• Title/Summary/Keyword: UV-VIS-NIR absorption

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Surface and Optical Characteristics of Cobalt Dopped-titanium Oxide Film Fabricated by Water Spray Pyrolysis Technique (습식 분무 열분해 방법으로 제조한 코발트 도핑된 티타늄 산화막의 표면 및 광학적 특성)

  • Song Ho-Jun;Park Yeong-Joon
    • Korean Journal of Materials Research
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    • v.15 no.3
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    • pp.209-215
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    • 2005
  • Titanium dioxide films $(TiO_2)$ doped cobalt transition metal were prepared on titanium metal by water spray pyrolysis technique. Micro-morphology, crystalline structure, chemical composition and binding state of sample groups were evaluated using field emission scanning microscope(FE-SEM), X-ray diffractometer(XRD), Raman spectrometer, X-ray photoelectron spectrometer(XPS). $TiO_2$ films of rutile structure were predominately formed on all sample groups and $Ti_2O_3$ oxide was coexisted on the surface of cobalt doped-sample groups. The optical absorption peaks measured by using UV-VIS-NIR spectrophotometer were observed at specific wavelength region in sample groups doped cobalt ion. This result could be analyzed by introducing crystal field theory.

IR Absorption Property in NaNo-thick Nickel Cobalt Composite Silicides (나노급 두께의 Ni50Co50 복합 실리사이드의 적외선 흡수 특성 연구)

  • Song, Oh Sung;Kim, Jong Ryul;Choi, Young Youn
    • Korean Journal of Metals and Materials
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    • v.46 no.2
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    • pp.88-96
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    • 2008
  • Thermal evaporated 10 nm-$Ni_{50}Co_{50}$/(70 nm-poly)Si films were deposited to examine the energy saving properties of silicides formed by rapid thermal annealing at temperature ranging from 500 to $1,100^{\circ}C$ for 40 seconds. Thermal evaporated 10 nm-Ni/(70 nm-poly)Si films were also deposited as a reference using the same method for depositing the 10 nm-$Ni_{50}Co_{50}$/(70 nm-poly)Si films. A four-point probe was used to examine the sheet resistance. Transmission electron microscopy (TEM) and X-ray diffraction XRD were used to determine cross sectional microstructure and phase changes, respectively. UV-VIS-NIR and FT-IR (Fourier transform infrared spectroscopy) were used to examine the near-infrared (NIR) and middle-infrared (MIR) absorbance. TEM analysis confirmed that the uniform nickel-cobalt composite silicide layers approximately 21 to 55 nm in thickness had formed on the single and polycrystalline silicon substrates as well as on the 25 to 100 nm thick nickel silicide layers. In particular, nickel-cobalt composite silicides showed a low sheet resistance, even after rapid annealing at $1,100^{\circ}C$. Nickel-cobalt composite silicide and nickel silicide films on the single silicon substrates showed similar absorbance in the near-IR region, while those on the polycrystalline silicon substrates showed excellent absorbance until the 1,750 nm region. Silicides on polycrystalline substrates showed high absorbance in the middle IR region. Nickel-cobalt composite silicides on the poly-Si substrates annealed at $1,000^{\circ}C$ superior IR absorption on both NIR and MIR region. These results suggest that the newly proposed $Ni_{50}Co_{50}$ composite silicides may be suitable for applications of IR absorption coatings.

The effect of PVT process parameters on the resistance of HPSI-SiC crystal (PVT 공법의 공정 변수가 고순도 반절연 SiC 단결정의 저항에 미치는 영향)

  • Jun-Hyuck Na;Min-Gyu Kang;Gi-Uk Lee;Ye-Jin Choi;Mi-Seon Park;Kwang-Hee Jung;Gyu-Do Lee;Woo-Yeon Kim;Won-Jae Lee
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.34 no.2
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    • pp.41-47
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    • 2024
  • In this study, the resistance characteristics of semi-insulating SiC single crystals grown using the PVT method were investigated, considering the purity level of SiC source powders used in PVT growth and the cooling procedure after crystal growth. Two β-SiC powders with different purities were employed, and the cooling rate after growth was adjusted to achieve various resistance values. 4-inch HPSI-SiC ingots were grown using the PVT method, utilizing SiC powders with low nitrogen concentration and relatively high nitrogen concentration. These ingots were then subjected to different cooling procedures to modify the cooling rate. Transmission/absorption spectra and crystal quality of the grown crystals were analyzed through UV/VIs/NIR spectroscopy and X-ray rocking curve analysis, respectively. Additionally, electrical properties were investigated through non-contact resistivity analysis to identify the dominant factors influencing resistivity properties.

Determination of Pu Oxidation states in the HCl Media Using with UV-Visible Absorption Spectroscopic Techniques (UV-Visible 흡수분광학법을 이용한 염산매질내 Pu 산화상태 측정)

  • Lee, Myung-Ho;Suh, Mu-Yeol;Park, Kyoung-Kyun;Park, Yeong-Jae;Kim, Won-Ho
    • Journal of Nuclear Fuel Cycle and Waste Technology(JNFCWT)
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    • v.4 no.1
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    • pp.1-7
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    • 2006
  • The spectroscopic characteristics of Pu (III, IV, V, VI) in the HCl media were investigated by measuring Pu oxidation states using a UV-Vis-NIR spectrophotometer (400-1200 nm) after adjusting Pu oxidation states with oxidation/reduction reagents. Pu in stock solution was reduced to Pu(III) with $NH_2OH$ HCl, and oxidized to Pu(IV) and Pu(VI) with $NaNO_2$ and $HClO_4$, respectively. Also, Pu(V) was adjusted in the Pu(VI) solution with $NH_2OH$ HCl. The major absorption peaks of Pu (IV) and Pu(III) were measured in the 470 m and 600 nm, respectively. The major absorption peaks of Pu (VI) and Pu(V) were measured in the 830 nm and 1135 nm, respectively. There was not found to be significant changes of UV-Vis absorption spectra for Pu(III), Pu(IV) and Pu(VI) with aging time, except that an unstable Pu(V) immediately reduced to Pu(III).

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Preparation and Characterization of Ultra Thin TaN Films Prepared by RF Magnetron Sputtering

  • Reddy, Akepati Sivasankar;Jo, Hyeon-Cheol;Lee, Gi-Seon
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2011.10a
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    • pp.32.1-32.1
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    • 2011
  • Ultra thin tantalum nitride (TaNx) films with various thicknesses (10 nm to 40 nm) have been deposited by rf magnetron sputtering technique on glass substrates. The as deposited films were systematically characterized by several analytical techniques such as X-ray diffraction, X-ray photoelectron spectroscopy, field emission scanning electron microscopy, atomic force microscopy, UV-Vis-NIR double beam spectrophotometer and four point probe method. From the XRD results, the as deposited films are in amorphous nature, irrespective of the film thicknesses. The films composition was changed greatly with increasing the film thickness. SEM micrographs exhibited the densely pack microstructure, and homogeneous surface covered by small size grains at lower thickness deposited films. The surface roughness of the films was linearly increases with increasing the films thickness, consequently the transmittance decreased. The absorption edge was shifted towards higher wavelength as the film thickness increases.

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Deposition of Heavy Metal Oxide Glass Thin Films by R.F. Magnetron Sputtering (스퍼터링 방법을 이용한 중금속 산화물 유리 박막의 증착)

  • Kim, Woong-Kwern;Heo, Jong;Je, Jung-Ho
    • Journal of the Korean Ceramic Society
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    • v.32 no.6
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    • pp.669-676
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    • 1995
  • In this study, EO glass films were deposited by R.F. magnetron sputtering using EO glass target. The glass formation of the EO film was greatly dependent on the substrate temperature and the crystallization started at approximately 28$0^{\circ}C$. As the temperature of the substrate or the oxygen content in the sputtering gas increased, UV/VIS/NIR absorption edge moved toward longer wavelength. A wave guiding phenomenon was observed from the prism-coupler experiment and a fluorescence of 1.06${\mu}{\textrm}{m}$ originated from 4Fe3/2longrightarrow4I11/2 transition of Nd3+ was detected from the film containing Nd3+ ions.

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Host effects on electrical conductivity of $ReO_3$ doped organic semiconductors

  • Lee, Jae-Hyun;Leem, Dong-Seok;Kim, Jang-Joo
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.346-349
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    • 2009
  • We investigated the doping effects of $ReO_3$ in different p-type organic semiconductors on the formation of charge transfer complexes and the electrical conductivity by comparing the absorption in ultraviolet-visible-nearinfrared (UV-Vis-NIR) and the current density-voltage characteristics of the hole only devices, respectively. The large energy difference between the HOMO level of host and Fermi energy level of dopant (${\Delta}E$=$E_{HOHO,host}$ - $E_{F,dopant}$) gives higher concentration of CT complexes and enhanced conductivity.

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The Synthesis of a High Yield PbSe Quantum Dots by Hot Solution Method

  • Baek, In-Chan;Seok, Sang-Il;Chung, Yong-Chae
    • Bulletin of the Korean Chemical Society
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    • v.29 no.9
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    • pp.1729-1731
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    • 2008
  • Colloidal solutions of crystalline PbSe nanoparticles have been synthesized by hot solution chemical process using PbO in oleic acid and tributylphosphine (TBP) bonded selenium. The use of TBP as a capping agent along with oleic acid gives a very good yield (around 10% at 180 ${^{\circ}C}$) with an average diameter of particle of about < 6.6 nm. The effects of temperature on size and production yield of PbSe quantum dots are studied. Xray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM) and UV/VIS/NIR absorption spectroscopy were used to characterize the samples.

Characterization of dark core and blue patch in Mong Hsu ruby

  • Maneeratanasarn, P.;Wathanakul, P.;Kim, Y.C.;Choi, H.M.;Choi, B.G.;Shim, K.B.
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.21 no.2
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    • pp.55-59
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    • 2011
  • Mong Hsu rubies from Myanmar include typically the dark core and blue patch but most of the previous research has merely focused on the dark core. This work is aimed to understanding clearly the characteristic of the dark core and blue patch of Mong Hsu rubies. It was found from the FTIR analysis that the dark core and blue patch region showed the absorption peaks of boehmite ($1986\;cm^{-1}$), diaspore ($2115\;cm^{-1}$) and water ($3400{\sim}3900\;cm^{-1}$) but the absorption peaks of O-H stretching ($3309\;cm^{-1}$ and $3078\;cm^{-1}$) were found only in blue patch region. The UV-VIS-NIR analysis of the dark core region revealed the stronger absorption of $Cr^{3+}$ at 405 and 554 nm compared to the blue patch region. In range of 600~800 nm, the UV absorption characteristic at 659, 675 and 693 nm assigned to $Cr^{3+}$ of core group samples is distinct from that of blue patch. The SEM-EDS examinations disclosed the existence of lots of micro-cracks and pores in the core regions compared to blue patch region.

Investigation on the spectroscopic characteristics for Pu oxidation state in acid and alkali medium (산 및 알칼리 매질에서 Pu 산화수에 대한 분광학적 특성 조사)

  • Lee, Myung-Ho;Kim, Jong-Yun;Kim, Won-Ho;Jung, Euo-Chang;Jee, Kwang-Yong
    • Journal of Nuclear Fuel Cycle and Waste Technology(JNFCWT)
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    • v.5 no.2
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    • pp.103-108
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    • 2007
  • The absorption spectra of Pu in stock solution were measured using a UV-Vis-NIR spectrophotometer after dissolving $PuO_2\;with\;HNO_3$, HF and $HClO_4$. The spectroscopic characteristics of Pu (III, IV, VI) in acidic, neutral and alkali media were investigated. Also, the intensities and position of major peaks for Pu(VI) were observed with increasing acidic and alkali concentration. The variation of oxidation states of Pu(VI) with an adding reducing reactant was investigated in HCl and NaOH medium.

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