• Title/Summary/Keyword: Thin film evaporation

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All Solid State Electrochromic (전 고체형 일렉트로크로믹 소자)

  • 채종우;조봉희;김영호
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1996.05a
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    • pp.295-298
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    • 1996
  • In this study, we have fabricated all solid state electrochromic devices using WO$_3$ film as the working electrode, V$_2$O$\_$5/ film as the counter electrode and PEO-LiClO$_4$-PC film as the solid electrolyte. The WO$_3$ thin films for working electrode and V$_2$O$\_$5/ thin films for counter electrode were deposited onto ITO glass by vacuum evaporation and were shown good electrochromic and state properties after 1x10$\^$5/ cycles. PEO-LiClO$_4$-PC polymer electrolyte can easily be formed into thin films, do not absorb in the visible region of the light. Therefore, such electrolyte have electrochromic properties suitable for large-scale all solid-state electrochromic devices. All solid-staeelectrochromic devices fabricated in this polymer electrolyte have optical modulation of 20%∼30% at 1.5 V.

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Disjoining Pressures of Nanoscale Thin Films on Solid Substrate (고체 면에 흡착된 박막에서의 분리압력 특성에 관한 연구)

  • Han, Min-Sub
    • Transactions of the Korean Society of Mechanical Engineers B
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    • v.33 no.2
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    • pp.101-106
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    • 2009
  • The disjoining pressure is an important physical property in modeling the small-scale transport phenomena on thin film. It is a very useful definition in characterizing the non-continuum effects that are not negligible in heat and mass transport of the film thinner than submicro-scales. We present the calculated values of disjoining pressure of He, Kr and Xe thin films absorbed on graphite substrate using Molecular Dynamics Simulation (MD). The disjoining pressure is accurately calculated in the resolution of a molecular scale of the film thickness. The characteristics of the pressure are discussed regarding the molecular nature of the fluid system such as molecular diameter and intermolecular interaction parameters. The MD results are also compared with those based on the continuum approximation of the slab-like density profile and the results on other novel gases in the previous study. The discrepancies of the continuum model with MD results are shown in all three configurations and discussed in the view point of molecular features.

Analysis of Sticking Coefficient in BSCCO Superconductor Thin Film Fabricated by Co-deposition (공증착법으로 제작한 BSCCO 초전도 박막의 부착계수 해석)

  • 안인순;천민우;박용필
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.11a
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    • pp.300-303
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    • 2001
  • BSCCO thin films are fabricated via a co-deposition process by an ion beam sputtering with an ultra-low growth rate, and sticking coefficients of the respective elements are evaluated. The sticking coefficient of Bi element exhibits a characteristic temperature dependence : almost a constant value of 0.49 below 730$^{\circ}C$ and decreases linearly with temperature over 730$^{\circ}C$. This temperature dependence can be elucidated from the evaporation and sublimation rates of bismuth oxide, Bi$_2$O$_3$, from the film surface. It is considered that the liquid phase of the bismuth oxide plays an important role in the Bi 2212 phase formation in the co-deposition process.

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I-V Properties OLED by CMP Process (CMP 공정을 적용한 유기발광소자의 전압.전류 특성)

  • Choi, Gwon-Woo;Lee, Woo-Sun;Jun, Young-Kil;Jueng, Pan-Gum;Seo, Yong-Jin
    • Proceedings of the KIEE Conference
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    • 2006.07c
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    • pp.1357-1358
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    • 2006
  • Indium tin oxide (ITO) thin film is a transparent electrode, which is widely applied to solar battery, illuminators, optical switches, liquid crystal displays (LCDs), plasma display panels (PDPs), and organic light emitting displays (OLEDs) due to its easy formation on glass substrates, goof optical transmittance, and good conductivity. ITO thin film is generally fabricated by various methods such as spray, CVD, evaporation, electron gun deposition, direct current electroplating, high frequency sputtering, and reactive DC sputtering. However, some problems such as peaks, bumps, large particles, and pin-holes on the surface of ITO thin film were reported, which caused the destruction of color quality, the reduction of device life time, and short-circuit. Chemical mechanical polishing (CMP) processis one of the suitable solutions which could solve the problems.

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The Dielectric Properties by Triple SiO Thin Film using Spectroscopic Ellipsometer (Spectroscopic Ellipsometer를 이용한 삼원 SiO박막의 유전율특성)

  • Kim, Byeung-In;Lee, Woo-Sun;Kim, Chang-Suk;Lee, Suang-Il;Hwang, Seuk-Yong
    • Proceedings of the KIEE Conference
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    • 1994.11a
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    • pp.249-251
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    • 1994
  • We fabricated the sample of M-I-M with the insulating layer SiO. Refractive index of wave length, photon energy, absorption rate of SiO evaporation thin film are experimentally examined by spectroscopic Ellipsometer. The calculated equations of refractive index, absorption rate and permittivity of SiO thin film are induced. Calculated values and experimental values are compared and then mutual validity is proved.

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Bi-sticking Coefficient of Bi-superconducting Thin Film Prepared by IBS Method

  • Lee, Hee-Kab;Lee, Joon-Ung;Park, Yong-Pil
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1999.11a
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    • pp.213-216
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    • 1999
  • BSCCO thin films are fabricated via a co-deposition process by an ion beam sputtering with an ultra-low growth rate, and sticking coefficients of the respective elements are evaluated. The sticking coefficient of Bi element exhibits a characteristics temperature dependence : almost a constant value of 0.49 below 730$^{\circ}C$ and decreases linearly with temperature over 730$^{\circ}C$. This temperature dependence can be elucidated from the evaporation and sublimation rates of bismuth oxide, Bi$_2$O$_3$ from the film surface. It is considered that the liquid phase of the bismuth oxide plays an important role in the Bi(2212) phase formation in the co-deposition process.

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Charged Cluster Model as a New Paradigm of Crystal Growth

  • Nong-M. Hwang;In-D. Jeon;Kim, Doh-Y.
    • Proceedings of the Korea Association of Crystal Growth Conference
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    • 2000.06a
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    • pp.87-125
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    • 2000
  • A new paradigm of crystal growth was suggested in a charged cluster model, where charged clusters of nanometer size are suspended in the gas phase in most thin film processes and are a major flux for thin film growth. The existence of these hypothetical clusters was experimentally confirmed in the diamond and silicon CVD processes as well as in gold and tungsten evaporation. These results imply new insights as to the low pressure diamond synthesis without hydrogen, epitaxial growth, selective deposition and fabrication of quantum dots, nanometer-sized powders and nanowires or nanotubes. Based on this concept, we produced such quantum dot structures of carbon, silicon, gold and tungsten. Charged clusters land preferably on conducting substrates over on insulating substrates, resulting in selective deposition. if the behavior of selective deposition is properly controlled, charged clusters can make highly anisotropic growth, leading to nanowires or nanotubes.

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Study of large-area CIGS thin film solar cell (CIGS 박막 태양전지의 대면적화 연구)

  • Kim, Chae-Woong;Kim, Dae-Sung;Kim, Tae-Sung;Kim, Jin-Hyeok
    • 한국신재생에너지학회:학술대회논문집
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    • 2009.11a
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    • pp.399-399
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    • 2009
  • CIS계 화합물 태양전지는 높은 광흡수계수와 열적 안정성 및 Ga 조성 조절을 통한 밴드갭 조절이 용이해 고효율 박막 태양전지로 각광 받고 있다. CIS 태양전지의 광 흡수층 제조 방법으로는 여러 가지 방법이 있지만 본 연구에서는 가장 높은 에너지 변환 효율을 달성한 Co-Evaporation 방법을 사용하기로 하였다. 미국의 NREL의 경우 Co-Evaporation 방법을 사용해 20%의 에너지 변환 효율을 달성한 바가 있다. 하지만 이러한 효율의 태양전지는 실험실에서 연구용으로 제작한 아주 작은 면적으로 태양전지 양산화에 그대로 적용하기는 힘들다. 따라서 CIGS 태양전지의 양산화 적용을 위해 대면적화가 필수적이다. 본 연구에서는 기존의 3 stage 방식을 이용해 광흡수층을 증착하여 최적화 조건을 연구하였다. 또한 기판의 면적 증가에 따라 효율과 Voc, Jsc, F.F가 얼마나 감소하는지 실험하여 보았다. 기판은 soda lime glass를 사용 하였으며 후면 전극으로 약$1{\mu}m$ 두께의 Mo를 DC Supptering 방법을 이용해 증착하였다. 다음으로 약 $2{\mu}m$이상의 광흡수층을 Co-Evaporation 방법을 이용하여 증착 하였으며 buffer층으로는 약 50nm의 CdS층을 CBD방법을 이용하여 제조 하였다. TCO층으로 약 50nm의 i-ZnO와 약 450nm의 Al-ZnO를 RF Sputtering 방법을 이용하여 증착 하였다. 마지막으로 앞면 전극으로 약 $3{\mu}m$의 Al을 Thermal Evaporation 방법으로 증착하였다. 태양전지 소자의 면적은 $0.49cm^2$, $25cm^2$, $100cm^2$로 각각 면적을 달리하며 효율을 비교 분석하였다.

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Disjoining pressure of nanoscale thin film on solid substrate (고체 위의 박막에서의 분리압력 및 안정특성에 관한 연구)

  • Han, Min-sub
    • Proceedings of the KSME Conference
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    • 2007.05b
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    • pp.1912-1915
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    • 2007
  • The disjoining pressure is critical in modeling the transport phenomena in small scales. They are very useful in characterizing the non-continuum effects that are not negligible in heat and mass transports in the film of less than submicro-scales. We present he disjoining pressure of thin film absorbed on solid substrate using Molecular Dynamics Simulation (MD). The disjoining pressure with respect to the film thickness is accurately calculated in the resolution of a molecular scale. The characteristics of the pressure are discussed regarding the molecular nature of the fluid system like molecular diameter and intermolecular interaction. Also, the MD results are compared with those based on the macroscopic approximation of the slab-like density profile. Significant discrepancy is observed when the effective film thickness is less than several molecular diameter

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Synthesis and Properties of Ba(Ti,Sn)O3 Films by E-Beam Evaporation (전자빔증발법에 의한 Ba(Ti,Sn)O3막의 제조 및 특성)

  • Park, Sang-Shik
    • Korean Journal of Materials Research
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    • v.18 no.7
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    • pp.373-378
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    • 2008
  • $Ba(Ti,Sn)O_3$ thin films, for use as dielectrics for MLCCs, were grown from Sn doped BaTiO3 sources by e-beam evaporation. The crystalline phase, microstructure, dielectric and electrical properties of films were investigated as a function of the (Ti+Sn)/Ba ratio. When $BaTiO_3$ sources doped with $20{\sim}50\;mol%$ of Sn were evaporated, $BaSnO_3$films were grown due to the higher vapor pressure of Ba and Sn than of Ti. However, it was possible to grow the $Ba(Ti,Sn)O_3$ thin films with {\leq}\;15\;mol%$ of Sn by co-evaporation of BTS and Ti metal sources. The (Ti+Sn)/Ba and Sn/Ti ratio affected the microstructure and surface roughness of films and the dielectric constant increased with increasing Sn content. The dielectric constant and dissipation factor of $Ba(Ti,Sn)O_3$ thin films with {\leq}\;15\;mol%$ of Sn showed the range of 120 to 160 and $2.5{\sim}5.5%$ at 1 KHz, respectively. The leakage current density of films was order of the $10^{-9}{\sim}10^{-8}A/cm^2$ at 300 KV/cm. The research results showed that it was feasible to grow the $Ba(Ti,Sn)O_3$ thin films as dielectrics for MLCCs by an e-beam evaporation technique.