• Title/Summary/Keyword: TLM

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Analysis of Transmission Mode and Bandwidth for LF and MF Antenna (중·장파 대역 안테나의 대역폭 및 전송방식 해석)

  • Kim, Young-Wan
    • The Journal of Korea Institute of Information, Electronics, and Communication Technology
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    • v.11 no.4
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    • pp.401-407
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    • 2018
  • The transmission bandwidth of shorted-monopole antenna in the frequency range of LF and MF was analyzed and the transmission mode considering the permissible data rate dependant on the transmission bandwidth was analyzed in this paper. Based on the required ERP, the output power of transmitter was deduced by considering the antenna efficiency. The analyses are for DGPS and time information transmission system in the frequency range of 283.5kHz and 65kHz respectively. The transmission antenna was modeled as TLM antenna that designed in the limited antenna site. The antenna equivalent circuit and antenna bandwidth were deduced based on the simulation analysis of antenna characteristics. The analyzed antenna bandwidth was compared with the simulated antenna bandwidth. Also the transmission mode for transmitter of LF and MF was proposed by considering the antenna bandwidth.

Fabrication and Electrochemical Analysis of Back-gate FET Based on Graphene for O2 Gas Sensor

  • Kim, Jin-Hwan;Choe, Hyeon-Gwang;Kim, Jong-Yeol;Im, Gi-Hong;Jeon, Min-Hyeon
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.271-271
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    • 2014
  • 본 연구에서는 최근 다양한 전자 소자로써의 연구가 진행되고 있는 그라핀을 SiO2/Si 기판 위에 전자빔 식각(Electron-Beam Lithography)을 이용하여 후면 게이트 전극 구조의 그라핀 채널을 갖는 삼단자 소자를 형성하고 가스 유입이 가능한 진공 Probe Measurement System을 이용하여 금속 전극과 그라핀 간의 접촉저항 (Rc) 및 길이가 다른 채널저항(Rch)를 구하고, 채널 길이, 가스 유량, 온도, 게이트 전압에 따른 I-V 변화를 측정함으로써, 후면 게이트 전극 구조의 그라핀 채널을 갖는 삼단자 소자의 가스 센서로서의 가능성을 연구하였다. 후면 게이트 전극 구조의 그라핀 채널을 갖는 삼단자 소자는 전자빔 식각(Electron-Beam Lithography)에 의해 패턴을 제작하고 Evaporator를 이용하여 전극을 증착 하였다. 소자의 소스 (Source)와 드레인 (Drain)은 TLM (Transfer Length Method)패턴을 이용하여 인접한 두 개의 전극간 범위를 변화시키는 형태로 제작함으로써 소스-드레인간 채널 길이가 다르게 하였다. 이 때 전극의 크기는 가로, 세로 각각 $20{\mu}m$, $40{\mu}m$이며 전극간 간격은 $20/30/40/50/60{\mu}m$로 서로 다르게 배열 하였다. 제작된 그라핀 소자는 진공 Probe Measurement System 내에서 게이트 전압(VG)를 변화시킴으로써 VG 변화에 따른 소자의 특성을 평가하였는데, mTorr 상태의 챔버 내로 O2 가스를 주입하여 그라핀의 Dangling bond 및 Defect site에 결합 된 가스로 인한 전기적 특성의 변화를 측정하고, 이 때 가스의 유량을 50 sccm에서 500 sccm 까지 변화시킴으로써 전기적 특성 변화를 측정하여 센서 소자의 민감도를 평가하였다. 또한, 서로 다르게 배열한 소스-드레인 간의 채널 길이로 인하여 채널과의 접촉 면적에 따른 센서 소자의 민감도 또한 평가할 수 있었다. 그리고 챔버 내 온도를 77 K에서 400 K까지 변화시킴으로써 온도에 따른 소자의 작동 범위를 확인하고 소자의 온도의존성을 평가하였다.

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Model Validation of a Fast Ethernet Controller for Performance Evaluation of Network Processors (네트워크 프로세서의 성능 예측을 위한 고속 이더넷 제어기의 상위 레벨 모델 검증)

  • Lee Myeong-jin
    • Journal of KIISE:Computing Practices and Letters
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    • v.11 no.1
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    • pp.92-99
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    • 2005
  • In this paper, we present a high-level design methodology applied on a network system-on-a-chip(SOC) using SystemC. The main target of our approach is to get optimum performance parameters for high network address translation(NAT) throughput. The Fast Ethernet media access controller(MAC) and its direct memory access(DMA) controller are modeled with SystemC in transaction level. They are calibrated through the cycle-based measurement of the operation of the real Verilog register transfer language(RTL). The NAT throughput of the model is within $\pm$10% error compared to the output of the real evaluation board. Simulation speed of the model is more than 100 times laster than the RTL. The validated models are used for intensive architecture exploration to find the performance bottleneck in the NAT router.

Influence of Oxygen Partial Pressure on ZnO Thin Films for Thin Film Transistors

  • Kim, Jae-Won;Kim, Ji-Hong;Roh, Ji-Hyoung;Lee, Kyung-Joo;Moon, Sung-Joon;Do, Kang-Min;Park, Jae-Ho;Jo, Seul-Ki;Shin, Ju-Hong;Yer, In-Hyung;Koo, Sang-Mo;Moon, Byung-Moo
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.106-106
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    • 2011
  • Recently, zinc oxide (ZnO) thin films have attracted great attention as a promising candidate for various electronic applications such as transparent electrodes, thin film transistors, and optoelectronic devices. ZnO thin films have a wide band gap energy of 3.37 eV and transparency in visible region. Moreover, ZnO thin films can be deposited in a poly-crystalline form even at room temperature, extending the choice of substrates including even plastics. Therefore, it is possible to realize thin film transistors by using ZnO thin films as the active channel layer. In this work, we investigated influence of oxygen partial pressure on ZnO thin films and fabricated ZnO-based thin film transistors. ZnO thin films were deposited on glass substrates by using a pulsed laser deposition technique in various oxygen partial pressures from 20 to 100 mTorr at room temperature. X-ray diffraction (XRD), transmission line method (TLM), and UV-Vis spectroscopy were employed to study the structural, electrical, and optical properties of the ZnO thin films. As a result, 80 mTorr was optimal condition for active layer of thin film transistors, since the active layer of thin film transistors needs high resistivity to achieve low off-current and high on-off ratio. The fabricated ZnO-based thin film transistors operated in the enhancement mode with high field effect mobility and low threshold voltage.

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Development and Test of Line-Telemetry DPS for KSLV-I Upper Stage (나로호 상단부 Line-Telemetry 데이터처리시스템 개발 및 시험)

  • Kim, Kwang-Soo;Lee, Soo-Jin;Chung, Eui-Seung
    • Aerospace Engineering and Technology
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    • v.10 no.1
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    • pp.107-115
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    • 2011
  • The line-telemetry data processing system is necessary for monitoring the status of each onboard systems of KSLV-I upper stage during the ground tests and launch preparation. The mission of line-telemetry system is to provide reference telemetry data and to monitor the status of upper stage. The line-telemetry data processing system consists of a PCM acquisition/processing server, a system management server, and 9 monitoring consoles. In this paper, we will describe the overview of onboard remote measurement system, the design of the line-telemetry data processing system, anomaly setup information for indicating alarm signal in case of abnormal occurrence, and the result of the ground test and flight test.

Microstrip Slot Array Antenna Design by Using Tansmission Line Model (전송선로 모델을 이용한 마이크로스트립 슬롯 배열 안테나 설계)

  • 한석진;박익모;신철재
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.11 no.4
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    • pp.610-618
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    • 2000
  • A T-shaped microstripline -fed printed slot antenna is anlayzed by using the transmission line model(TLM) in this paper. Microstrip-slotline junction is modeled by employing a transformer and the transformer turn ratio is derived empirically. The method is extended to the case of $1\times2,l\times4$array antennas. Return loss results obtained by using the transmission line model. The maximum measured results and demonstrated the usefulness of the transmission line model. The maximum bandwidths of a single antenna, $1\times2,l\times4$ array antennas are 28.5%, 47.8%, and 50.9%, respectively, for the VSWR$\leq2$. The gain of $1\times4$ array antenna is 7.97dBi and the beamwidth is about $27^{\circ}$.

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Metal-Semiconductor Contact Behavior of Solution-Processed ZnSnO Thin Film Transistors (용액법으로 제작된 ZnSnO 박막트랜지스터의 전극 물질에 따른 계면 접촉특성 연구)

  • Jeong, Young-Min;Song, Keun-Kyu;Woo, Kyoo-Hee;Jun, Tae-Hwan;Jung, Yang-Ho;Moon, Joo-Ho
    • Korean Journal of Materials Research
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    • v.20 no.8
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    • pp.401-407
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    • 2010
  • We studied the influence of different types of metal electrodes on the performance of solution-processed zinc tin oxide (ZTO) thin-film transistors. The ZTO thin-film was obtained by spin-coating the sol-gel solution made from zinc acetate and tin acetate dissolved in 2-methoxyethanol. Various metals, Al, Au, Ag and Cu, were used to make contacts with the solution-deposited ZTO layers by selective deposition through a metal shadow mask. Contact resistance between the metal electrode and the semiconductor was obtained by a transmission line method (TLM). The device based on an Al electrode exhibited superior performance as compared to those based on other metals. Kelvin probe force microscopy (KPFM) allowed us to measure the work function of the oxide semiconductor to understand the variation of the device performance as a function of the types metal electrode. The solution-processed ZTO contained nanopores that resulted from the burnout of the organic species during the annealing. This different surface structure associated with the solution-processed ZTO gave a rise to a different work function value as compared to the vacuum-deposited counterpart. More oxygen could be adsorbed on the nanoporous solution-processed ZTO with large accessible surface areas, which increased its work function. This observation explained why the solution-processed ZTO makes an ohmic contact with the Al electrode.

Fabrication and Characteristic of C-doped Base AlGaAs/GaAs HBT using Carbontetrachloride $CCI_4$ ($CCI_4$ 를 사용하여 베이스를 탄소도핑한 AlGaAs/GaAs HBT의 제작 및 특성)

  • 손정환;김동욱;홍성철;권영세
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.30A no.12
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    • pp.51-59
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    • 1993
  • A 4${\times}10^{19}cm^{3}$ carbon-doped base AlGaAs/GaAs HBY was grown using carbontetracholoride(CCl$_4$) by atmospheric pressure MOCVD. Abruptness of emitter-base junction was characterized by SIMS(secondary ion mass spectorscopy) and the doping concentration of base layer was confirmed by DXRD(double crystal X-ray diffractometry). Mesa-type HBTs were fabricated using wet etching and lift-off technique. The base sheet resistance of R$_{sheet}$=550${\Omega}$/square was measured using TLM(transmission line model) method. The fabricated transistor achieved a collector-base junction breakdown voltage of BV$_{CBO}$=25V and a critical collector current density of J$_{O}$=40kA/cm$^2$ at V$_{CE}$=2V. The 50$\times$100$\mu$$^2$ emitter transistor showed a common emitter DC current gain of h$_{FE}$=30 at a collector current density of JS1CT=5kA/cm$^2$ and a base current ideality factor of ηS1EBT=1.4. The high frequency characterization of 5$\times$50$\mu$m$^2$ emitter transistor was carried out by on-wafer S-parameter measurement at 0.1~18.1GHz. Current gain cutoff frequency of f$_{T}$=27GHz and maximum oscillation frequency of f$_{max}$=16GHz were obtained from the measured Sparameter and device parameters of small-signal lumped-element equivalent network were extracted using Libra software. The fabricated HBT was proved to be useful to high speed and power spplications.

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Study on Ohmic resistance of Zn-doping InP using RTA method (RTA 방법에 의해 Zn 도핑된 InP의 오믹저항 특성연구)

  • Kim, H.J.;Kim, I.S.;Kim, T.U.;Kim, S.T.;Kim, S.H;Ki, H.C.;Lee, K.M.;Yang, M.H.;Ko, H.J.;Kim, H.J.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.06a
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    • pp.237-238
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    • 2008
  • Electrical properties of Pd/Zn/Pd/Au contacts to p-InP were investigated as function of the V/III ratio of p-InP. P-type InP was made by the Zn diffusion into InP and activation process with rapid thermal annealing (RTA) measurement. After activation, the hole concentration was two orders of magnitude higher than that of the sample having only diffusion process. According to transmission line method (TLM) results, the specific contact resistance of p-InP was lower as used InP having the lower V/III ratio. The experimental results represent that the diffusion of Zn in undoped InP deeply related to the equilibrium between interstitials and substitutional Zn is established via indium interstitials.

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Photoconductivity in Mg-doped p-type GaN by MBE

  • ;;;;;Yuldashev
    • Proceedings of the Korean Vacuum Society Conference
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    • 1999.07a
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    • pp.120-120
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    • 1999
  • III-nitride계 물질들은 blue와 UV 영역의 LED, LD와 같은 광소자뿐만 아니라 HBT, FET와 같은 전자소자로도 널리 응용되고 있다. 이와 같은 물질을 이용한 소자를 제작할 수 있는 낮은 저항의 ohmic contact은 필수적이다. Al이나 Ti와 같은 물질을 기초로 한 n-GaN의 경우는 이미 많은 연구결과가 발표되어 전기적 광학적 소자를 동작하는데 충분히 낮은 ohmic contact저항( )을 었다. 그러나 p-GaN의 ohmic contact은 아직까지 많은 문제점을 내포하고 있다. 그 중의 하나는 높은 doping 농도( )의 p-GaN 박막을 성장하기가 어렵다는 것이며, 또 하나는 낮은 접촉 비저항을 얻기 위해선 7.5eV이상의 큰 재가 function을 지닌 금속을 선택해야 한다. 그러나 5.5eV 이상의 재가 function을 갖는 금속은 존재하지 않는다. 위와 같은 문제점들은 p-GaN의 접촉 비저항이 이상의 높은 값을 갖게 만들고 있으며, 이에 대한 해경방안으로는 고온의 열처리를 통하여 p-GaN와 금속 사이에서 화학적 반응을 일으킴으로써 표면 근처에서 캐리어농도를 증가시키고, 캐리어 수송의 형태가 tunneling 형태로 일어날 수 있도록 하는 tunneling current mechanism을 이용하는 것이다. 이로 인해 결국 낮은 접촉 비저항을 얻을 수 있게되며, 일반적으로 p-GaN에서는 Nidl 좋은 물질로 알려져 있다. 그러나 Ni은 50$0^{\circ}C$이상의 열처리에서 쉽게 산화되는 특성 때문에 높은 캐리어를 얻는데 어려운 문제점이 있다. 이에 본 연구에서는 MBE로 성장된 p-GaN박막을 Mg의 activation을 더욱 증가시키기 위해 N2 분위기에서 15분간 90$0^{\circ}C$에서 annealing을 하였으며, ohmic 접촉을 위한 금속으로 높은 재가 function과 좋은 adhesion 그리고 낮은 자체저항을 가지고 있는 Ni/Au를 ohmic metal로 하여 contact한 후에 90$0^{\circ}C$에서 10초간 rapid thermal annealing (RTA)처리를 했다. 성장된 박막의 광학적 성질은 PL로써 측정하였으며, photoconductivity 실험을 통해 impurity의 life time을 분석하였고, persistent photoconductivity를 통해 dark current를 측정하였다. 또한 contact resistance를 계산하기 위해 circular-TLM method을 이용하여 I-V 특성을 조사하였다.

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