• Corrosion Science and Technology
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• v.5 no.6
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• pp.213-217
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• 2006

Titania coatings were prepared on commercially pure Ti by plasma electrolytic oxidation (PEO) method with various electrolytes and process condition. Coatings were formed under galvanostatic condition with several current density values, and the change of applied voltage with process time was recorded. The microstructure of the titania coatings was observed using XRD, SEM, TEM, and the time-voltage diagrams were analyzed in terms of microstructure evolution.

• Proceedings of the Korean Ceranic Society Conference
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• 2002.10a
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• pp.179.2-179
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• 2002

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2009.05a
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• pp.130-131
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• 2009

AIP(arc ion plating)방법과 마그네슘 스퍼터링(DC reactive magnetron sputtering) 방법을 결합시킨 하이브리드 코팅 시스템으로 Cr-Si-N 코팅막을 합성하였다. 고분해능 TEM 및 SEM 분석들로부터 negative bias voltage에 따른 미세구조의 영향을 나타내었다. negative bias voltage의 증가에 따라 columnar microstructure가 amorphous microstructure로 변화하였다. bias voltage effect에 의해 Cr-Si-N 코팅막내 입자의 크기가 미세해지고 나노 복합체를 잘 형성하였다.

• Journal of Powder Materials
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• v.5 no.3
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• pp.192-198
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• 1998

Microstructure and mechanical properties were examined on rapidly solidified Al-8wt%Fe alloy. High temperature strength test was also undertaken, and it is shown that the refinement in microstructure resulting from extremely rapid cooling rates gives rise to improved high temperature strength, but the elongation to fracture of this material decreases with increasing temperature, particularly in the temperature range up to 30$0^{\circ}C$. Specimens heat-treated for 100 hrs were analyzed with TEM micrographs to understand the thermal stability of this material.

• Applied Microscopy
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• v.46 no.2
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• pp.110-115
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• 2016

Transmission electron microscopy (TEM) is a powerful tool for analyzing a broad range of materials and provides localized information about the microstructure. However, the analysis results are strongly influenced by the quality of the thin foil specimen. Sample preparation for TEM analysis requires considerable skill, especially when the area of interest is small or the material of interest is difficult to thin because of its high hardness and its mechanical instability when thinned. This article selectively reviews recent advances in TEM sample preparation techniques using a tripod polisher. In particular, it introduces two typical types (fl at type and wedge type) of TEM sample preparation and the benefits and drawbacks of each method; finally, a method of making better samples for TEM analysis is suggested.

• Journal of the Mineralogical Society of Korea
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• v.18 no.4 s.46
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• pp.289-299
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• 2005

Annealing experiments on albite powders, thin sections, and TEM specimens have been performed utilizing an optical microscope heating stage. Sample orientations were determined by optical microscope and XRD, and then confirmed by TEM diffraction patterns. Partial melting of samples occurred at $1030^{\circ}C$-l2 hr for powder, but at $1060^{\circ}C$-12 hr for TEM specimen. It is difficult to get TEM images of albite microstructures above this temperature due to thickening and the amorphous phase of the melted part. Correlative studies between optical microscopy and TEM indicated that the $1050^{\circ}C$-12 hr annealing in ambient condition was most adequate to observe tweed microstructures in albite through TEM. In situ TEM heating experiments for direct observation of tweed microstructures in albite may require annealing at slightly higher temperatures than $1050^{\circ}C$ considering the high vacuum condition inside TEM.

• Korean Journal of Materials Research
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• v.28 no.10
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• pp.595-600
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• 2018

This study investigates the microstructural properties of CoCrFeMnNi high entropy alloy (HEA) oxynitride thin film. The HEA oxynitride thin film is grown by the magnetron sputtering method using nitrogen and oxygen gases. The grown CoCrFeMnNi HEA film shows a microstructure with nanocrystalline regions of 5~20 nm in the amorphous region, which is confirmed by high-resolution transmission electron microscopy (HR-TEM). From the TEM electron diffraction pattern analysis crystal structure is determined to be a face centered cubic (FCC) structure with a lattice constant of 0.491 nm, which is larger than that of CoCrFeMnNi HEA. The HEA oxynitride film shows a single phase in which constituting elements are distributed homogeneously as confirmed by element mapping using a Cs-corrected scanning TEM (STEM). Mechanical properties of the CoCrFeMnNi HEA oxynitride thin film are addressed by a nano indentation method, and a hardness of 8.13 GPa and a Young's modulus of 157.3 GPa are obtained. The observed high hardness value is thought to be the result of hardening due to the nanocrystalline microstructure.

• Journal of the Korean Ceramic Society
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• v.41 no.2
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• pp.143-150
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• 2004

Biaxial flexure strength (ball-on-3-ball) and fracture toughness (indentation microfracture) of heat-pressable glass-ceramics for dental use were investigated in this study. Crystal phase and microstructure of glass-ceramics were analyzed by XRD. SEM, and TEM. Crack propagation in specimens was not effectively arrested by dispersed crystalline particles. However, higher degree of crystallization probably contributes to strengthening of glass-ceramics. Better clinical reliability can be expected from lithium disilicate glass-ceramic because of its significantly higher biaxial flexure strength and fracture toughness.

• Ceramist
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• v.2 no.1
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• pp.41-48
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• 1999

• Bulletin of the Korean Chemical Society
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• v.18 no.8
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• pp.886-889
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• 1997

The crystal structure and optical properties of copper nanoparticles, prepared in fused silica by ion-implantation and subsequent heat-treatment, were characterized by X-ray, TEM, linear absorption, and degenerate four-wave mixing (DFWM) technique. The X-ray data show fcc lattice structure of the nanocrystals and their size was measured as 8-20 nanometer by high resolution TEM. Using DFWM, the third-order nonlinear optical coefficient of the Cu-SiO2 thin films was measured as 0.4-1.1×10-8 esu in the surface plasmon resonance absorption region (540-570 nm).