• 한국표면공학회지
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• 제40권3호
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• pp.138-143
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• 2007

The effects of texturing and anti-reflection coating on the reflection properties of multi-crystalline silicon solar cell have been investigated. The chemical solutions of alkaline and acidic etching solutions were used for texturing at the surface of multi-crystalline Si wafer. Experiments were performed with various temperature and time conditions in order to determine the optimized etching condition. Alkaline etching solution was found inadequate to the texturing of multi-crystalline Si due to its high reflectance of about 25%. The reflectance of Si wafer texturing with acidic etching solution showed a very low reflectance about 10%, which was attributed to the formation of homogeneous. Also, deposition of ITO anti-reflection coating reduced the reflectance of multi-crystalline si etched with acidic solution($HF+HNO_3$) to 2.6%.

• 대한원격탐사학회:학술대회논문집
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• 대한원격탐사학회 2009년도 춘계학술대회 논문집
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• pp.254-259
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• 2009

In this study, Simplified Method for the Atmospheric Correction (SMAC) radiative transfer model (RTM) used to retrieve surface reflectance from MODIS Top Of Atmosphere (TOA) reflectance (MOD02). SMAC code provides coefficients which were previously yielded by Second Simulation of the Satellite Signal in the Solar Spectrum (6S) for each satellite sensor. We conducted error analysis of SMAC RTM using MOD02 over comparison with MODIS surface reflectance (MOD09) which was provided from 6S. It showed that low accuracy values such as, $R^2$ : 0.6196, Root Means Square Error (RMSE) : 0.00031, bias : - 0.0859. Thus sensitivity analysis of input parameters and coefficients was conducted to searching error sources. Coefficients about $\tau_p$ (average AOD) are more influence than any other coefficients of $\tau_{a550}$ (Aerosol Optical Depth at 550nm) from sensitivity test. Calibrated coefficients of $\tau_p$ from regression analysis were used to surface reflectance which showed that improve accuracy of surface reflectance ($R^2$ : 0.827, RMSE : 0.00672, bias : - 0.000762).

• Journal of the Optical Society of Korea
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• 제19권6호
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• pp.649-657
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• 2015

We present a surface color measurement including quantities of surface color, methods, and uncertainty evaluation. Based on a relation between spectral reflectance and surface color, we study how an uncertainty of spectral reflectance propagates to surface color. In analyzing the uncertainty propagation, we divide the uncertainty into uncorrelated components, fully correlated components, and correlated components with spectrally varying correlations. As an experimental example, we perform spectro-reflectometric measurements for ceramic color plates. With measured spectral reflectance and its uncertainty evaluation, we determine surface color and analyze uncertainties of the ceramic color plates.

• 대한기계학회논문집A
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• 제32권4호
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• pp.347-353
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• 2008

Reflected light can be decomposed into specular and diffuse components according to the light reflectance theory and experiments. The specular component appears in smooth surfaces mainly, while the diffuse one is visible in rough surfaces mostly. Therefore, each component can be used in forming their correlations to a surface roughness. However, they cannot represent the whole surface roughness seamlessly, because each formulation is merely validated in their available surface roughness regions. To solve this problem, new approaches to properly blend two light components in all regions are proposed in this paper. First is the weighting function method that a blending zone and rate can be flexibly adjusted, and second is the neural network method based on the learning from the measurement data. Simulations based on the light reflectance theory were conducted to examine its performance, and then experiments conducted to prove the enhancement of the measurement accuracy and reliability through the whole surface roughness regions.

• 한국표면공학회지
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• 제43권2호
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• pp.97-104
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• 2010

In this paper, we conducted MATLAB simulation using the reflectance formula and the Planck's black body radiation principle, for the purpose of identifying the opimum material and thickness of anti-reflective coating from double layered structures. We found that the optimum condition was obtained when refractive index of upper layer is 1.44 and that of lower layer is 2.29. As materials close to these refractive indices, $MgF_2$ as the upper layer and $HfO_2$, ZnS, $TiO_2$ as the lower layer were suggested. The best result in an average reflectance of 2.759% was obtained from a double layered structure of $MgF_2$ 94 nm/ZnS 55 nm.

• Journal of Biosystems Engineering
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• 제19권3호
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• pp.247-257
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• 1994

Optical properties of the tobacco leaves were determined. Surface colors and reflectance characteristics of the flue-cured variety and the Burley variety with thin and thick leaves were measured. Color was measured by CIE colorimeter and reflectance was measured with a laboratory built reflectance meter utilizing optical bandpass filters whose center wavelengths are from 400 to 700 nm at intervals of 50 nm. The resulting data indicated that the measured color and reflectance would be useful in inspecting tobacco. However no single optical data could be used to successfully grade tobacco leaves.

• 한국농공학회논문집
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• 제51권3호
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• pp.37-43
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• 2009

The objective of this study was to investigate the basic relationships between spectral reflectance and varying concentrations of sediment in surface waters. An experimental method for determining suspended sediment concentration (SSC) in the water by use of a spectroradiometer above the water surface, in visible and near-infrared (NIR) wavelengths, is applied. The main advantage of the method is the direct comparison of spectral reflectance and the SSC, but it requires an accurate knowledge of the water body and sediment. Therefore numerous spectroradiometric measurements are carried out in situ measurements, for SSC, ranging from zero to 100 percentage and two types of sediment applied in the water tank. The results indicate that the suspended sediment causes increasing spectral reflectance response in waters. We observed that spectral reflectance increases with SSC, first at the lower wavelengths (430-480 nm), then in the middle wavelengths (570-700 nm), and finally, in the NIR domain (800-820 nm); a characteristic maximum reflectance appears at 400-670 nm. Relationships between the wavelength, integral value, and the SSC were evaluated on the basis of the regression analysis. The regression curve for the relation between the wavelength, integral value, and the SSC were determined ($R^2$>0.98). Finally, the specular wavelength can be estimated to recognize the sediment and to improve SC estimation accuracy in the water.

• 한국세라믹학회지
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• 제46권6호
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• pp.685-688
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• 2009

Surface Texturing is very important process for high cell efficiency in crystalline silicon solar cell. Anisotropic texturing with an alkali etchant was known not to be able to produce uniform surface morphology in multi-crystalline silicon (mc-Si), because of its different etching rate with random crystal orientation. In order to reduce surface reflectance of mc-Si wafer, the general etching tendency was studied with HF/HN$O_3$/De-ionized Water acidic solution. And the surface structures of textured mc-Si in various HF/HN$O_3$ ratios were compared. The surface morphology and reflectance of textured silicon wafers were measured by FE-SEM and UVvisible spectrophotometer, respectively. We obtained average reflectance of $16{\sim}19$% for wavelength between 400 nm and 900 nm depending on different etching conditions.

• Current Photovoltaic Research
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• 제5권4호
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• pp.105-108
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• 2017

The reactive ion etching (RIE) technology which enables nano-texturatization of surface is applied on monocrystalline silicon solar cell. The additional RIE process on alkalized textured surface further improves the blue response and short circuit current. Such parameter is characterized by surface reflectance and quantum efficiency measurement. By varying the RIE process time and matching the subsequent processes, the absolute efficiency gain of 0.13% is achieved. However, the result indicates potential efficiency gain could be higher due to process integration. The critical etch process time is discussed which minimizes both front surface reflectance and etching damage, considering the challenges of required system throughput in industry.

• 대한원격탐사학회:학술대회논문집
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• 대한원격탐사학회 2006년도 Proceedings of ISRS 2006 PORSEC Volume I
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• pp.184-187
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• 2006

The radiometric correction is prerequisite to derive both land and ocean surface properties from optical remote sensing data. Radiometric calibration of remotely sensed data has traditionally been accomplished by means of vicarious ground calibration techniques. The purpose of this study is to calibrate the radiometric characteristic of Airborne Multispectral Scanner (AMS) by field campaign. In order to calibrate the AMS data, four different spectral tarps which are 3.5%, 23%, 35%, and 53% were validated by GER-3700 that is the surface reflectance measurement equipment and were utilized. After validation of the spectral tarps, each reflectance from the spectral tarps was compared with Digital Number (DN) value of AMS. There was very high correlation between tarp reflectance and DN value of AMS so that radiometric calibration of AMS data has been accomplished by those results. The calibrated AMS data were validated with in-situ measured reflectance data from artificial and natural target. Also QuickBird image data were used for verifying the results of AMS radiometric calibration. This presentation discusses the results of the above tests.