• Title/Summary/Keyword: UV etching

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Chemical Solution Deposition of PZT/Oxide Electrode Thin Film Capacitors and Their Micro-patterning by using SAM

  • Suzuki, Hisao
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07b
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    • pp.907-912
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    • 2005
  • Micro-patterns of $Pb(Zr_{0.53}Ti_{0.47})O_3$, PZT, thin films with a MPB composition were deposited on $Pt/Ti/SiO_2/Si$ substrate from molecular-designed PZT precursor solution by using self-assembledmonolayer(SAM) as a template. This method includes deposition of SAM followed by the optical etching by exposing the SAM to the UV-light, leading to the patterned SAM as a selective deposition template. The pattern of SAM was formed by irradiating UV-light to the SAM on a substrate and/or patterned PZT thin film through a metal mask for the selective deposition of patterned PZT or lanthanum nickel oxide (LNO) precursor films from alkoxide-based precursor solutions. As a result, patterned ferroelectric PZT and PZT/LNO thin film capacitors with good electrical properties in micrometer size could be successfully deposited.

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Chemically Amplified Resist for Extreme UV Lithography (극자외선 리소그래피용 화학증폭형 레지스트)

  • Choi, Jaehak;Nho, Young Chang;Hong, Seong Kwon
    • Applied Chemistry for Engineering
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    • v.17 no.2
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    • pp.158-162
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    • 2006
  • Poly[4-hydroxystyrene-co-2-(4-methoxybutyl)-2-adamantyl methacrylate] was synthesized and evaluated as a matrix resin for extreme UV (EUV) chemically amplified resist. The resist system formulated with this polymer resolved 120 nm line and space (pitch 240 nm) positive patterns using a KrF excimer laser scanner (0.60 NA). The well defined 50 nm line positive patterns (pitch 180 nm) were obtained using an EUV lithography tool. The dry etching resistance of this resist for a $CF_{4}$-based plasma was 1.1 times better than that of poly(4-hydroxystyrene).

Nanoscale Patterning Using Femtosecond Laser and Self-assembled Monolayers (SAMs) (펨토초레이저와 자기조립박막을 이용한 나노스케일 패터닝)

  • Chang, Won-Seok;Choi, Moo-Jin;Kim, Jae-Gu;Cho, Sung-Hak;Whang, Kyung-Hyun
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.28 no.9
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    • pp.1270-1275
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    • 2004
  • Standard positive photoresist techniques were adapted to generate nano-scale patterns of gold substrate using self-assembled monolayers (SAMs) and femtosecond laser. SAMs formed by the adsorption of alkanethiols onto gold substrate are employed as very thin photoresists, Alkanethiolates formed by the adsorption of alkanethiols are oxidized on exposure to UV light in the presence of air to alkylsulfonates. Specifically, it is known that deep UV light of wavelength less than 200nm is necessary for oxidation to occur. In this study, ultrafast laser of wavelength 800nm and pulse width 200fs is applied for photolithography. Results show that ultrafast laser of visible range wavelength can replace deep UV laser source for photo patterning using thin organic films. Femtosecond laser coupled near-field scanning optical microscopy facilitates not only the patterning of surface chemical structure, but also the creation of three-dimensional nano-scale structures by combination with suitable etching methods.

Advanced surface processing of NLO borate crystals for UV generation

  • Mori, Yusuke;Kamimur, Tomosumi;Yoshimura, Masashi;Sasaki, Takatomo
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.9 no.5
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    • pp.459-462
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    • 1999
  • Recent advances in NLO Borate Crystals for UV Generation are reviewed with the particular emphasis on the technique to improve the life time of UV optics. The laser-damage resistance of CLBO and fused silica surfaces was successfully improved after removing polishing compound by ion beam etching. The polishing compound embedded in the CLBO and fused silica surfaces were to a depth of less than 100nm. We were able to remove polishing compound without degrading the surface condition when the applied ion beam voltage was less than 200 V. The laser-induced surface damage threshold of CLBO was improved up to 15J/$\textrm{cm}^2$(wavelength: 355 nm, pulse width: 0.85 ns)as compared with that of the as-polished surface (11 J/$\textrm{cm}^2$). The laser-induced surface damage of fused silica also increased from 7.5J/$\textrm{cm}^2$ to 15J/$\textrm{cm}^2$. For the irradiation of a 266 nm high-intensity and high-repetition laser light, the surface lifetime of CLBO and fused silica could be more doubled compared with that of the as-polished surface.

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Rapid Fabrication of Micro Lens Array by 355nm UV Laser Irradiation (355nm UV 레이저를 이용한 마이크로 렌즈 어레이 쾌속 제작)

  • Je, Soon-Kyu;Park, Kang-Su;Oh, Jae-Yong;Kim, Kwang-Ryul;Park, Sang-Hoo;Go, Cheong-Sang;Shin, Bo-Sung
    • Laser Solutions
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    • v.11 no.2
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    • pp.26-32
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    • 2008
  • Micro lens array (MLA) is widely used in information technology (IT) industry fields, for examples such as a projection display, an optical power regulator, a micro mass spectrometer and for medical appliances. Recently, MLA have been fabricated and developed by using a reflow method, micro etching, electroplating, micromachining and laser local heating. Laser local thermal-expansion (LLTE) technology demonstrates the formation of microdots on the surface of polymer substrate, in this paper. We have also investigated the new direct fabrication method of placing the MLA on the surface of a SU-8 photoresist layer. We have obtained the 3D shape of the micro lens processed by UV laser irradiation and have experimentally verified the optimal process conditions.

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Development of Microlens Array for Maskless Lithography Application (Maskless lithography 응용을 위한 마이크로렌즈 어레이 개발)

  • Nam, Min-Woo;Oh, Hae-Kwan;Kim, Geun-Young;Seo, Hyun-Woo;Wei, Chang-Hyun;Song, Yo-Tak;Yang, Sang-Sik;Lee, Kee-Keun
    • Journal of the Microelectronics and Packaging Society
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    • v.16 no.4
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    • pp.33-39
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    • 2009
  • A microlens array (MLA) was developed based on the wet-etched quartz substrate and coating of UV adhesive on the substrate for maskless lithography application. The developed MLA has the focal length of ${\sim}45\;{\mu}m$ and the spot size of ${\sim}1\;{\mu}m$. The spot size of the focused beam passing through the MLA was detected by CCD camera, and its intensity was monitored by beam profiler. Uniform spots with nearly identical intensities were observed on the focal plane when a beam passes through the fabricated MLA. The focal length was varied depending on thickness of the coated UV adhesive. The thicker the thickness of the UV adhesive was, the shorter the focal length of the MLA was. With a general mask aligner, UV beam focusing was tested onto photoresist (PR). The beams were well focused onto PR when UV passes through the MLA. Depending on the variable distances from the MLA, beam sizes onto PR were controlled. Even at high temperature for a long time, the performances of the MLA were not changed.

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Developing improvement technology in pre-etching process for the Shadow Mask quality of flat color TV

  • Park, Jong-Moo;Park, Kwang-Ho;Jung, Hyo-Jin
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.1164-1167
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    • 2003
  • Recently CRT is getting flatted, As change of CRT trend from normal type to Flat type, the material of Shadow Mask was also changed from AK(Aluminum Killed) to Invar(Fe-Ni alloy) materials Until now we have used just AK(Aluminum Killed) for normal type TV(not flat type), but main raw material of shadow mask component was changed. . However recently Invar(Fe-Ni alloy) materials, which has advantage of Low Thermal Expansion and High Strength, has been developed as well as applying in mass production as CRT's trend has become more flat and fine pitch. As main raw material of shadow mask component was changed, conditions of process were changed. One of them, the importance of pre-etching process (assistant process for developing & etching) is improved because there are so many particles in the pre-etching bath because of Ni compounds. Since the solubility of Ni in pre-etching solvent is very low related to Fe's, so the compounds of Ni happen to make particles.(the solubility of Fe is twenty times Ni's) that particles happen to make process troubles and NG productions so to clear the particles we had to established high cost filtering system, but it is useless. As time goes by the quantity of particles (Ni compounds) was increased because of the capability of filtering system was not enough, the particles was produced continuous in bath, and it make quality problems. Hence we tried to develop the new pre-etching solution to remove the particles (Ni compounds) and to cost down the filtering system's running cost. But in improving the solution we discovered the new pre-etching solution made the PR developing better. In former solution there were three kinds of chemistry (COOH)2 , H2O2 , H2S04 .first the function of (COOH)2 is drilling the surface of Invar, during this mechanism Ni compounds occurred. Second the function of H202 is removing the PR fringe (half UV exposure zone on PR(PVA)), Third the function of H2S04 is the catalysis of (COOH)2 In those, (COOH)2 was the main reason to make the Ni compounds. So to improve the solutions we had to change (COOH)2 to the other material. the chemistry we improved was a complex chemistry based on H2S04 . after using this chemistry the particles problem was disappeared and there was another advantage cut down the PR fringe. The New solution made the function of H202 better so the PR developing improved. To be direct the catalyst of the new solution helped the H202. anyway First thing after change the solution the quality of shadow Mask for flat color TV was improved & the yield also improved. But the more important thing is how to control the new solution. So we accepted the new concept which was the degree of freshness. The degree of freshness is based on non-reacted solution which was 100% ( the degree of freshness) and calculated the melted Ni quantity as time goes by. So we made the gauging liner plot. In conclusion, many companies tried to make fine pitched Shadow Mask ,generally to make quality jump up it needed a lot of cost & persons .in this case the shift of core material made it possible.

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RF magnetron Sputtering법에 의해 Plasma Etching된 Glass에 증착한 다양한 친수 박막의 특성

  • Lee, Dong-Uk;Baek, Cheol-Heum;Kim, Dong-Yeong;Yang, Jeong-Min;Kim, Hwa-Min;Lee, Jong-Yeong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.133-133
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    • 2012
  • 일반적으로 TiO2는 광촉매 작용으로 표면 살균성을 가지며, 친수특성으로 인한 자가세정 능력도 가지고 있다. 또한 지구상에 많이 존재하는 광물로 원료의 가격이 저렴하다는 장점이 있어 산업 전반에 사용되고 있다. 하지만 외부의 환경적 오염으로 인한 광촉매 반응 면적의 감소에 따라 반응효율이 저하되는 단점이 있으며, SiO2는 투명한 유리와 같이 비정질상태가 안정하고 높은 굴절률을 가지며 내구성이 외부환경에 강해 무반사 코팅이나 금속박막의 보호층으로 주로 사용된다. WO3는 높은 굴절률과 가시광선 영역에서의 우수한 투과율을 가지고 있으나 conduction band에서 생성된 광캐리어들이 빠르게 재결합 하여 광분해 효율이 좋지 않기 때문에 흔히 쓰이지 않고 있다. 이러한 박막들의 단점을 보완하기 위해 물리적 구조를 변화시켜 반응 면적을 극대화하기 위해 버퍼층이나 다층박막을 사용하는 등 다양한 연구가 진행되고 있다. 본 실험에서는 Slide glass에 Plasma etching 하였을때 친수성이 나타나는 특성을 이용하여 대면적 코팅과 표면 경도를 우수하게 만들 수 있는 RF Magnetron sputtering법으로 Slide glass에 Ar Gas 분위기에서 각 파워별 Plasma etching한 후 TiO2, SiO2, WO3 박막을 증착하여 광학적, 구조적 특성을 분석하였다. 광투과율 측정장치(UV-VIS Spectrophotometer)를 사용하여 투과율을 측정한 결과 모든 박막이 가시광 영역에서 80% 이상의 높은 투과율을 나타내었으며, 접촉각 측정결과 100w로 etching한 glass에 TiO2를 증착한 박막에서 가장 낮은 $3^{\circ}$ 이하의 접촉각을 나타내었다. SEM (Scanning Electron Microscope) 분석을 통해 표면구조를 관찰한 결과 100w로 etching한 후 TiO2를 증착한 박막이 가장 조밀한 구조를 보였으며, AFM (Atomic Force MicroScope) 분석 결과 100w로 etching한 후 TiO2를 증착한 박막의 표면이 가장 거칠어지는 것을 볼 수 있었는데, 이는 물과 닿는 박막의 유효 표면적의 증가로 인하여 광촉매 효과가 증가하였기 때문에 친수성이 향상된 것으로 사료된다. 이러한 박막은 건물 유리벽과 자동차의 내 외장재 전자기기용 광학 필름에 자가세정, 내반사 코팅소재, 디스플레이 표시장치로 활용할 수 있을 것으로 예상된다. 본 연구는 중소기업청에서 지원하는 2011년도 산학연 공동기술개발 지원사업의 연구수행으로 인한 결과물임을 밝힙니다.

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Design and fabrication of the $1.3/1.55\mum$ WDM coupler with the PSG waveguide films (PSG 광도파박막을 이용한 $1.3/1.55\mum$ WDM coupler의 설계 및 제작)

  • 전영윤;김한수;이용태;이형종
    • Korean Journal of Optics and Photonics
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    • v.6 no.4
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    • pp.310-316
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    • 1995
  • We designed the $1.3/1.55\mum$ WDM directional coupler and its coupling length was calculated with the variation of the two waveguide's core separation and other variables by the Fourier transformed scalar wave equation. We deposited the PSG films for optical waveguide by low pressure chemical vapor deposition and fabricated the WDM coupler using the laser lithography and $CF_4/O_2$ reactive ion etching process. A V -groove which was made to support and fix the optical fiber is fabricated on Si substrate by chemical etching. The WDM coupler and the V-groove are connected using UV curing epoxy. We found that propagation mode of each port of WDM coupler is single mode and maximum extinction ratio between two out ports is 6 dB for $1.3.\mum$, and 12 dB for $1.55\mum$. /TEX>.

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Fabrication of Nanopatterned Oxide Layer on GaAs Substrate by using Block Copolymer and Reactive Ion Etching (블록 공중합체와 반응성 이온식각을 이용한 GaAs 기판상의 나노패터닝된 산화막 형성)

  • Kang, Gil-Bum;Kwon, Soon-Mook;Kim, Seoung-Il;Kim, Yong-Tae;Park, Jung-Ho
    • Journal of the Microelectronics and Packaging Society
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    • v.16 no.4
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    • pp.29-32
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    • 2009
  • Dense and periodic arrays of nano-sized holes were patterned in oxide thin film on GaAs substrate. To obtain the nano-size patterns, self-assembling diblock copolymer was used to produce thin film of uniformly distributed parallel cylinders of polymethylmethacrylate (PMMA) in polystyrene (PS) matrix. The PMMA cylinders were removed with UV expose and acetic acid rinse to produce PS nanotemplate. By reactive ion etching, pattern of the PS template was transferred to under laid silicon oxide layer. Transferred patterns were reached to the GaAs substrate by controlling the dry etching time. We confirmed the achievement of etching through the removing oxide layer and observation of GaAs substrate surface. Optimized etching time was 90 to 100 sec. Pore sizes of the nanopattern in the silicon oxide layer were 20~22 nm.

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