• Title/Summary/Keyword: Trilayers

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Observations of Exchange Coupling in Nd2Fe14B/Fe/Nd2Fe14B Sandwich Structures and Their Magnetic Properties

  • Yang, Choong-Jin;Kim, Sang-Won
    • Journal of Magnetics
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    • v.4 no.2
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    • pp.39-45
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    • 1999

  • Sandwich structures of$ Nd_2Fe_{14}B/Fe/Nd_2Fe_{14}B $magnetic films have been grown by a KrF excimer laser (λ=248 nm) ablation technique. Magnetic properties were characterized by varying the thickness of hard ($Nd_2Fe_{14}B$) and soft (Fe) magnetic films and the volume fraction as well. In the (x)nm[NdFeB]/(y)nm[Fe]/(x)nm[NdFeB]/(100) Si structure the thickness (x) was varied from 3.6 to 54 nm, and (y) from 15 to 112 nm. At (y) = 15~20 nm where the volume fraction of Fe corresponded to 61~75%, the sandwich structure exhibited an enhanced Mr/Ms and iHc as well from the result of the exchange coupling between the magnetic layers. Experimentally calculated exchange constant$ (A_s) of A_s = 2.5{\times}10^{-10} J/m$ was estimated using the intrinsic coercivity (iHc) of 1.2 kOe at 5 K for the sandwich magnetic trilayers.

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Ferromagnetic Resonance and X-Ray Reflectivity Studies of Pulsed DC Magnetron Sputtered NiFe/IrMn/CoFe Exchange Bias

  • Oksuzoglu, Ramis Mustafa;Akman, Ozlem;Yildirim, Mustafa;Aktas, Bekir
    • Journal of Magnetics
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    • v.17 no.4
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    • pp.245-250
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    • 2012

  • Ferromagnetic resonance and X-ray specular reflectivity measurements were performed on $Ni_{81}Fe_{19}/Ir_{20}Mn_{80}/Co_{90}Fe_{10}$ exchange bias trilayers, which were grown using the pulsed-DC magnetron sputtering technique on Si(100)/$SiO_2$(1000 nm) substrates, to investigate the evolution of the interface roughness and exchange bias and their dependence on the NiFe layer thickness. The interface roughness values of the samples decrease with increasing NiFe thickness. The in-plane ferromagnetic resonance measurements indicate that the exchange bias field and the peak-to-peak line widths of the resonance curves are inversely proportional to the NiFe thickness. Furthermore, both the exchange bias field and the interface roughness show almost the same dependence on the NiFe layer thickness. The out-of plane angular dependent measurements indicate that the exchange bias arises predominantly from a variation of exchange anisotropy due to changes in interfacial structure. The correlation between the exchange bias and the interface roughness is discussed.

  • https://doi.org/10.4283/JMAG.2012.17.4.245 인용 PDF KSCI

Study of the Magnetization Reversal Behavior of exchange-Biased System Using Polarized Neutron Reflectometry

  • Park, Sung-Kyun;Kim, Ki-Yeon;Kim, Ji-Wan;Choi, Hyeok-Cheol;Teichert, A.;You, Chun-Yeol;Shin, Sung-Cheol;Lee, Jeong-Soo;Fitzsimmons, M.R.
    • Proceedings of the Korean Magnestics Society Conference
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    • 2011.06a
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    • pp.3-3
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    • 2011

  • Since the first discovery of exchange anisotropy on Co/CoO system[1], there have been numerous studies to explore the physical origin of exchange-biased system[2,3]. In this presentation, we report that how the polarized neutron reflectomery can be applied to study the magnetization reversal behavior of the exchange biased system. As an example, the detailed magnetization reversal mechanism of the exchange-biased Py(30 nm)/FeMn (0, 15, 30 nm)/CoFe(30 nm) trilayers was studied and found that the 15 nm antiferromagnetic FeMn layer mediates the magnetization reversal behaviors of both Py and CoFe layers through interlayer exchange bias coupling. We also update the current activities in polarized neutron reflectometer in HANARO.

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