• 한국산업정보학회논문지
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• 제1권1호
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• pp.111-125
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• 1996

This paper presents a statistical process control(SPC) system in the electronic parts manufacturing process. In this system, an SPC method is integrated into the automated inspection technology on a real time base. It shows how the collected data can be analyzed with the SPC to provide process information. also presented are stuided of subpixel image processing technology to improve the accuracy of parts mearements , and the cumulative-sum(CUSUM) control chart for fraction defectives.An application of the developed system to connector manufacturing process as a part of computer integrated manufacturing (CIM) is presented.

• 한국경영과학회지
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• 제36권1호
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• pp.39-55
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• 2011

Process monitoring has been emphasized for the monitoring of complex system such as chemical processing industries to achieve the efficiency enhancement, quality management, safety improvement. Recently, ICA (Independent Component Analysis) based MSPC (Multivariate Statistical Process Control) was widely used in process monitoring approaches. Moreover, DICA (Dynamic ICA) has been introduced to consider the system dynamics. However, the existing approaches show the limitation that their performances are strongly dependent on the statistical distributions of control variables. To improve the limitation, we propose a novel approach for process monitoring by integrating DICA and LOF (Local Outlier Factor). In this paper, we aim to improve the fault detection rate with the proposed method. LOF detects local outliers by using density of surrounding space so that its performance is regardless of data distribution. Therefore, the proposed method not only can consider the system dynamics but can also assure robust performance regardless of the statistical distributions of control variables. Comparison experiments were conducted on the widely used benchmark dataset, Tennessee Eastman process (TE process), and showed the improved performance than existing approaches.

• 융합보안논문지
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• 제12권6호
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• pp.85-92
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• 2012

소프트웨어의 디버깅에 오류 발생의 시간을 기반으로 하는 많은 소프트웨어 신뢰성 모델이 제안되어 왔다. 무한고장 모형과 비동질적인 포아송 과정에 의존한 소프트웨어 신뢰성 모형을 이용하면 모수 추정이 가능하다. 소프트웨어를 시장에 인도하는 결정을 내리기 위해서는 조건부 고장률이 중요한 변수가 된다. 유한 고장 모형은 실제 상황에서 다양한 분야에 사용된다. 특성화 문제, 특이점의 감지, 선형 추정, 시스템의 안정성 연구, 수명을 테스트, 생존 분석, 데이터 압축 및 기타 여러 분야에서의 사용이 점점 많아지고 있다. 통계적 공정 관리 (SPC)는 소프트웨어 고장의 예측을 모니터링 함으로써 소프트웨어 신뢰성의 향상에 크게 기여 할 수 있다. 컨트롤 차트는 널리 소프트웨어 산업의 소프트웨어 공정 관리에 사용되는 도구이다. 본 논문에서 NHPP에 근원을 둔 로그 포아송 실행시간 모형, 로그선형 모형 그리고 파레토 모형의 평균값 함수를 이용한 통계적 공정관리 차트를 이용한 제어 메커니즘을 제안하였다.

• 산업경영시스템학회지
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• 제26권1호
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• pp.7-16
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• 2003

At present, company has to produce a product that consumer like with a competitive price, a good quality, and a fitting time to supply. Process control and quality control are very important to supply with a product uniformly and inexpensively. Process control is given much weight in the quality control in manufacturing system. Statistical process controls(SPC) that are used in process generally have major impact on manufacturing, product design activities, and process development potentially. Control charts in statistical process control method can be interpreted the data from quality characteristics in production process and discriminated between chance variation and assignable variation in process. In addition, control chart can be used to monitor the process output and detect when changes in the inputs are required to bring the process back to an in-control state. The models that relate the influential inputs to process outputs help determine the nature and magnitude of the adjustments required. In this paper, the characteristic of product quality is monitored by control chart during the machining process and construction of quality control cycle is considered to divide into two types in this case that different assignable causes lead to shifts having different magnitudes. Then we are intended to find a process shift magnitude which has economical quality cost policy and are considered to quality cost functions to find a process shift magnitude. Those costs are categorized into the well-known categories of prevention, appraisal, and internal failure and external failure. This paper ends with numerical examples that demonstrate the usefulness of the model.

• 한국산업정보학회논문지
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• 제4권3호
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• pp.8-14
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• 1999

통계적 공정관리(SPC)는 공정에서 수집된 데이터를 통계적으로 분석함으로써 모든 변환공정의 품질을 관리할 수 있는 객관적 수단을 제공하는데, 실시간으로 공정검사의 결과를 피드백하는 수단이라는 점을 고려하면, 통계적 공정관리를 실시간 생산정보관리(POP)의 1개 모듈로 구축하는 것이 실질적이다. 이러한 맥락에서 본 연구는 자동차 부품업체의 통계적 공정관리시스템을 실시간 생산정보관리(POP)환경에서 구축하여 제시한다.

• 품질경영학회지
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• 제35권2호
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• pp.37-44
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• 2007

Today, the statistical process control (SPC) in manufacture environment is an important role at the process by the productivity improvement of the manufacturing systems. The control chart in this statistical method is widely used as an important statistical tool to find the assignable cause that provoke the change of the process parameters such as the mean of interest or standard deviation. But the traditional SPC don't grasp the change of process according to the points fallen the near control limits because of monitoring the variance of process such as the fixed sampling interval and the sample size and handle the cost of the aspect of these sample point. The control chart can be divided into the statistical and economic design. Generally, the economic design considers the cost that maintains the quality level of process. But it is necessary to consider the cost of the process improvement by the learning effects. This study does the economic design in the VSI $\bar X$ control chart and added the concept of loss function of Taguchi in the cost model. Also, we preyed that the VSI $\bar X$ control chart is better than the FSI $\bar X$ in terms of the economic aspects and proposed the standard of the process improvement using the VSI $\bar X$ control chart.

• International Journal of Quality Innovation
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• 제4권1호
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• pp.205-212
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• 2003

Statistical Process Control (SPC) is recognized as one of the most important tool of quality control (QC), and is one research focus in order to implement SPC quickly and effectively using computer technology and network environments. This paper proposes the principle and topology of embedded SPC based on the Internet/lntranet, emphatically discusses the embedded data sampling block, embedded network interface and SPC strategy. An example of application is given.

• Journal of the Korean Data and Information Science Society
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• 제15권2호
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• pp.285-295
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• 2004

Statistical process control(SPC) and engineering process control(EPC) are two complementary strategies for quality improvement. An integrated process control(IPC) can use EPC to reduce the effect of predictable quality variations and SPC to monitor the process for detection of special causes. In this paper we assume an IMA(1,1) model as a disturbance process and an occurrence of a level shift in the process, and we consider the economic performance for applying an EWMA chart to monitor MMSE-controlled processes. The numerical results suggest that the IPC scheme in an IMA(1,1) disturbance model does not give additional advantages in the economic aspect.

• 대한안전경영과학회지
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• 제11권2호
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• pp.117-126
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• 2009

We develop methods for propagating and analyzing EPCI(Extended Process Capability Index) by using the error type that classifies into accuracy and precision. EPCI developed in this study can be applied to the three combined processes that consist of production, measurement and calibration. Little calibration work discusses while a great deal has been studied about SPC(Statistical Process Contol) and MSA(Measurement System Analysis). EPCI can be decomposed into three indexes such as PPCI(Production Process Capability Index), PPPI(Production Process Performance Index), MPCI(Measurement PCD, and CPCI(Calibration PCI). These indexs based on the type of error classification can be used with various statistical techniques and principles such as SPC control charts, ANOVA(Analysis of Variance), MSA Gage R&R, Additivity-of-Variance, and RSSM(Root Sum of Square Method). As the method proposed is simple, any engineer in charge of SPC. MSA and calibration can use efficientily in industries. Numerical examples are presentsed. We recommed that the indexes can be used in conjunction with evaluation criteria.

• Journal of the Korean Data and Information Science Society
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• 제16권3호
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• pp.507-514
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• 2005

In this paper we consider an operating methodology of SPC(statistical process control) system in the TFT-LCD industries. The main contents are real time process monitoring, significant difference test, outlying glass analysis, process capability analysis and chart viewing.