• Title/Summary/Keyword: Stochiometry

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Plasma CVD 법에 의한 ITO 박막제작

  • 김형근;박연수;곽민기;장경동;손상호;이상윤;이상걸
    • Proceedings of the Materials Research Society of Korea Conference
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    • 1994.11a
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    • pp.86-86
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    • 1994
  • 박막 EL소자의 투명전극으로 제작된 ITO막의 전기적, 광학적 특성을 조사하였다. Plama CVD방법으로 제작된 ITO막은 증착시 산소결핍으로 인한 비 다량결합(non-stochiometry) 에 의해 In이 석출되어 흑화현상이 일어나 전기전도도와 광투과율을 향상을 위해 산소분위기에서 30$0^{\circ}C$로 4분간 열처리를 행하였다. 한편 ITO막의 비저항 $\rho$와 광투과율 T를 Van der pauw법과 단색 분광계로 각각 측정하였다. 그 결과 상온에서 10-15$\Omega$/$\square$의 면저항과 400-1000nm의 파장영역에서 85-95%의 광투과율을 가져 박막 EL소자의 투명전극 조건을 만족하였다. 열처리에 대학 ITO막의 구조적 특성을 알아보기 위해 X-선회절장치(JEOL.JDX-8030)로 조사하였다. Fig.1은 X-선 회절 패턴을 나타낸다. 열처리후 ITO막은 상대적으로 최대 강도(peak intensity) 가 증가함으로써 열처리에 의해 결정성 향상이되었음을 알수 있다. Fig.2는 파장에 따른 ITO막의 광투과도를 나타낸다.

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Deposition Characteristic of InNx Films by Reactive DC Magnetron Sputtering (반응성 직류 스퍼터법에 의한 질화 인듐 박막의 제막 특성)

  • 송풍근;류봉기;김광호
    • Journal of the Korean Ceramic Society
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    • v.40 no.8
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    • pp.739-745
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    • 2003
  • In $N_{x}$ films were deposited on soda-lime glass without substrate heating by reactive dc magnetron sputtering using indium (In) metal target. Depositions were carried out under various total gas pressures ( $P_{tot}$) of mixture gases (Ar+$N_2$ or He+$N_2$). He gas was introduced to $N_2$ gas in order to enhance the reactivity of nitrogen on film surface by the "penning ionization". Plasma impedance decreased greatly when 20% or more introduced the $N_2$ gas. This is due to the In $N_{x}$ layers formed on target surface because a secondary electron emission rate of InN is small compared with In metal. XRD patterns of the films revealed that <001> preferred oriented polycrystalline In $N_{x}$ films, where the crystallinity of the films was improved with decrease of $P_{tot}$ and with increase of $N_2$ flow ratio. The improvement of the crystallinity and stoichimetry of the In $N_{x}$ films were considered to be caused by an increase in the activated nitrogen radicals and also by an increase in the kinetic energy of sputtered In atoms arriving at growing film surface, which should enhance the chemical reaction and surface migration on the growing film surface, respectively. Furthermore, the films deposited using mixture gases of He+$N_2$ showed higher crystallinity compared with the film deposited by the mixture gases of Ar+$N_2$.$.EX>.