• Journal of the Korean Institute of Telematics and Electronics B
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• v.33B no.4
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• pp.141-147
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• 1996

In this paper an improved morphological algorithm for directional defect detection is proposed, where the defect is parallel to the texture image. The algorithm is based on obtaining the background image while removing the defect by comparing every directional morphological result with max or min except that of defect. The defect can of defect and the background image. For a computer simulation, it is shown that the proposed method has better performance than the conventional algorithm.

• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.16 no.6
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• pp.369-377
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• 2023

In the industrial manufacturing sector, quality control is pivotal for minimizing defect rates; inadequate management can result in additional costs and production delays. This study underscores the significance of detecting texture defects in manufactured goods and proposes a more precise defect detection technique. While the DFR(Deep Feature Reconstruction) model adopted an approach based on feature map amalgamation and reconstruction, it had inherent limitations. Consequently, we incorporated a new loss function using statistical methodologies, integrated a skip connection structure, and conducted parameter tuning to overcome constraints. When this enhanced model was applied to the texture category of the MVTec-AD dataset, it recorded a 2.3% higher Defect Segmentation AUC compared to previous methods, and the overall defect detection performance was improved. These findings attest to the significant contribution of the proposed method in defect detection through the reconstruction of feature map combinations.

• 제어로봇시스템학회:학술대회논문집
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• 2004.08a
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• pp.2059-2064
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• 2004

Texture analysis is an important role for automatic visual insfection. This paper presents an application of wavelet extension and Gray level co-occurrence matrix (GLCM) for detection of defect encountered in textured images. Texture characteristic in low quality images is not to easy task to perform caused by noise, low frequency and small dimension. In order to solve this problem, we have developed a procedure called wavelet image extension. Wavelet extension procedure is used to determine the frequency bands carrying the most information about the texture by decomposing images into multiple frequency bands and to form an image approximation with higher resolution. Thus, wavelet extension procedure offers the ability to robust feature extraction in images. Then the features are extracted from the co-occurrence matrices computed from the sub-bands which performed by partitioning the texture image into sub-window. In the detection part, Mahalanobis distance classifier is used to decide whether the test image is defective or non defective.

• KSII Transactions on Internet and Information Systems (TIIS)
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• v.16 no.1
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• pp.245-265
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• 2022

In response to problems such as insufficient extraction information, low detection accuracy, and frequent misdetection in the field of Thangka image defects, this paper proposes a YOLOv5 prediction algorithm fused with the attention mechanism. Firstly, the Backbone network is used for feature extraction, and the attention mechanism is fused to represent different features, so that the network can fully extract the texture and semantic features of the defect area. The extracted features are then weighted and fused, so as to reduce the loss of information. Next, the weighted fused features are transferred to the Neck network, the semantic features and texture features of different layers are fused by FPN, and the defect target is located more accurately by PAN. In the detection network, the CIOU loss function is used to replace the GIOU loss function to locate the image defect area quickly and accurately, generate the bounding box, and predict the defect category. The results show that compared with the original network, YOLOv5-SE and YOLOv5-CBAM achieve an improvement of 8.95% and 12.87% in detection accuracy respectively. The improved networks can identify the location and category of defects more accurately, and greatly improve the accuracy of defect detection of Thangka images.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 1996.03a
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• pp.24-29
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• 1996

The seniconductor, which is precision product, requires many inspection processes. The surface conditions of the semiconductor chip effect on the functions of the semiconductors. The defects of the chip surface is crack or void. Because general inspection method requires many inspection processes, the inspection system which searches immediately and preciselythe defects of the semiconductor chip surface. We propose the inspection method by using the computer vision system. This study presents an image processing algorithm for inspecting the surface defects(crack, void)of the semiconductor test samples. The proposed image processing algorithm aims to reduce inspection time, and to analyze those experienced operator. This paper regards the chip surface as random texture, and deals with the image modeling of randon texture image for searching the surface defects. For texture modeling, we consider the relation of a pixel and neighborhood pixels as noncasul model and extract the statistical characteristics from the radom texture field by using the 2D AR model(Aut oregressive). This paper regards on image as the output of linear system, and considers the fidelity or intelligibility criteria for measuring the quality of an image or the performance of the processing techinque. This study utilizes the variance of prediction error which is computed by substituting the gary level of pixel of another texture field into the two dimensional AR(autoregressive model)model fitted to the texture field, estimate the parameter us-ing the PAA(parameter adaptation algorithm) and design the defect detection filter. Later, we next try to study the defect detection search algorithm.

• Journal of Information Processing Systems
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• v.16 no.5
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• pp.1008-1014
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• 2020

Aiming at the defect detection quality of denim fabric, this paper designs an improved algorithm based on the optimized Gabor filter. Firstly, we propose an improved defect detection algorithm of jean fabric based on the maximum two-dimensional image entropy and the loss evaluation function. Secondly, 24 Gabor filter banks with 4 scales and 6 directions are created and the optimal filter is selected from the filter banks by the one-dimensional image entropy algorithm and the two-dimensional image entropy algorithm respectively. Thirdly, these two optimized Gabor filters are compared to realize the common defect detection of denim fabric, such as normal texture, miss of weft, hole and oil stain. The results show that the improved algorithm has better detection effect on common defects of denim fabrics and the average detection rate is more than 91.25%.

• Journal of the Korean Institute of Telematics and Electronics S
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• v.35S no.4
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• pp.76-84
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• 1998

The requirements of the accuracy, the high speed and the stability are very important factors in the defect-detection sytem for the texture. In this paper, we describe a novel scheme of the defect detection using a statistical behavior of defect patterns. Some prior knowledge as to the characteristics of flaws is that the defects are consistently distributed in the space and the noise are randomly generated. An empirical knowledge is adapted for the binarization and the determination process of defects in textured image. Since the process of the determination exclude the segmentations or delineation steps, we are able to meet the speed requirements. We show the validity of the scheme through the simulation of textured images.

• Journal of Information Processing Systems
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• v.8 no.2
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• pp.359-374
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• 2012

In this paper, we propose a new machine vision algorithm for automatic defect detection on patterned textures with the help of texture-periodicity and the Jensen-Shannon Divergence, which is a symmetrized and smoothed version of the Kullback-Leibler Divergence. Input defective images are split into several blocks of the same size as the size of the periodic unit of the image. Based on histograms of the periodic blocks, Jensen-Shannon Divergence measures are calculated for each periodic block with respect to itself and all other periodic blocks and a dissimilarity matrix is obtained. This dissimilarity matrix is utilized to get a matrix of true-metrics, which is later subjected to Ward's hierarchical clustering to automatically identify defective and defect-free blocks. Results from experiments on real fabric images belonging to 3 major wallpaper groups, namely, pmm, p2, and p4m with defects, show that the proposed method is robust in finding fabric defects with a very high success rates without any human intervention.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1996.11a
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• pp.444-449
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• 1996

The semiconductor, which is precision product, requires many inspection processes. The surface conditions of the semiconductor chip affect on the functions of the semiconductors. The defects of the chip surface are cracks or voids. As general inspection method requires many inspection procedure, the inspection system which searches immediately and precisely the defects of the semiconductor chip surface is required. We suggest the detection algorithm for inspecting the surface defects of the semiconductor surface. The proposed algorithm first regards the semiconductor surface as random texture and point spread function, and secondly presents the character of texture by linear estimation theorem. This paper assumes that the gray level of each pixel of an image is estimated from a weighted sum of gray levels of its neighbor pixels by linear estimation theorem. The weight coefficients are determined so that the mean square error is minimized. The obtained estimation window(two-dimensional estimation window) characterizes the surface texture of semiconductor and is used to discriminate the defects of semiconductor surface.

• Journal of Advanced Navigation Technology
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• v.26 no.2
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• pp.113-118
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• 2022

Motivated by people highlighting important phrases while reading or taking notes we propose a neural network training method by highlighting defective pixel areas to classify effectively defect types of images with complex background textures. To verify our proposed method we apply it to the problem of classifying the defect types of tire band fabric images that are too difficult to classify. In addition we propose a backlight highlighting technique which is tailored to the tire band fabric images. Backlight highlighting images can be generated by using both the GradCAM and simple image processing. In our experiment we demonstrated that the proposed highlighting method outperforms the traditional method in the view points of both classification accuracy and training speed. It achieved up to 13.4% accuracy improvement compared to the conventional method. We also showed that the backlight highlighting technique tailored for highlighting tire band fabric images is superior to a contour highlighting technique in terms of accuracy.