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Kim, Jae-Youn;Lee, Kang-Hae;Park, Yong-Bum;Lee, Keun-Ku
- Proceedings of the Korean Society of Broadcast Engineers Conference
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- 2009.01a
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- pp.404-407
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- 2009
Bluetooth Video Distribution Profile (VDP) defines the protocol and procedures that realize the distribution of video content compressed in a specific format for the efficient use of the limited bandwidth. In this paper, we describe the design of VDP tester based on TTCN-2 (Tree and Tabular Combined Notation), a language standardized by ISO for the specification of tests for real-time and communicating systems. Our work was carried out as a part of supporting a new profile testing module for VDP in PTS (Profile Tuning Suite), a reference test system for Bluetooth interoperability testing. Test demonstration for the interoperability with various VDP solutions at the PTS session in UPF30 (Unplug Fest) showed the validity of the developed tester. Eventually, we introduce the PTS architecture, and show the design and implementation of VDP tester included in the released PTS 3.0 in this paper.
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Chung Chang-Shin;Lee Kye-Im;Kim Jong-Hee;Jung Soon-Key
- Journal of the Korea Society of Computer and Information
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- v.10 no.3 s.35
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- pp.89-99
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- 2005
The testing time and cost of developed software can be reduced by automation of the whole or part of testing process. Since the testing automation tools to be used currently have been developed without their interoperability, test case information such as test procedures, test data, and expectation of test results generated at the stage of test execution cannot be shared and reused in other testing automation tools, In order to reduce testing time and cost, in this thesis, we have proposed a software testing automation framework which makes it possible to share and reuse the test case information generated in testing process. To prove the availability and effectiveness of proposed testing automation framework, three testing automation tools that are available in current market were experimented by the test scenario. As a result of experiment, the testing time and cost could be reduced by sharing and reusing the test case information in software testing automation framework.
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Lee, Hee Seung
- (The) Korean Journal of Educational Psychology
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- v.31 no.4
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- pp.819-845
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- 2017
Although testing is usually done for purposes of assessment, previous research over the past 100 years indicates that testing is an effective tool for learning. Testing or retrieval practice of previously studied materials can enhance learning of that previously studied information and/or learning of subsequently presented new information. The former is referred to as the backward effect of testing whereas the latter is referred to as the forward effect of testing. Thus far, however, the literature has not isolated these two effects and most previous research focused on the backward effect. Only recent laboratory research provided evidence that there is a forward effect of testing. The present study provides a review of research on this forward and backward effect of testing, focusing on testing procedures of the effects, empirical evidence, current theoretical explanations, and issues to resolve in order to make use of testing effect in educational settings. The reviews clearly show that testing enhances memory of previously learned information by working as memory modifier and learning of newly presented information by affecting learners' metacognition, implying that testing is not just an assessment of learning, but also an effective tool for learning.
https://doi.org/10.17286/KJEP.2017.31.4.10 인용

임창용;김동욱
- Proceedings of the IEEK Conference
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- 1998.06a
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- pp.811-814
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- 1998
REcent research about current testing($\textrm{I}_{DDQ}$ testing) has been emphasizing that $\textrm{I}_{DDQ}$ testing in addition to the logical voltage testing is necessary to increase the fault coverage. The $\textrm{I}_{DDQ}$. testing can detect physical faults other than the classical stuck-at type fault, which affect reliability. One of the most critical issues in the $\textrm{I}_{DDQ}$ testing is to insert a built-in current sensor (BICS) that can detect abnormal static currents from the power supply or to the ground. This paper presents a new BICS for internal current testing for large CMOS logic circuits. The proposed BICS uses a single phase clock to minimize the hardware overhead. It detects faulty current flowing and converts it into a corresponding logic voltage level to make converts it into a corresponding logic voltage level to make it possible to use the conventional voltage testing techniqeus. By using current mirroring technique, the proposed BICS can work at very high speed. Because the proposed BICS almost does not affects normal operation of CUT(circuit under test), it can be used to a very large circuit without circuit partitioning. By altenating the operational modes, a circuit can be $\textrm{I}_{DDQ}$-tested as a kind of self-testing fashion by using the proposed BICS.
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