• Journal of the Microelectronics and Packaging Society
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• v.23 no.3
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• pp.43-49
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• 2016

Reliability characteristics of thin package-on-packages were evaluated using T/H (temperature/humidity) test at $85^{\circ}C/85%$ for 500 hours, TC (temperature cycling) test at $-40{\sim}100^{\circ}C$ for 1,000 cycles, and HTS (high temperature storage) test at $155^{\circ}C$ for 1,000 hours. The average resistance of the solder-bump circuitry between the top and bottom packages of 24 package-on-package (PoP) samples, which were processed using polyimide thermal tape, was $0.56{\pm}0.05{\Omega}$ and quite similar for all 24 samples. Open failure of solder joints did not occur after T/H test for 500 hours, TC test for 1,000 cycles, and HTS test for 1,000 hours, respectively.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.13 no.9
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• pp.3815-3821
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• 2012

The LCD frame is an important part which supports the BLU of medium/large sized TFT-LCD. To produce it efficiently, it is necessary to achieve the molding process improvement from 1 cavity to 2 cavity system. Because 2 cavity mold is compact and its hot-runner zone is broadened, it is difficult to control the temperature on the mold. In this study, injection molding analysis on the frame in 2 cavity process with FEA(Finite Element Analysis) software is carried out to estimate its quality. The calculated injection molding pressures and maximum deflection in 1 and 2 cavity processes are 41.13 MPa and 1.62 mm, 40.49 MPa and 1.66 mm respectively. The measured maximum flexure load and surface roughness of the left and right frame of 2 cavities are 209 N and 0.08 ${\mu}m$, 193 N and 0.10 ${\mu}m$ while those in 1 cavity are 140 N and 0.13 ${\mu}m$. Thermal image shows that the maximum standard deviation of the temperature on left and right side of 2 cavity mold is $1.23^{\circ}C$. The simulation and measurement results show that the quality of the frame in 2 cavity injection molding process as a whole is not worse than that of 1 cavity system. But maximum flexure loads of the frame in 2 cavity process are far greater than that in 1 cavity process.

• Journal of the Microelectronics and Packaging Society
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• v.12 no.3 s.36
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• pp.187-196
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• 2005

MEMS devices such as a vibratory gyroscope often suffer from a lower yield rate due to fabrication errors and the external stress. In the decoupled vibratory gyroscope, the main factor that determines the yield rate is the frequency difference between the sensing and driving modes. The gyroscope, fabricated with SOI (Silicon-On-Insulator) wafer and packaged using the anodic bonding, has a large wafer bowing caused by thermal expansion mismatch as well as non-uniform surfaces of the structures caused by the notching effect. These effects result in large distribution in the frequency difference, and thereby a lower yield rate. To improve the yield rate we propose a packaged SiOG (Silicon On Glass) technology. It uses a silicon wafer and two glass wafers to minimize the wafer bowing and a metallic membrane to avoid the notching. In the packaged SiOG gyroscope, the notching effect is eliminated and the warpage of the wafer is greatly reduced. Consequently the frequency difference is more uniformly distributed and its variation is greatly improved. Therefore we can achieve a more robust vibratory MEMS gyroscope with a higher yield rate.