• Journal of Welding and Joining
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• v.19 no.1
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• pp.33-39
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• 2001

The welding quality by Gas Tungsten Arc Welding shows very high level, but the welding speed is lower than that of gas metal arc welding. Also, the welding quality by automatic GTAW is variable as the arc characteristics is changed by the consumption of electrode tip. The purpose of this study is to investigate the relation between the properties of tungsten electrode tip and the various arc characteristics at high current region. In this study, the high welding current 200A was applied to the repeated arc start test and long term arcing test using the $\phi$3.2 tungsten electrodes with cone angle 30$^{\circ}$, 45$^{\circ}$, 60$^{\circ}$sharp tip, and 60$^{\circ}$surface polished (S.P.) sharp tip. It was confirmed that the maximum arc pressure by the initial electrode condition was highest in 45$^{\circ}$sharp tip, and the next in 60$^{\circ}$sharp tip, the last was in 30$^{\circ}$sharp tip and 60$^{\circ}$S.P.. But, the maximum arc pressure after the repeated arc start test and long term arcing test was decreased considerably. But, the maximum arc pressure was highest also in 45$^{\circ}$ sharp tip after the tests, the next was in 30$^{\circ}$sharp tip, and the last was in 60$^{\circ}$sharp tip and 60$^{\circ}$S.P.. The arc start characteristics was the most excellent in 60$^{\circ}$S.P., By long term arcing test, the lanthania included in tungsten electrode was extinguished at tip surface preferentially, therefore the arc characteristics of electrode tip got worse.

• Journal of Information Display
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• v.10 no.1
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• pp.45-48
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• 2009

The ionization of a helium atom was investigated as a function of gas pressure, with the use of a tungsten tip. The tungsten tip, to which the external voltage was applied, was used to generate a constant electron current. The ionization current of helium gas was measured as a function of gas pressure. Effective ionization occurred in the pressure range of 0.5-20 torr when the distance between the field emission tip and the collector was 1 cm. The ionization current was linearly proportional to the voltage that was applied to the tungsten tip.

• Proceedings of the KSME Conference
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• 2007.05a
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• pp.1277-1281
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• 2007

A Nano-tip as a cold field emitter for inducing a field emission current has manufactured in many ways. In the paper, the electrochemical etching method is used. Thus, in order to optimize the final shape as the field emitter, the reliable fabrication system for electrochemical etching was constructed. In addition, the effective parameters such as applied voltage, submerged length, meniscus height, electrolyte concentration and environmental condition(vibration, humidity, cut-off time) have investigated in detail. By controlling the parameters, reliable tungsten tip for field emitter was fabricated. And the fabricated tungsten tip was evaluated optically. Finally, the very sharp apex of the tungsten tip was observed with scanning electron microscope.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2003.06a
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• pp.682-685
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• 2003

In this paper, we propose the method to measure the Young's modulus of carbon nano tube which was manufactured by chemical vapor deposition. We also made the tungsten tip by electrochemical etching process and the carbon nano tube which was detangled through ultra-sonication with isopropyl alcohol was attached to the tungsten tip. This tip which was composed of tungsten tip and carbon nano tube can be used in Young's modulus measurement by applying DC voltage with counter electrode. The attachment process and measurement of the deflection of carbon nano tube was done under optical microscope.

• Bulletin of the Korean Chemical Society
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• v.30 no.1
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• pp.133-136
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• 2009

A newly designed Ag/$Ag^+$ reference electrode in a quartz tube with a tungsten tip junction (W-tip-Quartz- REF) was fabricated and its electrochemical performance was compared with a conventional Pyrex tube-based Ag/$Ag^+$ reference electrode (Py-REF). The results of the electrochemical potential measurements with the W-tip-Quartz- REF and the Py-REF in the LiCl-KCl eutectic melts for a wide temperature range proved that the oxide layer on the surface of the tungsten metal tip provided a high ionic conduction. Stability of our newly designed W-tip- Quartz-REF was tested by measuring a junction potential for 12 hours at 700${^{\circ}C}$. The results of the cyclic voltammetric measurement indicated that the Ag/$Ag^+$ reference electrode in the quartz tube with a tungsten tip junction can provide a good performance for a wide temperature range.

• Journal of the Korean institute of surface engineering
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• v.31 no.1
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• pp.45-53
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• 1998

Sharp tips are commonly used for applications in fields as diverse as nanolithography, lowvoltage field emitters, emitters, nanoelectroniecs, electrochemisty, cell biology, field-ion and electron microscopy. tungsten wire, mater만 used in this experiment, which test the chip of wafer has been used to the needle of probe card. Tungsten wire was sharpened by electrochemical etching methode to get a typical tip shape.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2004.04a
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• pp.449-452
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• 2004

To obtain the ultra-sharp tungsten tip, an analog to digital converter circuit aided by a personal computer has been setup. At the moment the lower part of the needle drops off during the etching process, a maximum current change across the reference resistor is detected by the PC interface card and the applied voltage is then cut off within a few milliseconds. Out experiment has been able to fabricate an ultra-sharp tungsten tip ~200 $\AA$ radius with a higher reproduction rate and reliability than the conventional method.

• Tribology and Lubricants
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• v.30 no.4
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• pp.218-223
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• 2014

This paper presents a method of controlling the stiffness of a tungsten probe for an atomic force microscope (AFM) in order to provide high-quality phase contrast images in accordance with sample characteristics. While inducing sufficient deformation on sample surfaces with commercial Si or $Si_3N_4$ probes is difficult because of their low stiffness, a tungsten probe fabricated by electrochemical etching with appropriately high stiffness can generate relatively large elastic deformation without damaging sample surfaces. The fabrication of the tungsten probe involves two separate procedures. The first procedure involves immersing a tungsten wire with both ends bent parallel to the surface of an electrolyte and controlling the stiffness of the tungsten cantilever by decreasing its diameter using electrochemical etching in the direction of the central axis. The second procedure involves immersing the end of the etched tungsten cantilever in the direction perpendicular to the surface of the electrolyte and fabricating a tungsten tip with a tip radius of 20-50 nm via the necking phenomenon. The latter etching process applies pulse waves every 0.25 seconds to the manufactured tip to improve its yield. Finite element analysis (FEA) of the stiffness of the tungsten probe as a function of its diameter showed that the stiffness of the tungsten probes greatly varies from 56 N/m to 3501 N/m according to the cantilever diameters from $30{\mu}m$ to $100{\mu}m$, respectively. Thus, the proposed etching method is effective for producing a tungsten probe having specific stiffness for optimal use with an AFM and certain samples.

• Proceedings of the KSME Conference
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• 2004.04a
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• pp.923-928
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• 2004

AFM tip has been used for surface profiling with a fine resolution, but there is a barrier to improve its performance because of the low aspect ratio. Many researchers have solved this problem with attaching carbon nanotube (CNT) to Si-tip. In this paper, we proposed the aligner system that composed of dual type stage system, and these stages could attach a carbon nanotube to tungsten-tip in vacuum condition. We used tungsten tip instead of Si-tip because of its conductivity. The aligner system proposed in this paper has 10 degree-of-freedom that 3 in the first stage and 7 in the second stage. With picomotors and piezotube, the first stage has the resolution about several tens of nm and the second stage has a resolution about a nm. We experimented on characterization of Nano Aligner System and operated picomotors in SEM environment.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2004.04a
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• pp.508-512
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• 2004

An ultra-sharp tungsten electrode for field emission was manufactured by using an electrochemical etching method, and its beam characteristics were investigated. KOH and NaOH were the electrolytes used in this research, and the taper length of the tip varied form 150 $\mu\textrm{m}$ to 250 $\mu\textrm{m}$ according to the applied voltage and the concentration of the electrolyte. The electron-beam stability was measured to be within 5% for a total emission current of 5 ${\mu}\textrm{A}$ during 4 hours of operation, and the Ignition voltages were found to be ∼300 V. The tip radius was experimentally found to be 250${\AA}$ from a linear fitting of Fowler-Nordheim plots, which was in remarkably good agreement with that of the image size from scanning ion-microscopy.