• Proceeding of EDISON Challenge
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• 2015.03a
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• pp.350-353
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• 2015

최근 에너지 효율과 소형화측면에서 한계를 보이는 Metal-Oxide-Semiconductor Field-Effect Transistor(MOSFET)을 대체할 수 있는 소자로 Tunneling FET(TFET)이 주목받고 있다. 본 논문에서는 탄소나노튜브(Carbon Nanotube, CNT) TFET을 시뮬레이션하여 전자회로의 기본 단위인 인버터(Inverter)를 설계한다. 설계한 인버터의 성능을 CNT-MOSFET 인버터와 비교하여 저전력 디지털 회로로써의 가능성을 확인한다.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.7 no.2
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• pp.168-174
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• 2006

We investigated field-effect ion-transport devices based on carbon nanotubes by using classical molecular dynamics simulations under applied external force fields, and we present model schematics that can be applied to the nanoscale data storage devices and unipolar ionic field-effect transistors. As the applied external force field is increased, potassium ions rapidly flow through the nanochannel. Under low external force fields, thermal fluctuations of the nanochannels affect tunneling of the potassium ions whereas the effects of thermal fluctuations are negligible under high external force fields. Since the electric current conductivity increases when potassium ions are inserted into fullerenes or carbon nanotubes, the field effect due to the gate, which can modify the position of the potassium ions, changes the tunneling current between the drain and the source.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.07a
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• pp.314-317
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• 2002

Since the early work of Tersoff and Hamann on the theory of the scanning tunneling microscope (STM), many theoretical approaches have been developed in order to gain further physical insight into the real space image that this technique provides. In this Paper, the STM image of Carbon nanotubes (CNT's) was calculated through the theoretical study. The optimized structure of CNT's was simulated using Brenner's hydrocarbon potential. The structure of simulation is (5. 5) armchair CNT and (10. 0) zigzag CNT. Also we have used that the extended Huckel tight binding (EHTB) theory already provides a fairly good qualitative description of the main processes that control the final contrast in the STM image. we found that the shape of the calculated images is hardly dependent on the exact electronic charge distribution at the surface. The STM images are not too sensitive to the precise electronic structure but, rather, they reflect its qualitative features. As a result of the simulation, The STM images of CNT's and the electronic density distribution were investigated. It found that the EHTB theory is appropriate for STM image calculation and that the STM images are in agreement with the result of Experiment.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.340-340
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• 2010

Various structures of vacancy defects in graphene layers and carbon nanotubes have been reported by high resolution transmission electron microscope (HR-TEM) and those arouse an interest of reconstruction processes of vacancy defects. In this talk, we present reconstruction processes of vacancy defects in a graphene and a carbon nanotube by tight-binding molecular dynamics (TBMD) simulations and by first principles total energy calculations. We found that a structure of a dislocation defect with two pentagon-heptagon (5-7) pairs in graphene becomes more stable than other structures when the number of vacancy units is ten and over. The simulation study of scanning tunneling microscopy reveals that the pentagon-heptagon pair defects perturb the wavefunction of electrons near Fermi level to produce the $\sqrt{3}\;{\times}\;\sqrt{3}$ superlattice pattern, which is in excellent agreement with experiment. It is also observed in our tight-binding molecular dynamics simulation that 5-7 pair defects play a very important role in vacancy reconstruction in a graphene layer and carbon nanotubes.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.492-492
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• 2011

단일벽 탄소나노튜브(Single-Walled Carbon Nanotubes, SWCNTs)는 매우 우수한 전기적, 광전자적 특성을 가지고 있어 차세대 나노 전자소자 물질로 각광받고 있다. 특히, 이들의 전기적 특성은 직경과 카이랄리티(chirality)에 따라 금속성(metallic)과 반도체성(semiconducting)으로 구분된다. 각 특성에 따라 금속성은 투명전극, 반도체성은 전계효과 트랜지스터(CNT-FET)로 활용가능성이 높다. 하지만, 일반적으로 단일벽 탄소나노튜브는 이 두 가지의 특성이 혼재되어 합성되기 때문에, 그들의 선택적 분리는 나노튜브 기반 전자소자 응용을 위해 매우 중요한 과정 중 하나이다. 최근에는 반응 가스를 이용한 선택적 제거, 밀도차를 이용한 원심분리법(density gradient ultracentrifugation) 등 다양한 방법들이 보고된 바 있다. 본 연구는 대기 중에서 마이크로웨이브 조사하여 금속성 나노튜브만을 선택적으로 제거하였다. 마이크로웨이브 조사는 CVD 방법과 전기 방전법으로 성장된 단일벽 탄소나노튜브에 800W로 조사 시간을 변화하며 수행하였다. 실험 결과, 조사 시간이 증가할수록 두 종류의 나노튜브에서 반도체성 나노튜브는 남아있는 반면 금속성 나노튜브는 점차 제거되었다. 이러한 원인은 각 전기적 특성에 따른 유전상수 차이에 의하여 기인한 것이다. 전기적 특성과 결정성은 라만 분광법(Raman spectroscopy)을 통하여 분석하였으며, 직경 및 분산정도는 주사전자현미경(scanning electron microscope), 투과전자현미경(tunneling electron microscope)으로 관찰하였다.