• Journal of the Korean Crystal Growth and Crystal Technology
• /
• v.10 no.1
• /
• pp.17-22
• /
• 2000

A quaternary alloy film of $CoCr_{16.2}Pt_{10.8}Ta_4$was investigated for its magnetic properties and c-axis orientation with and without Ti underlayer. Additional elements such as Ta, Pt have been frequently introduced in CoCr alloy film for perpendicular recording as a means of improving magnetic performance. It has been reported that the addition of Pt and Ta in CoCr increase the coercivity and the magnetic isolation of columnar grains, respectively. However, CoCrPtTa perpendicular magnetic layer should be more increased its perpendicular magnetic anisotropy than at present for the application of ultrahigh recording density. The improvement of underlayers and substrate materials is one of the promised schemes to intensify the perpendicular magnetic anisotropy. In this study, the insertion of Ti underlayer shows the remarkable improvement of c-axis orientation compare with the direct deposition on the bare glass. The mechanism about this effect of Ti underlayer on CoCrPtTa is not to be clarified yet. Meanwhile, it is found that the magnetic domain of CoCrPtTa on 20 nm Ti underlayer has the continuous stripe pattern but the one of CoCrPtTa on 90 nm Ti underlayer shows the discrete mass type from the results of MFM investigation. This phenomenon is to be a distinct evidence that the improvement of perpendicular anisotropy by the adoption of Ti underlayer is originated from the reinforcement of the grain boundary segregation in CoCrPtTa alloy. Moreover, the transition of the M-H hysteresis pattern with the thickness of Ti underlayer indicates that the major contribution of Ti underlayer is not the magnetocrystalline anisotropy but the shape anisotropy due to the formation of uniform columnar grains by the nonmagnetic alloy segregation.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2001.11b
• /
• pp.77-80
• /
• 2001

Crystallographic and magnetic characteristics of CoCr-based magnetic thin film for perpendicular magnetic recording media were influenced on preparing conditions. In these, there is that substrate temperature was parameter that increases perpendicular coercivity of CoCrTa magnetic layer using recording layer. While preparation of CoCr-based doublelayer, by optimizing substrate temperature, we expect to increase perpendicular anisotropy of CoCr magnetic layer and prepare ferromagnetic recording layer with a good quality by epitaxial growth. CoCrTa/Si doublelayer showed a good dispersion angle of c-axis orientation $\Delta\theta_{50}$ caused by inserting amorphous Si underlayer which prepared at underlayer substrate temperature 250C. Perpendicular coercivity was constant, in-plane coercivity was controlled a low value about 200Oe. This result implied that Si underlayer could restrain growth of initial layer of CoCrTa thin film, which showed bad magnetic properties effectively without participating magnetization patterns of magnetic layer. In case of CoCrTa/Si that prepared with ultra thin underlayer, crystalline orientation of CoCrTa was improved rather underlayer thickness 1nm, it was expected that amorphous Si layer played a important role in not only underlayer but also seed layer.

• Korean Journal of Materials Research
• /
• v.7 no.12
• /
• pp.1052-1057
• /
• 1997

현재 전기, 전자, 우주, 자동차, 무기 등의 여러 분야에서 응용되고 있는 TaNx 다층박막저항체의 특성을 개선하기 위하여 magnetron sputtering법으로 TaNx박막을 제조한 후, 온도와 질소분압에 따른 전기저항 및 TCR특성 변화를 조사하였고, 미세조직이 이들 전기적 성질에 미치는 영향을알아보기 위해 상분석과 morphology를 관찰하였다. 그 결과, TaNx을 코팅한 박막의 전기저항은 $N_{2}$Ar이 0.4 이상에서, 금속전도특성에서 이온전도특성으로 변화하였으며,Cr이 TCR효과를 안정시키는 역할은 하여 TaNx/A $I_{2}$ $O_{3}$보다 TaNx/Cr/A $i_{2}$ $O_{3}$박막의 TCR특성이 더 안정하게 나타났다. 또한 TaNx/A $I_{2}$ $O_{3}$박막과 TaNx/Cr/A $i_{2}$ $O_{3}$박막의 경우 모두 $N_{2}$/Ar이 0-0.4정도에서 TCR효과에 좋은 특성을 나타내었다. X-선회절 실험 결과 $N_{2}$/Ar비가 1일 경우에 T $a_{2}$ $N_{.8}$이 생성되었고, 분압이 증가함에 따라 비정질이 생성되었다. morphology가 $N_{2}$/Ar이 증가함에 따라 입자의 모양이 불연속아일랜드 형태로 변화하였으며, 이것은 질소분압에 따른 전기저항 변화와 일치하였다.다.

• Bulletin of the Korean Chemical Society
• /
• v.29 no.4
• /
• pp.817-821
• /
• 2008

We have investigated the influence of the crystal structure on the chemical bonding nature and photocatalytic activity of cubic and hexagonal perovskite A[$Cr_{1/2}Ta_{1/2}$]O3 (A = Sr, Ba) compounds. According to neutron diffraction and field emission-scanning electron microscopy, the crystal structure and particle size of these compounds are strongly dependent on the nature of A-site cations. Also, it was found that the face-shared octahedra in the hexagonal phase are exclusively occupied by chromium ions, suggesting the presence of metallic (Cr-Cr) bonds. X-ray absorption and diffuse UV-vis spectroscopic analyses clearly demonstrated that, in comparison with cubic Sr[$Cr_{1/2}Ta_{1/2}$]$O_3$ phase, hexagonal Ba[$Cr_{1/2}Ta_{1/2}$]$O_3$ phase shows a decrease of Cr oxidation state as well as remarkable changes in interband Cr d-d transitions, which can be interpreted as a result of metallic (Cr-Cr) interactions. According to the test of photocatalytic activity, the present semiconducting materials have a distinct activity against the photodegradation of 4-chlorophenol. Also the Srbased compound was found to show a higher photocatalytic activity than the Ba-based one, which is attributable to its smaller particle size and its stronger absorption in visible light region.

• Journal of the Korean institute of surface engineering
• /
• v.29 no.6
• /
• pp.824-828
• /
• 1996

Co-based alloy thin films ddeposited by fcing targets sputtering(FTS) were investigated for use in high-density magnetic recording media to determine how their magnetic properties are dependent on the sputtering conditions, and thus to find appropriate parameters that allow the sputtering and thin films to meet the specificiations for magnetic properties. FTS can discharge at lower working gas pressure than other sputtering methods such as dcmagnetron sputteing because the plasma is sufficiently confined by a magnetic field applied perpendicular to both of the target planes, which results in plasma-free substrates. Co-Cr-Ta films were deposited by FTS on glass and silicon substrates at substrate temperature between room temperature and $350^{\circ}C$, and at argon gas pressure between 0.1 and 10mTorr. The films were also deposited on polyimide tapes at substrate temperature of $130^{\circ}C$ and argon gas pressure of 1 mTorr. The effective advantages of Ta as an additional element were investigated, using the same films on the tapes. As a result of the experiment, it was found that better magnetic properties were obtained in the ranges of higher temperature and lower argon gas pressure with background pressure in thr range of $1.5 \times 10^{-6}$ Torr. Ta addition at 2 to 4 atomic percent almost havled the Co-Cr grain sizes, indicating that Ta addition at an appropriate atomic percent is effective for improving the microstructure and characteristics of Co-Cr films.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2002.04b
• /
• pp.73-76
• /
• 2002

박막 다이오드의 전기적 특성에 미치는 전극 구조의 영향을 관찰하였다. 박막 다이오드는 하부전극-절연층($Ta_{2}O_{5}$)-상부전극의 3층 구조로 설계 및 제작하였고, 하부 전극으로 Ta, 상부 전극으로 Cr 및 Ti를 각각 사용하였다. Cr을 상부 전극으로 사용한 결과 비대칭비가 1.8인 높은 비대칭 특성을 나타내었다. 그러나 Ti 상부 전극의 경우 반대의 경향을 나타내었다. 이들을 각각 $150^{\circ}C$에서 열처리한 결과 Cr 상부 전극 다이오드는 비대칭비가 1.4로 여전히 비대칭 경향을 나타내었으나, Ti 상부 전극의 박막 다이오드는 비대칭비가 1.1로 대칭에 가까운 우수한 특성을 나타내었다.

• Proceedings of the Materials Research Society of Korea Conference
• /
• 2003.03a
• /
• pp.219-219
• /
• 2003

HVOF(High Velocity Oxygen Fuel)법을 사용한 MCrAlY(M=Ni, Co, Fe)계 열차폐 코팅(thermal barrier coating)은 열기관 내부의 극심한 환경 부하에 대해 구조물 표면에 열적, 화학적 장벽을 형성함으로써 구조물의 내구성을 향상시킨다 이와 동시에 열차폐 효과는 구조물의 온도상승 없이 내부 가동 온도를 높일 수 있게 함으로써 열효율을 상승시키고 연료 효율을 높여 가동비용 절감을 이룰 수 있는 동시에 고 연소를 통한 오염원의 배출을 감소시킬 수 있다. 본 연구에서는 $H_2O$$_2$=5:1 분위기 하에서 HVOF법을 사용하여 Hastelloy-X 기판위에 125$\mu\textrm{m}$의 두께로 다음 5종류의 (Ni, Co, Cr)계 MCrAlY 코팅을 용사시켰다. 준비된 (Ni, Co)-Cr-Al-(Y, Ta, Re), (Ni, Co)-Cr-Al-(Y, Re), (Ni, Co)-Cr-Al-(Y, Ta), (Ni, Co)-Cr-Al-Y, (Ni,Co)-Cr-Al-Ir 코팅시편에 대한 산화성질을 조사하기 위해 대기 중 1000, 1100, 120$0^{\circ}C$에서 50, 100, 150, 200시간 등온실험(Isothermal oxidation)을 실시하였고, XRD, SEM/EDS, EPMA를 이용하여 생성된 산화막과 코팅 시편의 조직 변화를 조사하였다. 산화온도와 산화시간이 증가할수록 산화막의 박리가 많이 발생하였으며, 분석 결과 미세하게 분포된 a-Al$_2$O$_3$ 입자, NiCr$_2$O$_4$스피넬 상, 미세한 Cr$_2$O$_3$가 관찰되었고, 코팅 조성 변화에 따라 형성되는 이들 산화물의 존재비가 달라졌으며, 산화온도가 높아질수록 산화속도가 가속화되었다.

• ALGAE
• /
• v.34 no.2
• /
• pp.163-175
• /
• 2019

To compare the nutritional quality of TPG (Teleaulax / Plagioselmis / Geminigera) clade species of cryptomonads with that of RHO (Rhodomonas / Rhinomonas / Storeatula) clade species 6 Teleaulax amphioxeia (TA) and 1 Rhinomonas sp. strains were mass-cultured in newly designed 500-L photobioreactors to the end of exponential growth phase. Intraspecific variations (IVs) in terms of one standard deviation among the 6 TA strains in the compositions of the three macronutrients were 41.5 (protein), 89.8 (lipid), and 15.6% (carbohydrate) of the mean. When harvested from stationary growth phase mean compositions of essential amino acids (EAAs, 47.3%) and non-EAAs (52.7%) of the 2 TA strains, CR-MAL07 and CR-MAL08-2, were similar to those of a Chroomonas strain. The IVs between the 2 TA strains in the composition of EAAs (10.3 and 2.4) and non-EAAs (8.5 and 2.1% of the mean) were rather smaller than those of saturated fatty acids (30.3 and 26.1) and unsaturated fatty acids (UFAs, 12.0 and 12.5% of the mean) in f/2-Si and urea-based compound fertilizer (UCF) culture media, respectively. Mean compositions of eicosapentaenoic acid (EPA, 17.9%) and docosahexaenoic acid (DHA, 12.7%) of total fatty acids of the 2 TA strains were higher than those that of a Chroomonas strain. EPA and DHA compositions exhibited similar level of IVs between the 2 TA strains in f/2-Si (14.6 and 11.0) and UCF media (12.6 and 13.5% of the mean). Thus, the nutritional quality in terms of amino acids, UFAs, EPA, and DHA in a TPG clade species, T. amphioxeia was comparable to those of RHO clade species with notable IVs. Practically, biotechnological targets for TPG clade cryptomonad strains might be subspecies or clone level.

• Proceedings of the Korean Magnestics Society Conference
• /
• 2002.12a
• /
• pp.182-183
• /
• 2002

고밀도 자기기록이 가능하기 위해서는 Ku가 크고 노이즈가 작은 매체가 필요하다. CoCrPt 기록층은 보자력이 크고 열적으로 안정하나 결정립크기가 크고 결정립간 교환 상호작용이 커서 노이즈가 크다.[1][2] 한편 CoCrPt 에 Ta, B 등 제4원소를 첨가하면 결정립이 크기가 감소하고 노이즈는 감소하나 Ku가 감소하여 열적으로 불안정해진다.[3] (중략)

• Proceedings of the Korean Vacuum Society Conference
• /
• 2011.08a
• /
• pp.283-283
• /
• 2011

본 연구에서는 XRR 측정에 있어 박막두께 표준보급을 하기 위하여 표준물질을 이온빔 스퍼터링 증착법을 이용하여 제작하였다. 시편제작 시 공기 중 노출에 의해 산화가 되지 않는 산화물 박막과 산화물 기판을 선택하였다. 기판 및 타겟물질 등을 변화시키면서 제작된 시편의 특성을 살펴보았다. 사용된 타겟 물질로는 HfO2, Ta2O5, Cr2O3를 사용하였으며, 기판으로는 glass, sapphire, quartz, SiO2(1 ${\mu}m$-thermal oxidation)를 사용하였다. 산화물 타겟을 사용하여 증착 시 타겟 주위로 생기는 전하들의 charge build-up 되는 현상은 neutralizer를 사용함으로써 문제를 해결하였다. 제작된 시편은 XRR을 이용하여 측정하였고, XRR simulation과 curve fitting을 통하여 박막의 두께, 표면 및 계면의 거칠기, 밀도를 평가하였다. 기판으로 사용된 glass, quartz는 타겟 물질과 관계없이 표면 거칠기가 좋지 않아 XRR 반사율이 급격히 떨어지면서 측정되는 각도의 영역이 작아졌다. sapphire로 제작한 시편에서는 측정된 데이터와 simulation의 curve fitting이 양호하지 않았다. 이 문제는 현재 조사중에 있다. SiO2 기판으로 제작한 시편의 경우 타겟 물질과 관계없이 XRR curve fitting 결과가 양호 하였다. 그 중 Cr2O3의 결과가 다른 타겟 물질에 비해 x 2 값이 작았고 반사율 곡선에서의 거칠기와 진폭도 양호하였다. 위 연구결과로써 SiO2 기판을 사용한 Cr2O3 타겟 물질로 제작된 시편이 XRR 박막 두께 표준물질로써 적합한 것으로 판단된다.