• 전기화학회지
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• 제1권1호
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• pp.1-7
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• 1998

중간온도$(700\~800^{\circ}C)$형 고체산화물 연료전지(solid oxide filet cells)의 양극재료로 이용을 목표로 $Gd_{0.8}Ca_{0.2}Co_{1-x}Fe_xO_3,\;(x=0.0\~0.5)$ 분말을 합성하고 이의 열적 안정성, 전도특성을 조사하였다. 또한 이를 CGO(Cerium-Gadolinium Oxide) 전해질 디스크에 부착하여 양극특성을 조사하였다. 양극재료를 구연산 법에 의하여 $800^{\circ}C$에서 하소하여 분말을 합성하였을 때, Fe의 함량에 상관없이 모두 페롭스카이트 단일상을 얻을 수 있었다. 합성분말의 열적 안정성을 측정하였는데, Fe의 함량이 적을수록 열적 안정성이 열악하여 x=0.0인 시료는 $1300^{\circ}C$에서 분해되었다 그러나 Fe이 치환된 재료의 경우에는 $1400^{\circ}C$까지 분해현상은 없었으나 $1300^{\circ}C$ 근처에서 용응되는 현상이 관찰되어 양극층의 접착온도를 $1300^{\circ}C$ 이하로 설정해야 함을 알았다. $Gd_{0.8}Ca_{0.2}Co_{1-x}Fe_xO_3,\;(x=0.0\~0.5)$로 반쪽전지를 제작하여 $800^{\circ}C$ 공기중에서 전지를 가동하며 양극의 산소환원 반응에 대한 활성을 조사한 결과 조성에 상관없이 $La_{0.9}Sr_{0.1}MnO_3$보다 우수한 활성을 가졌고, $x=0.0\~0.5$인 전극중에서는 x=0.2일 때 가장 좋은 양극특성을 보였다. 이와 같이 x=0.2인 경우에 가장 우수한 활성을 갖는 이유를, Fe의 함량이 많은 경우는 열적 안정성이 우수하나산소환원 반응에 대한 활성은 감소하므로 x=0.2에서 열적 안정성과 활성 사이에 최적의 trade-off가 나타남으로 설명하였다. x=0.2인 시료의 전기 전도도를 직류 4단자법에 의하여 측정하였을 때 $800^{\circ}C$에서 51 S/cm의 값을 나타내었고, 교류 2단자법으로 측정한 이온 전도도는$800^{\circ}C$에서 $6.0\times10^{-4}S/cm$의 값을 나타내었다. 즉 이 물질은 혼합 전도체로서 전극의 전 표면이 반응의 활성점으로 작용할 가능성이 있고, 이로부터 이들이 $La_{0.9}Sr_{0.1}MnO_3$보다 우수한 양극활성을 갖는 이유를 설명할 수 있었다.

• 한국결정성장학회지
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• 제5권3호
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• pp.215-222
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• 1995

Floating zone법으로 $SrTiO_3$에 $Nb_2O_5$를 02wt% 첨가한 단결정을 육성하였다. 결정성장시 성장분위기로는 air와 질소분위기에서 각각 결정을 육성하였으며, 원료봉의 소결온도 따른 성장계면양상을 조사하였다. 성장조건으로는 성장속도는 5mm/hr, 상부축과 하부축의 회전속도는 30rpm이었고, air분위기시 air의 유량은 1.5 ${\ell}/min$, 질소분위기시 질소가스의 유량은 0.5 ${\ell}/min$이었다. 육성한 결정을 XRD, Laue, chemical etching 등의 분석을 하였으며, 질소분위기에서 annealing 한 후 비저항을 측정하였으며 이를 통해 activation energy를 조사하였다.

• 한국초전도ㆍ저온공학회논문지
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• 제15권4호
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• pp.15-20
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• 2013

We investigated the flux pinning properties of both 10 mol% Zr-and Sn-doped $YBa_2Cu_3O_{7-{\delta}}$ (YBCO) films with the same thickness of ~350 nm for a comparative purpose. The films were prepared on the $SrTiO_3$ (STO) single crystal substrate by the metal-organic deposition (MOD) process. Compared with Sn-doped YBCO film, Zr-doped one exhibited a significant enhancement in the critical current density ($J_c$) and pinning force density ($F_p$). The anisotropic $J_{c,min}/J_{c,max}$ ratio in the field-angle dependence of $J_c$ at 77 K for 1 T was also improved from 0.23 for Sn-doped YBCO to 0.39 for Zr-doped YBCO. Thus, the highest magnetic $J_c$ values of 9.0 and $2.9MA/cm^2$ with the maximum $F_p$ ($F_{p,max}$) values of 19 and $5GN/m^3$ at 65 and 77 K for H // c, respectively, could be achieved from Zr-doped YBCO film. The stronger pinning effect in Zr-doped YBCO film is attributable to smaller $BaZrO_3$ (BZO) nanoparticles (the average size ${\approx}28.4$ nm) than $YBa_2SnO_{5.5}$ (YBSO) nanoparticles (the average size ${\approx}45.0$ nm) incorporated in Sn-doped YBCO film since smaller nanoparticles can generate more defects acting as effective flux pinning sites due to larger incoherent interfacial area for the same doping concentration.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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• pp.174-174
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• 2008

Non-volatile memories using ferroelectric-gate field-effect transistors (Fe-FETs) with a metal/ferroelectric/semiconductor gate stack (MFS-FETs) make non-destructive read operation possible. In addition, they also have features such as high switching speed, non-volatility, radiation tolerance, and high density. However, the interface reaction between ferroelectric materials and Si substrates, i.e. generation of mobile ions and short retention, make it difficult to obtain a good ferroelectric/Si interface in an MFS-FET's gate. To overcome these difficulties, Fe-FETs with a metal/ferroelectric/insulator/semiconductor gate stack (MFIS-FETs) have been proposed, where insulator as a buffer layer is inserted between ferroelectric materials and Si substrates. We prepared $SrBi_2Ta_2O_9$ (SBT) film as a ferroelectric layer and $LaZrO_x$ (LZO) film as a buffer layer on p-type (100) silicon wafer for making the MFIS-FET devices. For definition of source and drain region, phosphosilicate glass (PSG) thin film was used as a doping source of phosphorus (P). Ultimately, the n-channel ferroelectric-gate FET using the SBT/LZO/Si Structure is fabricated. To examine the ferroelectric effect of the fabricated Fe-FETs, drain current ($I_d$) versus gate voltage ($V_g$) characteristics in logarithmic scale was measured. Also, drain current ($I_d$) versus drain voltage ($V_d$) characteristics of the fabricated SBT/LZO/Si MFIS-FETs was measured according to the gate voltage variation.

• Nuclear Engineering and Technology
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• 제55권4호
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• pp.1300-1309
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• 2023

Simulated debris was synthesized using UO₂, Zr, and stainless steel and a heat treatment method under inert or oxidizing conditions. The primary U solid phase of the debris synthesized at 1473 K under inert conditions was UO₂, whereas a (U, Zr)O₂ solid solution formed at 1873 K. Under oxidizing conditions, a mixture of U₃O₈ and (Fe, Cr)UO₄ phases formed at 1473 K, whereas a (U, Zr)O_2+x solid solution formed at 1873 K. The leaching behavior of the fission products from the simulated debris was evaluated using two methods: the irradiation method, for which fission products were produced via neutron irradiation, and the doping method, for which trace amounts of non-radioactive elements were doped into the debris. The dissolution behavior of U depended on the properties of the debris and aqueous solution for immersion. Cs, Sr, and Ba leached out regardless of the primary solid phases. The leaching of high-valence Eu and Ru ions was suppressed, possibly owing to their solid-solution reaction with or incorporation into the uranium compounds of the simulated debris.

• 한국자기학회:학술대회 개요집
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• 한국자기학회 2011년도 임시총회 및 하계학술연구발표회
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• pp.7-8
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• 2011

Basically, the lattice mismatch between film and substrate can make those BiFeO3(BFO) films distorted with strain structure. BFO phase can be stabilized on LaAlO3(LAO) represents the example of a multiferroic with giant axial ratio. Its crystal structure is not strictly tetragonal, but tetragonal with a slight monoclinic distortion and related to the rotation of the oxygen octahedra. In this study, we show that phases with a tetragonal-like epitaxial BFO films can indeed be ferroelectric and also can be stabilized via epitaxial growth onto LAO. Recent reports on epitaxial BFO films show that the crystal structure changes from nearly rhombohedral ("R-like") to nearly tetragonal("T-like") at strains exceeding approximately -4.5%, with the "T-like" structure being characterized by a highly enhanced c/a ratio. While both the "R-like" and the "T-like" phases are monoclinic, our detailed x-ray diffraction results reveal asymmetry change from MA and MC type, respectively. By applying additional strain or by modifying the unit cell volume of the film by substituting Ba for Bi, the monoclinic distortion in the "T-like" MC phase is reduced, i.e. the system approaches a true tetragonal symmetry. There are two different M-H loops for $Bi_{1-x}Ba_xFeO_{3-{\delta}}$(BBFO) and BFO films on SrTiO3(STO) & LAO substrates. Along with the ferroelectric characterization, these magnetic data indicate that the BFO phase stabilized on LAO represents the first example of a multiferroic with giant axial ratio. However, there is a significant difference between this phase and other predicted ferroelectrics with a giant axial ratio: its crystal structure is not strictly tetragonal, but tetragonal with a slight monoclinic distortion. Therefore, in going from bulk to highly-strained films, a phase sequence of rhombohedral(R)-to-monoclinic ["R-like" MA-to-monoclinic, "T-like" MC-to-tetragonal (T)] is observed. This sequence is otherwise seen only near morphotropic phase boundaries in lead-based solid-solution perovskites (i.e. near a compositionally induced phase instability), where it can be controlled by electric field, temperature, or composition. Our results show that this evolution can occur in a lead-free, stoichiometric material and can be induced by stress alone. Those major results are summarized as follows ; 1) Ba-doping increases the unit cell volume, 2) BBFO on LAO can be fully strained up to x=0.08 as a strain limit (Fig. 1), 3) P(E) & M(H) properties can be tuned by the variation of composition, strain, and film thickness.

• Bulletin of the Korean Chemical Society
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• 제21권10호
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• pp.1041-1043
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• 2000

We present the effects of temperature (between 10 K and 298 K) and of hole concentration on the frequency and intensity of characteristic phonons in polycrystalline $La_2CuO_4-related$ compounds using FT-IR spectros-copy. The influences of the concentration of carrier doped on the phonon modes are prominent in the IR spectra of $La_2CuO_4-related$ compounds. For $La_2-xSrxCuO_4({\chi}=$ 0.00, 0.03, 0.07, 0.10, and 0.15) and electrochemically (or chemically) oxidized $La_2CuO_4$, the intensities of the transverse oxygen mode around 680cm $-^1$ which cor-responds mainly to Cu-O(1) stretching vibration in the basal plane of CuO6 octahedron, are decreased and dis-appeared depending on the Sr-substitution rate and the amount of excess oxygen, while the longitudinal oxygen mode around 510 cm $-^1$ corresponding to the Cu-O(2) stretching in the basal plane of CuO6 octahedron are near-ly invariable. In particular, after two cycles of cooling-heating between 10 K and 298 K for these sample, the phonons around 680 cm $-^1$ are blue shif 13-15 cm $-^1$, while the phonons around 510 cm $-^1$ are nearly constant. The introduction of the charge carrier by doping would give rise to the small contraction of CuO6 oc-tahedron as Cu $^3+$ requires a smaller site than Cu $^2+$, which results in the shortening of the Cu-O(1) bond length and Cu-O(2) bond length with the increased La-O(2) bond length. These results in the frequency shift of the characteristic phonons. The IR spectra of $La_2Li0.5Cu0.5O_4$ which exhibits an insulator behavior despite the $Cu^3+$ of nearly 100%, corroborate our IR interpretations. The mode around 710 cm $-^1$ corresponding to Cu-O(1) stretching vibration is still strongly remained even at low temperature (10 K). Thus, we conclude that the con-duction electrons formed within $CuO_2$ planes of $La_2CuO_4-related$ superconductors screen more effectively the transverse oxygen breathing mode around 680 $cm-^1$ depending on the concentration of the doped charge carrier in $La_2CuO_4-related$ compounds, which might use as a superconductivity probe.