• 제목/요약/키워드: Submicron straightness

검색결과 1건 처리시간 0.014초

서브미크론 진직도 측정장치 개발 (Development of a Submicron Order Straightness Measuring Device)

  • 박천홍;정재훈;김수태;이후상
    • 한국정밀공학회지
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    • 제17권5호
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    • pp.124-130
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    • 2000
  • For measuring out the submicron order straightness, a precision measuring device is developed in this paper. The device is constructed with a hydrostatic feed table and a capacitive type sensor which is mounted to the feed table. Straightness is acquired as substracting the motion error of feed table from the measured profile with probe. Motion error of feed table is simultaneously compensated upto 0.120${\mu}{\textrm}{m}$ of linear motion error and 0.20arcsec of angular motion error using the active controlled capillary. Reversal method and strai호t-edge is used fur estimating the measuring accuracy and from the experimental result, it is verified that the device has the measuring accuracy 0.030m. Also, through the practical application on the measurement of ground surface, it is confirmed that the device is very effective to measure the submicron order straightness.

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