• Journal of the Korean Data and Information Science Society
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• v.25 no.2
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• pp.447-454
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• 2014

In many practical machine learning and data mining applications, unlabeled training examples are readily available but labeled ones are fairly expensive to obtain. Therefore semi-supervised learning algorithms have attracted much attentions. However, previous research mainly focuses on classication problems. In this paper, a semi-supervised regression method based on support vector regression (SVR) formulation that is proposed. The estimator is easily obtained via the dual formulation of the optimization problem. The experimental results with simulated and real data suggest superior performance of the our proposed method compared with standard SVR.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.46 no.4
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• pp.312-320
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• 2023

Recently, there has been an increasing attempt to replace defect detection inspections in the manufacturing industry using deep learning techniques. However, obtaining substantial high-quality labeled data to enhance the performance of deep learning models entails economic and temporal constraints. As a solution for this problem, semi-supervised learning, using a limited amount of labeled data, has been gaining traction. This study assesses the effectiveness of semi-supervised learning in the defect detection process of manufacturing using the MixMatch algorithm. The MixMatch algorithm incorporates three dominant paradigms in the semi-supervised field: Consistency regularization, Entropy minimization, and Generic regularization. The performance of semi-supervised learning based on the MixMatch algorithm was compared with that of supervised learning using defect image data from the metal casting process. For the experiments, the ratio of labeled data was adjusted to 5%, 10%, 25%, and 50% of the total data. At a labeled data ratio of 5%, semi-supervised learning achieved a classification accuracy of 90.19%, outperforming supervised learning by approximately 22%p. At a 10% ratio, it surpassed supervised learning by around 8%p, achieving a 92.89% accuracy. These results demonstrate that semi-supervised learning can achieve significant outcomes even with a very limited amount of labeled data, suggesting its invaluable application in real-world research and industrial settings where labeled data is limited.

• Korean Journal of Remote Sensing
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• v.26 no.6
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• pp.705-719
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• 2010

We investigated the speckle filtering effect in supervised classification of the C-band polarimetric Ground Based SAR image data. Wishart classification method was used for the supervised classification of the polarimetric GB-SAR image data and total of 6 kinds of speckle filters were applied before supervised classification, which are boxcar, Gaussian, Lopez, IDAN, the refined Lee, and the refined Lee sigma filters. For each filters, we changed the filtering kernel size from $3{\times}3$ to $9{\times}9$ to investigate the filtering size effect also. The refined Lee filter with the kernel size of bigger than $5{\times}5$ showed the best result for the Wishart supervised classification of polarimetric GB-SAR image data. The result also showed that the type of trees could be discriminated by Wishart supervised classification of polarimetric GB-SAR image data.

• Journal of Institute of Control, Robotics and Systems
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• v.21 no.6
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• pp.565-570
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• 2015

Supervised machine learning has become popular in discovering context descriptions from sensor data. However, collecting a large amount of labeled training data in order to guarantee good performance requires a great deal of expense and time. For this reason, semi-supervised learning has recently been developed due to its superior performance despite using only a small number of labeled data. In the existing semi-supervised learning algorithms, unlabeled data are used to build a graph Laplacian in order to represent an intrinsic data geometry. In this paper, we represent the unlabeled data as the spatial-temporal dataset by considering smoothly moving objects over time and space. The developed algorithm is evaluated for position estimation of a smartphone-based robot. In comparison with other state-of-art semi-supervised learning, our algorithm performs more accurate location estimates.

• IEMEK Journal of Embedded Systems and Applications
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• v.18 no.6
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• pp.285-292
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• 2023

With the wide spread of smart farms and the advancements in IoT technology, it is easy to obtain additional data in addition to crop images. Consequently, deep learning-based crop disease diagnosis research utilizing multimodal data has become important. This study proposes a crop disease diagnosis method using multimodal supervised contrastive learning by expanding upon the multimodal self-supervised learning. RandAugment method was used to augment crop image and time series of environment data. These augmented data passed through encoder and projection head for each modality, yielding low-dimensional features. Subsequently, the proposed multimodal supervised contrastive loss helped features from the same class get closer while pushing apart those from different classes. Following this, the pretrained model was fine-tuned for crop disease diagnosis. The visualization of t-SNE result and comparative assessments of crop disease diagnosis performance substantiate that the proposed method has superior performance than multimodal self-supervised learning.

• Journal of the Korean Data and Information Science Society
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• v.18 no.3
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• pp.629-636
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• 2007

A kernel type semi-supervised estimate is proposed. The proposed estimate is based on the penalized least squares loss and the principle of Gaussian Random Fields Model. As a result, we can estimate the label of new unlabeled data without re-computation of the algorithm that is different from the existing transductive semi-supervised learning. Also our estimate is viewed as a general form of Gaussian Random Fields Model. We give experimental evidence suggesting that our estimate is able to use unlabeled data effectively and yields good classification.

• Journal of Information Technology Applications and Management
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• v.15 no.1
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• pp.225-242
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• 2008

PM (Inconsistency Pattern Modeling) is a hybrid supervised learning technique using the inconsistence pattern of input variables in mining data sets. The IPM tries to improve prediction accuracy by combining more than two different supervised learning methods. The previous related studies have shown that the IPM was superior to the single usage of an existing supervised learning methods such as neural networks, decision tree induction, logistic regression and so on, and it was also superior to the existing combined model methods such as Bagging, Boosting, and Stacking. The objectives of this paper is explore the characteristics of the IPM. To understand characteristics of the IPM, three experiments were performed. In these experiments, there are high performance improvements when the prediction inconsistency ratio between two different supervised learning techniques is high and the distance among supervised learning methods on MDS (Multi-Dimensional Scaling) map is long.

• Journal of the Korean Data and Information Science Society
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• v.23 no.3
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• pp.579-585
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• 2012

Many different semi-supervised learning algorithms have been proposed for use wit unlabeled data. However, most of them focus on classification problems. In this paper we propose a semi-supervised regression algorithm called the semi-supervised local constant estimator (SSLCE), based on the local constant estimator (LCE), and reveal the asymptotic properties of SSLCE. We also show that the SSLCE has a faster convergence rate than that of the LCE when a well chosen weighting factor is employed. Our experiment with synthetic data shows that the SSLCE can improve performance with unlabeled data, and we recommend its use with the proper size of unlabeled data.

• Journal of the Semiconductor & Display Technology
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• v.19 no.4
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• pp.121-125
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• 2020

With miniaturization of semiconductor, the manufacturing process become more complex, and undetected small changes in the state of the equipment have unexpectedly changed the process results. Fault detection classification (FDC) system that conducts more active data analysis is feasible to achieve more precise manufacturing process control with advanced machine learning method. However, applying machine learning, especially in supervised learning criteria, requires an arduous data labeling process for the construction of machine learning data. In this paper, we propose a semi-supervised learning to minimize the data labeling work for the data preprocessing. We employed equipment status variable identification (SVID) data and optical emission spectroscopy data (OES) in silicon etch with SF6/O2/Ar gas mixture, and the result shows as high as 95.2% of labeling accuracy with the suggested semi-supervised learning algorithm.

• Journal of the Korean Data and Information Science Society
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• v.24 no.2
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• pp.341-353
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• 2013

In many practical machine learning and data mining applications, unlabeled data are inexpensive and easy to obtain. Semi-supervised learning try to use such data to improve prediction performance. In this paper, a semi-supervised regression method, semi-supervised kernel ridge regression estimation, is proposed on the basis of kernel ridge regression model. The proposed method does not require a pilot estimation of the label of the unlabeled data. This means that the proposed method has good advantages including less number of parameters, easy computing and good generalization ability. Experiments show that the proposed method can effectively utilize unlabeled data to improve regression estimation.