Cu], 기판 전처리 과정, 수소/메탄 가스 혼합비, 작업 진공 상태, 기판온도[$800{\sim}1,000^{\circ}C$, 냉각 속도 등으로 보고 되고 있다. 그래핀 성장 원리는 Cu 촉매 기판에 메탄 가스를 $1,000^{\circ}C$ 온도에서 분해해서 탄소를 고용 시킨 후 급랭하는 도중에 석출되는 탄소에 의해 그래핀 시트가 형성되는 것으로 알려져 있다. 기존의 CVD를 열원을 이용할 경우 내부 챔버에 생기는 잠열에 의해 cooling profile의 제어가 용이하지 않다. 본 연구에서는 근적외선(Near Infrared; NIR) 열원을 이용한 CVD로 챔버 내부 잠열을 최소화하고, 냉각 공정을 Natural, Linear, Convex cooling type으로 디자인해서 cooling profile 제어가 그래핀 성장에 미치는 영향을 연구 하였다. 이렇게 성장된 그래핀을 임의의 기판(SiO2, Glass, PET film) 위에 습식방법으로 전이 시킨 후, 전기적 구조적 및 광학적 특성을 면저항(four-point probe), 전계방사 주사전자현미경(Field Emission Scanning Electron Microscope; FE-SEM), 마이크로 라만 분광법(Micro Raman spectroscopy) 및 광학현미경(optical microscope), 투과도(UV/Vis spectrometer)의 측정으로 잠열이 최소화된 NIR-CVD에서 cooling profile에 따른 그래핀 성장을 평가하였다.

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진공밀폐 용해법으로 제조된 $La_zCo_4Sb_{12}$ Skutterudite의 열전특성

  • Park, Gwan-Ho;Yu, Sin-Uk;Sin, Dong-Gil;Lee, Go-Eun;Jeon, Bong-Jun;Lee, U-Man;Kim, Il-Ho
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.321-321
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    • 2013
  • 열전재료는 열과 전기의 변환이 상호 가역적으로 일어나는 현상을 갖는 재료로서, 사용온도별로 여러 가지 재료가 개발되고 있다. 중온 영역에서 우수한 열전특성을 보이는 skutterudite는 격자 내에 2개의 공극을 갖고 있고 이에 적절한 원자를 충진하여 포논산란을 유도하고, PGEC(phonon-glass and electron-crystal) 개념을 적용하여 재료의 열적인 성질과 전기적인 성질을 동시에 제어함으로써 열전성능의 향상을 도모할 수 있는 재료이다. 본 연구에서는 챔버 내부 기체를 연속적으로 뽑아내어 진공도를 유지하는 방식이 아닌, 석영관을 앰플화한 진공밀폐 용해법을 사용하였다. 진공밀폐 용해법은 성분원소의 산화와 휘발을 억제하는데 있어 매우 유용한 공정이다. 용해를 통해 얻어진 잉곳을 용해와 동일한 방법으로 석영관에 밀봉하여 873 K에서 100시간 동안 진공열처리를 실시하였다. 또한, 합성된 잉곳의 기계적 특성 향상을 위해 $75{\mu}m$ 이하로 파쇄하여 진공 열간 압축 소결하였다. La가 충진된 $La_zCo_4Sb_{12}$ Skutterudites 단일상을 합성하여 La의 충진량(z)에 따른 열전특성과 전자이동특성을 조사하였다.

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On the Transmittances of Thin Metal Films for the Evaporating conditions (증착조건에 따른 금속박막의 광투과율)

  • 이창재;백수현
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.22 no.6
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    • pp.7-12
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    • 1985
  • The transmittances of active metal(Al), transition metals (Cr, Ti, Mn, Ni), and nobel metal(Cu) thin films were investigated. At the pressure range of $6{\times}10^{-5}$ mbr and evapora-tion rate of 0.5 -2A/sec, the metals were evaporated with $85{\AA}$ thickness or so on the slide G1ass. We found that the evaporation rates and vacuum levels strongly influence on the optical properties of thin metal films by the reaction with oxygen. Especially, the transmittances of the metals (Al, Cr, Ti, Mn, Ni) with strong oxygen affinity were able to be enhanced by the evaporating processes of low vacuum level or low evaporating rate.

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Properties of ZnO:Al Thin Films Deposited by RF Magnetron Sputtering with Various Base Pressure (RF Magnetron Sputtering법으로 제작한 ZnO:Al 박막의 초기 압력에 따른 특성)

  • Kim, D.K.;Kim, H.B.
    • Journal of the Korean Vacuum Society
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    • v.20 no.2
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    • pp.141-145
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    • 2011
  • ZnO:Al thin films were deposited by RF magnetron sputtering with various base pressure, and their structural, optical, and electrical properties were studied. The influence of the base pressure on the ZnO:Al thin film was confirmed and a high-quality thin film was obtained by controlling the base pressure. In all Al-doped ZnO thin films, the preferred orientation of (002) plane was observed and light transmittance in visible region (400 nm~800 nm) had above 85%. With decreasing of base pressure, crystallinity, resistivity, and figure of merit were improved. The improvement of resistivity with base pressure was attributed to the change of grain size.

A Study on the Fabrication and Characteristics of ITO thin Film Deposited by the Ionized Cluster Beam Deposition (Ionized Cluster Beam 증착방법을 이용한 Indium-Tin-Oxide(ITO) 박막의 제작과 그 특성에 관한 연구)

  • 최성창;황보상우;조만호;김남영;홍창의;이덕형;심태언;황정남
    • Journal of the Korean Vacuum Society
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    • v.5 no.1
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    • pp.54-61
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    • 1996
  • Indium-tin oxide (ITO) films were deposited on the glass substrate by the reactive -ionized cluster beam deposition(ICBD) method. In the oxygen atmosphere, indium cluster formed through the nozzle is ionized by the electron bombardment and is accelerated to be deposited on the substrate. And tin is simultaneoulsy evaporated from the boron-nitride crucible. The chracteristics of films were examined by the X-ray photoelectron spectroscopy(XPS), glancing angle X-ray diffractrion(GXRD) and the electrical properties. were measured by 4-point-probe and Hall effect measurement system . From the XPS spectrum , it was found that indium and tin atoms combined with the oxygen to form oxide$(In_2O_3, SnO_2)$. In the case of films with high tin-concentration, the GXRD spectra show that the main $In_2O_3$ peak of (222) plane, but also sub peaks((440) peak etc.) and $SnO_2$ peaks were detected. From that results, itis concluded that the heavily dopped tin component (more than 14 at. %) disturbs to form $In_2O_3$(222) phase. Four-point-probe and Hall effect measurement show that, in the most desirable case, the transmittance of the films is more then 90% in visible range and its resistivity is $$\rho$=3.55 \times10^{-4}\Omega$cm and its mobility is $\mu$=42.8 $\textrm{cm}^2$/Vsec.

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The Resistivity Properties and Adhesive Strength of Cu Thin firms Fabricated by EBE Method (전자빔 증착법으로 제작한 Cu 박막의 부착력과 저항율 특성)

  • Paik, Sang-Bong;Shin, Joong-Hong
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.11a
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    • pp.422-426
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    • 2003
  • Cu thin films of $6000{\AA}$ thickness were deposited by Electron Beam Evaporation(EBE) method on the glass. The resistivity properties and adhesion of Cu thin films were investigated by various annealing and substrate temperature. Cu thin films were annealed in the air and vacuum condition for 10 min after the deposition. The resistivity and adhesion(the force required to separate films from substrates) was measured by 4-point probe and scratch testing. The resistivity of non-annealing Cu thin films was distinguished more substrate temperature loot than substrate temperature R.T, $200^{\circ}C$. In the case of air condition annealing, as heating temperature was increased, the resistivity was decreased. In the case of vacuum condition annealing, the resistivity was increased at heating temperature $200^{\circ}C$. The best resistivity($1.72\;{\mu}{\Omega}{\cdot}cm$) of Cu thin films was obtained by the air condition heating temperature $200^{\circ}C$ at the substrate heating temperature $100^{\circ}C$. As a result of scratch testing, adhesion was increased by annealing. And maximum adhesion had 600 gf.

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PECVD 증착조건 변화에 따른 a-C;H 박막의 구조 변화

  • 조영옥;노옥환;윤원주;이정근;최영철;이영희;최용각;유수창
    • Proceedings of the Korean Vacuum Society Conference
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    • 2000.02a
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    • pp.93-93
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    • 2000
  • 수소화된 비정질 탄소(a-C:H)는 그 증착 조건에 따라서 여러 가지 다른 구조와 특성을 갖게 되며, 특히 DLC(diamond-like carbon) 및 CNT(Carbon nanotube)는 FED (field emission display) 개발 면에서 중요하게 연구되고 있다. 우리는 a-C:H 박막을 PECVD (plasma-enhanced chemical vapor deposition) 방법으로 증착하고 CH4 가스를 사용하였고 기판 온도는 상온-32$0^{\circ}C$ 사이에서 변화되었다. 기판은 Corning 1737 glass, quartz, Si, Ni 등을 사용하였다. 증착 압력과 R.F. power는 각각 0.1-1 Torr 와 12-60w 사이에서 변화되었다. ESR 측정은 X-band(주파수 약 9 GHz)에서 그리고 상온에서 행해졌다. 상온에서의 스핀밀도는 약한-표준피치(weak-pitch standard) 스펙트럼과 비교하여 얻을 수 있었다. 그리고 a-C:H 박막의 구조는 He-Ne laser(파장 632.8 nm)를 이용하는 micro-Raman spectroscopy로 분석하였다. 증착조건에 따른 스핀밀도의 변화 및 Raman 스펙트럼에서의 D-peak, G-peak의 위치 및 반치록, I(D)/I(G) 등을 조사하였다. 증착된 a-C:H 박막은 R.F.power가 증가할수록 대체로 스핀밀도가 증가하였으며, Raman 스펙트럼에서의 I(D)/I(G) 비율은 대체로 감소하였다. 증착된 박막들은 polymer-like Carbon으로 추정되었으며, 스핀밀도가 증가할수록 대체적으로 흑연 구조 영역이 증가됨을 알 수 있었다. 또한 glass나 Si 기판에 비해 Ni 기판위에서 polymer-like Carbon 구조는 향상되는 경향을 보였다.

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Charge/Discharge Characteristics of $SnO_2$ thin film as an anode of thin film secondary battery for microelectromechanical system device (Microelectromechnical system 소자를 위한 박막형 2차전지용 $SnO_2$ 음극박막의 충방전 특성 평가)

  • 남상철;조원일;전은정;신영화;윤영수
    • Journal of the Korean Vacuum Society
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    • v.9 no.1
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    • pp.36-41
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    • 2000
  • $SnO-2$ thin films for thin film secondary battery anode were deposited n glass substrate with stain-less steel collector and charge/discharge experiments were conducted to investigate feasibility of $SnO-2$ thin film as a new anode material. The as-deposited films were pure $SnO-2$ phase which is not related to deposition condition. The grain size on the surface of as-deposited films increased with increase of oxygen partial pressure. However, the grain size did not show any change above oxygen partial pressure of 80:20. The surface roughness of the as-deposited films increased after decreasing because of resputtering effect of oxygen negative ion in plasma. All films showed typical $SnO-2$ anode characteristics which has a side effect at the first cycle, which is not related to the deposition condition. The charge/discharge experiments of 200cycles indicated that capacity of $SnO-2$ films depended on oxygen contents and surface roughness. The cycle characteristics was determined by initial charge/discharge reaction. The $SnO-2$ film with low initial capacity showed more stable cycle characteristics than film with high initial capacity.

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SYNTHESIS OF METASTABLE ALLOYS BY ION MIXING IN THE BINARY METAL SYSTEMS AND THEORETICAL MODELLING

  • Liu, B.X.;Zhang, Z.J.;Jin, O.;Pan, F.
    • Journal of the Korean Vacuum Society
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    • v.4 no.S2
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    • pp.148-155
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    • 1995
  • (1) The metastable crystalline(MX) phases formed by ion mixing are classified into 5 types, i.e. the super-saturated solid solutions and the enlarged HCP-I phases reported earlier, and the newly observed FCC-I phases in hcp-based alloys, The FCC-ll and HCP-ll phases in bcc-based alloys. The growth kinetics of the MX phases is discussed. (2) The interfacial free energy in the multilayered films was found to play an important role in ion beam mixing(IM) induced amorphization. By adding sufficient interfaces, amorphous alloys were obtained even in the systems with rather positive heat of formation. (3) Gibbs free energy diagrams of some representative systems were constructed, by calculating the free energy curves of all the competing phases. Steady-state thermal annealing was conducted and the results confirmed the relevance of the constructed diagrams, which were inturn employed to interpret the MX phase formation as well as the glass forming ability upon IM in the binary metal systems.

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keV SURFACE MODIFICATION AND THIN FILM GROWTH

  • Koh, Seok-Keun;Choi, Won-Kook;Youn, Young-Soo;Song, Seok-Kyun;Cho, Jun-Sik;Kim, Ki-Hwan;Jung, Hyung-Jin
    • Journal of the Korean Vacuum Society
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    • v.4 no.S2
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    • pp.95-99
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    • 1995
  • keV ion beam irradiatin for surface modification and thin film growth have been discussed. keV ion beam irradiation in reactive gas environment has been developed for improving wettability of polymer, and for enhancing adhesion to metal film, and adventages of the method have been reviewed. An epitaxial Cu film on Si(100) substrate has been grown by ionized cluster beam and changes of crystallinity and surface roughness have been discussed. Stoichiometric $SnO_2$ films on Si(100) and glass have been grown by a hybrid ion beam Deposition(2 metal ion sources+1 gas ion source), and nonstoichiometric $SnO_2$ films are controlled by various deposition conditions in the HIB. Surface modification for polymer by kev ion irradiation have been developed. Wetting angle of water to PC has been changed from 68 degree to 49 degree with $Ar^+$ irradiation and to 8 degree with $Ar^+$ irradiation and the oxygen environment. Change of surface phenomena in a keV ion beam and characteristics of the grown films are suggested.

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