• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.21 no.8
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• pp.766-769
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• 2008

Zinc oxide (ZnO) nanowires were prepared on Si substrates by a thermal evaporation method at different temperatures and $O_2$ pressure. Microstructural analysis of the obtained ZnO nanowires was performed by using transmission electron microscopy(TEM) and scanning electron microscopy(SEM). Phase analysis was done using X-ray diffraction(XRD). As the deposition temperature and oxygen pressure were increased, the diameter and length of ZnO nanowires had a tendency to increase. Based on TEM and XRD analyses, the nanowires are single crystalline in nature and consist of a single phase. According to the measurements, the ZnO nanowires grown at 1100$^{\circ}C$, Ar 50 sccm, $O_2$ 10 sccm have good properties.

• ETRI Journal
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• v.34 no.4
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• pp.621-624
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• 2012

A new miniaturized 4-port waveguide generating a transverse electromagnetic wave is proposed. The waveguide presents enhanced performance of higher field uniformity in extended test volume up to an increased test frequency limit compared to that of the conventional 2-port waveguide. The advantageous features of the proposed waveguide have been obtained through a new design scheme based on effective miniaturization maintaining good impedance matching. Consequently, we can provide a more accurate electromagnetic compatibility test method, covering larger devices operating in higher frequencies, which is a marked improvement upon the conventional approaches.

• Korean Journal of Poultry Science
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• v.15 no.2
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• pp.67-71
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• 1988

In order to induce the diploid gamete(ovum) under suppression of meiosis in oogenesis for production of polyploid chicken. this experiment checked meiosis time. through regular ovulation and response of inhibitor (Tri-ethylen Melamine) to meiosis. The results obtained was follows; ＊Meiosis of oogenesis was 2-4 hours before ovulation. ＊Response of inhibitor to meiosis was effective at 0.3mg triethylen melamine per kg body weight. ＊Fertility was highly decreased by influence from inhibitor. ＊66% of fertilized eggs was triploid(3n) through fertilization induced diploid ovum (2n) with normal sperm(n).

• Journal of the Korean Ceramic Society
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• v.48 no.2
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• pp.147-151
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• 2011

In this study, we prepared graphene by using the modified Hummers-Offeman method and then introduced the metals (Pt, Pd and Fe) for dispersion on the surface of the graphene for synthesis of metal-graphene composites. The characterization of the prepared graphene and metal-graphene composites was performed by X-ray diffraction (XRD), scanning electron microscopy (SEM) with energy dispersive X-ray (EDX) analysis and transmission electron microscopy (TEM). According to the results, it can be observed that the prepared graphene consists of thin stacked flakes of shapes having a well-defined multilayered structure at the edge. And the metal particles are dispersed uniformly on the surface of the graphene with an average particle size of 20 nm.

• Journal of the Korean Ceramic Society
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• v.47 no.4
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• pp.269-275
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• 2010

In this study, we successfully prepared CNT/$TiO_2$, Pt/CNT and Pt/CNT/$TiO_2$ composites and investigated their photocatalytic activity in MB solution by irradiation under UV light. Fourier transform infrared (FT-IR) spectroscopy was used to characterize the functional group on the surface of MWCNTs, which oxidized by MCPBA. Brunauer-Emmett-Teller (BET) surface area, transmission electron microscopy (TEM), X-ray diffraction (XRD) and energy dispersive X-ray (EDX) were used to analyze the prepared composites. The results of the decomposition of the MB solution indicated that the Pt/CNT/$TiO_2$ composite had the best photocatalytic activity among the three kinds of composites.

• Journal of the Korean Institute of Telematics and Electronics
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• v.25 no.3
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• pp.294-301
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• 1988

A study on the lattice damages and impurity depth profiles have been performed with BF2 ion implanted silicon materials. Electrical measurement, SIMS and TEM analysis techniques were used in order to identify the reverse annealing phenomena, impurity depth profiles and lattice damages. A typical reverse annealing phenomena were shown at the dose of 1x10**15/cm\ulcorner and non-reverse annealing at the dose of 5x10**15/cm\ulcorner This was explained with the formation of the amorphous region at BF2+ ion implantation with high dose. That is, the amorphous reigons were recrystallized centrated at certain regions were measured by SIMS technique. The dislocation loops-like crystalline defects were observed with TEM cross sections, which were formed at the lattice damaged region during annealing process.

• Journal of Surface Science and Engineering
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• v.28 no.6
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• pp.376-385
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• 1995

Copper-chromium multilayers with a nominal bilayer thickness of about 400 $\AA$ (200 $\AA$ each) were prepared by dc magnetron sputtering and the evolution of microstructure during heat treatment was investigated by using x-ray diffractometry(XRD), Auger electron spectroscopy(AES) and transmission electron microscopy(TEM). It was observed that an amorphous phase with a thickness of about 40 $\AA$ was formed at the interfaces of the as-deposited Cu/Cr multilayered film using cross-sectional TEM. At elevated temperatures, the Cu(111) reflection showed increasing intensity and decreasing line-width as a result of copper grain growth. The intermixed amorphous phase disappeared after annealing at $250^{\circ}C$ for 1 h and the multilayer structure was stable up to $400^{\circ}C$ for 1 h annealing. At $600^{\circ}C$ annealing, it was observed that the multilayer structure was completely destroyed and copper and chromium phases were fully intermixed.

• Journal of the Korean Society of Combustion
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• v.5 no.1
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• pp.67-79
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• 2000

An Experimental study was conducted on spray combustion using dual swirlers at different outlet angle; co-swirl and counter-swirl. To understand the characteristics of turbulent spray combustion of dual swril flow(DSF), the axial helical annular vaned swirlers with various swirl ratios and combination of angle and direction were designed. and temperature measurements of a rapidly thermocouple insertion and measurements of soot volume fraction and microstructure using thermophoretic sampling particle diagnostic(TSPD) as TEM were carried out. The NOx, $CO_2,\;O_2$, etc. was analyzed using emission gas analyzer. The results show that flame stability were maintained under very lean condition. for both co-swirl and counter-swirl case. And though Counter-swirl case kept the higher temperature region compared to co-swirl case, Counter-swirl combustion represented less NOx emission and soot formation than co-swirl case.

• Korean Journal Plant Pathology
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• v.14 no.6
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• pp.714-719
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• 1998

Obligate bacterial parasite attacking Heterodera glycines was firstly found from Chungju soybean field in Korea. Diameters of sporangium and central body were 5.6 ${\mu}{\textrm}{m}$ and 1.9 ${\mu}{\textrm}{m}$ under light microscopy (LM), and 3.9 ${\mu}{\textrm}{m}$ and 1.8 ${\mu}{\textrm}{m}$ under transmission electron microscopy (TEM). Endospore showed cup-shaped with smooth-type exosporium without peg-like thickening in polar area under SEM and TEM. Bacteria completed its life cycle in female of soybean cyst nematode after adhering on cuticle of second-stage juvenile. From these results, the Pasteuria found from Chungju was identified with P. nishizawae.

• Journal of the Semiconductor & Display Technology
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• v.3 no.2
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• pp.5-9
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• 2004

Microcircuit fabrication requires precise control of impurities in tiny regions of the silicon. These regions must be interconnected to create components and VLSI circuits. The patterns to define such regions are created by lithographic processes. In order to image features smaller than 70 nm, it is necessary to employ non-optical technology (or next generation lithography: NGL). One such NGL is extreme ultra-violet lithography (EUVL). EUVL transmits the pattern on the wafer surface after reflecting ultra-violet through mask pattern. If particles exist on the blank mask, it can't transmit the accurate pattern on the wafer and decrease the reflectivity. It is important to care the blank mask. We removed the particles on the wafer using focused ion beam (FIB). During removal, FIB beam caused damage the multi layer mask and it decreased the reflectivity. The relationship between particle removal and reflectivity is examined: i) transmission electron microscope (TEM) observation after particle removal, ii) reflectivity simulation. It is found that the image mode of FIB is more effective for particle removal than spot and bar mode.