• Title/Summary/Keyword: Subranging analog-to-digital conversion

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An 8b 52 MHz CMOS Subranging A/D Converter Design for ISDN Applications (광대역 종합 통신망 응용을 위한 8b 52 MHz CMOS 서브레인징 A/D 변환기 설계)

  • Hwang, Sung-Wook;Lee, Seung-Hoon
    • Journal of IKEEE
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    • v.2 no.2 s.3
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    • pp.309-315
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    • 1998
  • This paper describes an 8b 52 MHz CMOS subranging analog-to-digital converter (ADC) for Integrated Services Digital Network (ISDN) applications. The proposed ADC based on the improved time-interleaved architecture removes the holding time which is typically observed in the conventional double-channel subranging ADCs to increase throughput rate. Moreover, the ADC employs the interpolation technique in the back-end subranging ADCs far residue signal processing to minimize die area and power consumption. The fabricated and measured prototype ADC in a 0.8 um n-well double-poly double-metal CMOS process typically shows a 52 MHz sampling rate at a 5 V supply voltage with 230 mW, and a 40 MHz sampling rate at a 3 V power supply with 60 mW power consumption.

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A Design of CMOS Analog-Digital Converter for High-Speed . Low-power Applications (고속 . 저전력 CMOS 아날로그-디지탈 변환기 설계)

  • Lee, Seong-Dae;Hong, Guk-Tae;Jeong, Gang-Min
    • The Transactions of the Korea Information Processing Society
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    • v.2 no.1
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    • pp.66-74
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    • 1995
  • A 8-bit 15MHz CMOS subranging Analog-to-Digital converter for high-speed, low-power consumption applications is described. Subranging, 2 step flash, A/D converter used a new resistor string and a simple comparator architecture for the low power consumption and small chip area. Comparator exhibites 80dB loop gain, 50MHz conversion speed, 0.5mV offset and maximum error of voltage divider was 1mV. This Analog-to-Digital converter has been designed and fabricated in 1.2 m N-well CMOS technology. It consumed 150mW power at +5/-5V supply and delayed 65ns. The proposed Analog-to-Digital converter seems suitable for high- speed, low-power consumption, small area applications and one-chip mixed Analog- Digital system. Simulations are performed with PSPICE and a fabricated chip is tested.

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