• Title/Summary/Keyword: TAC time reduction

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A Novel OLED Inspection Process Method with Simultaneous Measurement for Standard and Deposition Pattern (기준패턴과 증착패턴의 동시 측정을 통한 OLED 공정 검사 방법)

  • Kwak, Byeongho;Cheoi, Kyungjoo
    • Journal of Korea Society of Digital Industry and Information Management
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    • v.15 no.4
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    • pp.63-70
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    • 2019
  • The subject of the simultaneous measuring system of base pattern and deposition pattern is a new research topic on a defect inspection of OLED. In this paper, we propose a new OLED inspection method that simultaneously measures standard and deposition pattern images. This method reduces unnecessary processes and tac time during OLED inspection. For an additional reduction of the tac time during pattern measurement, the ROI was configured to measure only in the designated ROI area instead of measuring the entire area of an image. During the ROI set-up, the value of effective deposition pattern area is included so that if the deposition pattern is out of the ROI zone, it would be treated as a defect before measuring the size and center point of the pattern. As a result, the tac time and inspection process could be shortened. The proposed method also could be applied to the OLED manufacturing process. Production of OLED could be increased by reducing tac time and inspection process.

Process TAC Time Reduction Technology for Improving the Efficiency and Throughput of the PDP (PDP 효율 및 생산성 향상을 위한 공정단순화 기술)

  • Kwon, Sang Jik
    • Journal of the Semiconductor & Display Technology
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    • v.12 no.2
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    • pp.45-50
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    • 2013
  • This paper focuses on the fundamental issues for improving the efficiency and throughput of the AC PDP (Plasma Display Panel) manufacturing. The properties of the MgO protective layer affect the PDP efficiency. Especially, the secondary electron emission efficiency was affected on the deposition rate of MgO during the evaporation. In this study, the deposition rate of 5 $\AA$/s has given the maximum efficiency value of 0.05 It is demonstrated that the impurity gases such as $H_2O$, $CO_2$, CO or $N_2$, and $O_2$ can be remained inside the PDP panel before sealing and the amount of the impurity gases decreased rapidly as the base vacuum level increased, especially near $10^{-5}$ torr. The fundamental solution in order to overcome these problems is the vacuum in-line sealing process from the MgO evaporation to the final sealing of the panel without breaking the vacuum. We have demonstrated this fundamental process technology and shown the feasibility. The firing voltage was reduced down to 285 V at the base vacuum value of $10^{-6}$ torr, whreras it was about 328 V at the base vacuum value of $10^{-3}$ torr.

Continuous High Pressure Carbon Dioxide Processing of Mandarin Juice

  • Lim, Sang-Bin;Yagiz, Yavuz;Balaban, Murat O.
    • Food Science and Biotechnology
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    • v.15 no.1
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    • pp.13-18
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    • 2006
  • Mandarin juice was processed using a continuous high pressure $CO_2$ system. Response surface methodology was used to investigate the effects of the processing parameters such as temperature, pressure, residence time, and %(w/w) ratio of $CO_2$ to juice on total aerobic count (TAC), pectinesterase (PE) activity, cloud level, $^{\circ}Brix$, pH, and titratable acidity (TA) of the juices. Maximum log reduction (3.47) of TAC was observed at $35^{\circ}C$, 41.1 MPa, 9 min residence time, and 7% $CO_2$. PE was inactivated by 7-51%. The cloud was not only retained but was also enhanced by 38%. Lightness and yellowness increased, and redness decreased. The processing temperature and % $CO_2$/juice ratio significantly affected high pressure $CO_2$ processing of the juice in terms of pasteurization, PE inactivation, cloud increase, and color change. The $^{\circ}Brix$, pH, and TA before and after treatment remained unchanged.