• Title/Summary/Keyword: VME form factor

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A study on Automatic field Test Equipment with improved maintenance and environmental reliability

  • Lee, Seok-Min
    • Journal of the Korea Society of Computer and Information
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    • v.23 no.3
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    • pp.9-16
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    • 2018
  • In this paper, I purpose one of the development methods for portable Automatic field Test Equipment(ATE) with VME form factor. Almost portable ATE have not used to standards form factor and they are connected by mechanical non-rigid general connectors and wire harnesses among the components. Furthermore, it is hard to reuse developed board. So, it decreases to reusability of developed board and it is hard to maintenance of ATE. Even those things have weakness for vibration and drop test especially in portable ATE. The XK9A1 ATE using VME form factor has environmental reliability through vibration, drop, temperature test. It consists of 5 developed board called the control board, the wire & wireless communication board, the power supply board, the load board and the mother board. It is connected by two wire harnesses between mother board and extern circular connectors. The control board send the data and address to other board though each 16-bit data and 20-bit address line. You can develop the function board what you want to using those data & address line when it comes to needing other function board.

Implementation of PXIe platform based portable Automatic Test Equipment to improve reliability

  • Gwon, Hyeok-Jin
    • Journal of the Korea Society of Computer and Information
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    • v.22 no.7
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    • pp.9-16
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    • 2017
  • In this paper, we propose a development method of portable Automatic Test Equipment based on PXIe platform. Legacy VME form factor structured test equipment has limited reuse and expansion of modules due to unapplied bus specification. In particular, these limitations can cause development periods and costs to increase, and the reliability of environmental conditions is lacking due to non-standard modules. The test equipment of the proposed PXIe platform can use diverse COTS modules to shorten the development period and minimize the instability between developments. The PXIe development module works with standard Xilinx FPGAs, PXIe Windows device drivers, and applications on standard PXIe buses. The use of standard bus and COTS modules increases scalability and reusability, enabling rapid development and excellent maintenance. Through the test, we show the proposed test equipments can be implemented efficiently between the development processes and proved their reliability through function tests and environmental tests.