• Title/Summary/Keyword: TFT-LCD panel

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Simulations of Pixel Characteristics for Large Size and High Qualify TFT-LCD using a new sophisticated Capacitance Formulas (새로운 정전용량 계산식물 이용한 대면적 .고화질 TFT-LCD의 화소 특성 시뮬레이션)

  • 윤영준;정순신;김태형;박재우;최종선
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1999.05a
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    • pp.613-616
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    • 1999
  • An active-matrix LCD using thin film transistors (TFTs)has been widely recognized as having potential for high-quality color flat-panel displays. Pixel-Design Array Simulation Tool (PDAST) was used to profoundly understand the gate signal distortion and pixel charging capability, which are the most critical limiting factors for high-quality TFT-LCDs. Since PDAST can simulate the gate data and pixel voltages of a certain pixel on TFT array at any time and at any location on an array, the effect of the new set of capacitance models on the pixel operations can be effectively analyzed, The set of models which is adopted from VLSI interconnections calculate more precise capacitance. The information obtained from this study could be utilized to design the larger area and finer image quality panel.

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Advanced Pixel Structure for Higher Aperture Ratio in TFT-LCD

  • Kim, Jong-Hoon;Noh, Sang-Yong;Kang, Shin-Tack;Lee, Jong-Hwan;Choi, Kwang-Soo
    • 한국정보디스플레이학회:학술대회논문집
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    • 2008.10a
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    • pp.17-19
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    • 2008
  • An advanced TFT-LCD structure was proposed to increase aperture ratio (AR). In this structure, metal layers formed below the data lines are used as light-blocking layers, achieving higher AR ratio than that of a conventional structure. Since average misalignment between the metal light-blocking layers and pixel electrodes is smaller than that of black matrixes on color filter glass, substantially less light-blocking areas are needed to achieve misalignment margin. The AR of the LCD panel fabricated by using proposed structure was enhanced by 18.7 % over that of the conventionally structured panel.

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Design of Integrated a-Si:H Gate Driver Circuit with Low Noise for Mobile TFT-LCD

  • Lee, Yong-Hui;Park, Yong-Ju;Kwag, Jin-Oh;Kim, Hyung-Guel;Yi, Jun-Sin
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08a
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    • pp.822-824
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    • 2007
  • This paper investigated a gate driver circuit with amorphous silicon for mobile TFT-LCD. In the conventional circuit, the fluctuation of the off-state voltage causes the fluctuation of gate line voltages in the panel and then image quality becomes worse. Newly designed gate driver circuit with dynamic switching inverter and carry out signal reduce the fluctuation of the off-state voltage because dynamic switching inverter is holding the off-state voltage and the delay of carry signal is reduced. The simulation results show that the proposed a-Si:H gate driver has low noise and high stability compared with the conventional one.

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A reflective color TFT-LCD with high aperture ratio

  • Choi, Su-Seok;Kang, Won-Seok;Jin, Hyun-Suk;Jeong, Woo-Nam
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.215-218
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    • 2003
  • We have developed a reflective 3.5" QVGA color TFT-LCD with high reflection within viewing angle. For this, We have introduced new pixel design and asymmetric reflector. Based on these technical concepts, we get a high aperture ratio of 93.5% and much higher reflection up to 64% with a 3.5" prototype panel.

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All Layer Printed TFT-LCD Device by Large Area UV-Imprinting Lithography

  • Chang, Jae-Hyuk;Lee, Seung-Jun;Park, Dae-Jin;Bae, Joo-Han;Lee, Sung-Hee;Kim, Jang-Kyum;Kim, Kyu-Young;Bae, Jung-Mok;Kim, Bo-Sung;Lim, Soon-Kwon
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.1115-1117
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    • 2009
  • Resist patterning of all layers in TFT and BM layer in CF were carried out using UV-imprinting Lithography to make a 12.1 inch TFT-LCD panel at the resolution of 1280 ${\times}$ 800 lines (125 ppi). Technical challenges and solutions for resist patterning by UV-imprinting are shown in this article.

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Automatic TFT-LCD Mura Inspection Based on Studentized Residuals in Regression Analysis

  • Chuang, Yu-Chiang;Fan, Shu-Kai S.
    • Industrial Engineering and Management Systems
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    • v.8 no.3
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    • pp.148-154
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    • 2009
  • In recent days, large-sized flat-panel display (FPD) has been increasingly applied to computer monitors and TVs. Mura defects, appearing as low contrast or non-uniform brightness region, sometimes occur in manufacturing of the Thin-Film Transistor Liquid-Crystal Displays (TFT-LCD). Implementation of automatic Mura inspection methods is necessary for TFT-LCD production. Various existing Mura detection methods based on regression diagnostics, surface fitting and data transformation have been presented with good performance. This paper proposes an efficient Mura detection method that is based on a regression diagnostics using studentized residuals for automatic Mura inspection of FPD. The input image is estimated by a linear model and then the studentized residuals are calculated for filtering Mura regions. After image dilation, the proposed threshold is determined for detecting the non-uniform brightness region in TFT-LCD by means of monitoring the every pixel in the image. The experimental results obtained from several test images are used to illustrate the effectiveness and efficiency of the proposed method for Mura detection.

Microstructure and Strength of the Microjoined Electrode for the Lamp of the LCD Backlight Unit (TFT-LCD 백라이트 유닛(BLU) 램프용 전극 미세 접합부의 강도 및 미세조직)

  • Kim, Gwang-Soo;Kim, Sang-Duck
    • Korean Journal of Materials Research
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    • v.19 no.1
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    • pp.7-12
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    • 2009
  • TFT-LCD is the most popular type of flat display panel in the information technology field. The back light unit is a main part of the structure of a TFT-LCD panel. Occasionally, studies have shown that failures of the CCFL of the BLU occur due to the poor weld characteristics of these materials. The aim of this study was to prepare some technical data and to characterize a microjoined electrode for the CCFL. Microstructure examinations, microhardness measurements, resistance measurements and microtensile tests of the microjoined electrode were carried out. The result indicates that a large amount of grain coarsening exists in the heat-affected zone (HAZ) of the weld between the cup and the pin. This grain coarsening of the HAZ between the cup and pin is caused by the welding cycle, which may have an influence on the lowest microhardness values. Fracturing of the microjoined electrode also occurred at the HAZ close to the cup between the weld holding the cup and the pin. Additionally, no specific changes of the electrical resistance among the cup, pin, and lead wire themselves or in the microjoined electrode were observed.

The development of high brightness IPS mode for LCD Monitors

  • Kang, In-Byeong;Youn, Won-Gyun;Cho, So-Haeng;Song, In-Duk;Ahn, In-Ho;Chung, In-Jae
    • 한국정보디스플레이학회:학술대회논문집
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    • 2000.01a
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    • pp.11-12
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    • 2000
  • An 18.1" Thin Film Transistor Liquid Crystal Display (TFT LCD) monitor adopting high brightness In Plane Switching (IPS) technology was realized. While conventional IPS structure used a Chromium (Cr) and Molybdenum (Mo) for a drain electrode, Indium Tin Oxide (ITO) was proposed and verified in this paper. Black sticky micropeal spacers were introduced for the reduction of light scattering phenomena, which was observed at dark room with the conventional micropeal spacers. With the proposed method, more than 10 % aperture ratio was increased and the excellent image quality was obtained.

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a-Si TFT Integrated Gate Driver Using Multi-thread Driving

  • Jang, Yong-Ho;Yoon, Soo-Young;Park, Kwon-Shik;Kim, Hae-Yeol;Kim, Binn;Chun, Min-Doo;Cho, Hyung-Nyuck;Choi, Seung-Chan;Moon, Tae-Woong;Ryoo, Chang-Il;Cho, Nam-Wook;Jo, Sung-Hak;Kim, Chang-Dong;Chung, In-Jae
    • Journal of Information Display
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    • v.7 no.3
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    • pp.5-8
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    • 2006
  • A novel a-Si TFT integrated gate driver circuit using multi-thread driving has been developed. The circuit consists of two independent shift registers alternating between the two modes, "wake" and "sleep". The degradation of the circuit is retarded because the bias stress is removed during the sleep mode. It has been successfully integrated in 14.1-in. XGA LCD Panel, showing enhanced stability.