• 전자공학회논문지B
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• 제33B권4호
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• pp.141-147
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• 1996

In this paper an improved morphological algorithm for directional defect detection is proposed, where the defect is parallel to the texture image. The algorithm is based on obtaining the background image while removing the defect by comparing every directional morphological result with max or min except that of defect. The defect can of defect and the background image. For a computer simulation, it is shown that the proposed method has better performance than the conventional algorithm.

• 한국정보전자통신기술학회논문지
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• 제16권6호
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• pp.369-377
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• 2023

산업 제조 분야에서 품질 관리는 불량률을 최소화하는 핵심 요소로, 미흡한 관리는 추가적인 비용 발생과 생산 지연을 야기할 수 있다. 본 연구는 제조품의 텍스쳐 결함 감지의 중요성을 중심으로, 보다 정밀한 결함 감지 방법을 제시한다. DFR(Deep Feature Reconstruction) 모델은 특징맵의 조합 및 재구성을 통한 접근법을 채택하였지만, 그 방식에는 한계가 있었다. 이에 따라, 우리는 제한점을 극복하기 위해 통계적 방법론을 활용한 새로운 손실 함수와 스킵 연결구조를 통합하고 파라미터 튜닝을 진행하였다. 이 개선된 모델을 MVTec-AD 데이터세트의 텍스쳐 카테고리에 적용한 결과, 기존 방식보다 2.3% 높은 결함 분할 AUC를 기록하였고, 전체적인 결함 감지 성능도 향상되었다. 이 결과는 제안하는 방법이 특징맵 조합의 재건축을 통한 결함 탐지에 있어서 중요한 기여함을 입증한다.

• 제어로봇시스템학회:학술대회논문집
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• 제어로봇시스템학회 2004년도 ICCAS
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• pp.2059-2064
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• 2004

Texture analysis is an important role for automatic visual insfection. This paper presents an application of wavelet extension and Gray level co-occurrence matrix (GLCM) for detection of defect encountered in textured images. Texture characteristic in low quality images is not to easy task to perform caused by noise, low frequency and small dimension. In order to solve this problem, we have developed a procedure called wavelet image extension. Wavelet extension procedure is used to determine the frequency bands carrying the most information about the texture by decomposing images into multiple frequency bands and to form an image approximation with higher resolution. Thus, wavelet extension procedure offers the ability to robust feature extraction in images. Then the features are extracted from the co-occurrence matrices computed from the sub-bands which performed by partitioning the texture image into sub-window. In the detection part, Mahalanobis distance classifier is used to decide whether the test image is defective or non defective.

• KSII Transactions on Internet and Information Systems (TIIS)
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• 제16권1호
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• pp.245-265
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• 2022

In response to problems such as insufficient extraction information, low detection accuracy, and frequent misdetection in the field of Thangka image defects, this paper proposes a YOLOv5 prediction algorithm fused with the attention mechanism. Firstly, the Backbone network is used for feature extraction, and the attention mechanism is fused to represent different features, so that the network can fully extract the texture and semantic features of the defect area. The extracted features are then weighted and fused, so as to reduce the loss of information. Next, the weighted fused features are transferred to the Neck network, the semantic features and texture features of different layers are fused by FPN, and the defect target is located more accurately by PAN. In the detection network, the CIOU loss function is used to replace the GIOU loss function to locate the image defect area quickly and accurately, generate the bounding box, and predict the defect category. The results show that compared with the original network, YOLOv5-SE and YOLOv5-CBAM achieve an improvement of 8.95% and 12.87% in detection accuracy respectively. The improved networks can identify the location and category of defects more accurately, and greatly improve the accuracy of defect detection of Thangka images.

• 한국공작기계학회:학술대회논문집
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• 한국공작기계학회 1996년도 춘계학술대회 논문집
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• pp.24-29
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• 1996

The seniconductor, which is precision product, requires many inspection processes. The surface conditions of the semiconductor chip effect on the functions of the semiconductors. The defects of the chip surface is crack or void. Because general inspection method requires many inspection processes, the inspection system which searches immediately and preciselythe defects of the semiconductor chip surface. We propose the inspection method by using the computer vision system. This study presents an image processing algorithm for inspecting the surface defects(crack, void)of the semiconductor test samples. The proposed image processing algorithm aims to reduce inspection time, and to analyze those experienced operator. This paper regards the chip surface as random texture, and deals with the image modeling of randon texture image for searching the surface defects. For texture modeling, we consider the relation of a pixel and neighborhood pixels as noncasul model and extract the statistical characteristics from the radom texture field by using the 2D AR model(Aut oregressive). This paper regards on image as the output of linear system, and considers the fidelity or intelligibility criteria for measuring the quality of an image or the performance of the processing techinque. This study utilizes the variance of prediction error which is computed by substituting the gary level of pixel of another texture field into the two dimensional AR(autoregressive model)model fitted to the texture field, estimate the parameter us-ing the PAA(parameter adaptation algorithm) and design the defect detection filter. Later, we next try to study the defect detection search algorithm.

• Journal of Information Processing Systems
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• 제16권5호
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• pp.1008-1014
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• 2020

Aiming at the defect detection quality of denim fabric, this paper designs an improved algorithm based on the optimized Gabor filter. Firstly, we propose an improved defect detection algorithm of jean fabric based on the maximum two-dimensional image entropy and the loss evaluation function. Secondly, 24 Gabor filter banks with 4 scales and 6 directions are created and the optimal filter is selected from the filter banks by the one-dimensional image entropy algorithm and the two-dimensional image entropy algorithm respectively. Thirdly, these two optimized Gabor filters are compared to realize the common defect detection of denim fabric, such as normal texture, miss of weft, hole and oil stain. The results show that the improved algorithm has better detection effect on common defects of denim fabrics and the average detection rate is more than 91.25%.

• 전자공학회논문지S
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• 제35S권4호
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• pp.76-84
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• 1998

The requirements of the accuracy, the high speed and the stability are very important factors in the defect-detection sytem for the texture. In this paper, we describe a novel scheme of the defect detection using a statistical behavior of defect patterns. Some prior knowledge as to the characteristics of flaws is that the defects are consistently distributed in the space and the noise are randomly generated. An empirical knowledge is adapted for the binarization and the determination process of defects in textured image. Since the process of the determination exclude the segmentations or delineation steps, we are able to meet the speed requirements. We show the validity of the scheme through the simulation of textured images.

• Journal of Information Processing Systems
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• 제8권2호
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• pp.359-374
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• 2012

In this paper, we propose a new machine vision algorithm for automatic defect detection on patterned textures with the help of texture-periodicity and the Jensen-Shannon Divergence, which is a symmetrized and smoothed version of the Kullback-Leibler Divergence. Input defective images are split into several blocks of the same size as the size of the periodic unit of the image. Based on histograms of the periodic blocks, Jensen-Shannon Divergence measures are calculated for each periodic block with respect to itself and all other periodic blocks and a dissimilarity matrix is obtained. This dissimilarity matrix is utilized to get a matrix of true-metrics, which is later subjected to Ward's hierarchical clustering to automatically identify defective and defect-free blocks. Results from experiments on real fabric images belonging to 3 major wallpaper groups, namely, pmm, p2, and p4m with defects, show that the proposed method is robust in finding fabric defects with a very high success rates without any human intervention.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 1996년도 추계학술대회 논문집
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• pp.444-449
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• 1996

The semiconductor, which is precision product, requires many inspection processes. The surface conditions of the semiconductor chip affect on the functions of the semiconductors. The defects of the chip surface are cracks or voids. As general inspection method requires many inspection procedure, the inspection system which searches immediately and precisely the defects of the semiconductor chip surface is required. We suggest the detection algorithm for inspecting the surface defects of the semiconductor surface. The proposed algorithm first regards the semiconductor surface as random texture and point spread function, and secondly presents the character of texture by linear estimation theorem. This paper assumes that the gray level of each pixel of an image is estimated from a weighted sum of gray levels of its neighbor pixels by linear estimation theorem. The weight coefficients are determined so that the mean square error is minimized. The obtained estimation window(two-dimensional estimation window) characterizes the surface texture of semiconductor and is used to discriminate the defects of semiconductor surface.

• 한국항행학회논문지
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• 제26권2호
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• pp.113-118
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• 2022

사람은 독서나 필기 중 중요 문구를 형광펜으로 칠하는 것에서 착안하여, 본 논문에서는 복잡한 배경 질감을 가진 영상에서의 불량유형을 효과적으로 분류하기 위해 불량 픽셀 영역을 하이라이팅 하여 신경망을 훈련하는 방법을 제안한다. 제안 방법의 가능성을 검증하기 위하여 불량유형 구분이 매우 어려운 타이어 밴드 직물의 불량유형 분류에 제안 방법을 적용한다. 또한, 타이어 밴드 직물 영상에 특화된 백라이트 하이라이팅 방법을 제안한다. 백라이트 하이라이트 영상은 GradCAM 기법과 간단한 영상처리를 이용하여 획득할 수 있다. 실험에서 우리는 제안하는 하이라이팅 기법이 분류 정확도뿐만 아니라 훈련속도 면에서 기존 방법보다 우수함을 보였다. 인식률 면에서는 제안 방법이 기존 방법 대비 최대 13.4%의 향상을 달성하였다. 타이어 밴드 직물 영상에 특화된 백라이트 하이라이팅 기법이 윤곽 하이라이팅 기법보다 정확도 측면에서 우수함을 보였다.