• 한국환경과학회지
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• 제16권12호
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• pp.1431-1437
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• 2007

Cobalt titanates($CoTiO_x$), such as $CoTiO_3$ and $Co_2TiO_4$, have been synthesized via a solid-state reaction and characterized using X-ray diffraction(XRD) and X-ray photoelectron spectroscopic(XPS) measurement techniques, prior to being used for continuous wet trichloroethylene(TCE) oxidation at $36^{\circ}C$, to support our earlier chemical structure model for Co species in 5 wt% $CoO_x/TiO_2$(fresh) and(spent) catalysts. Each XRD pattern for the synthesized $CoTiO_3$ and $Co_2TiO_4$ was very close to those obtained from the respective standard XRD data files. The two $CoTiO_x$ samples gave Co 2p XPS spectra consisting of very strong main peaks for Co $2p_{3/2}$ and $2p_{1/2}$ with corresponding satellite structures at higher binding energies. The Co $2p_{3/2}$ main structure appeared at 781.3 eV for the $CoTiO_3$, and it was indicated at 781.1 eV with the $Co_2TiO_4$. Not only could these binding energy values be very similar to that exhibited for the 5 wt% $CoO_x/TiO_2$(fresh), but the spin-orbit splitting(${\Delta}E$) had also no noticeable difference between the cobalt titanates and a sample of the fresh catalyst. Neither of all the $CoTiO_x$ samples were active for the wet TCE oxidation, as expected, but a sample of pure $Co_3O_4$ had a good activity for this reaction. The earlier proposed model for the surface $CoO_x$ species existing with the fresh and spent catalysts is very consistent with the XPS characterization and activity measurements for the cobalt titanates.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2002년도 하계학술대회 논문집
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• pp.273-280
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• 2002

The stochiometric mix of evaporating materials for the CuGaTe$_2$ single crystal thin films was prepared from horizontal furnance. For extrapolation method of X-ray diffraction patterns for the CuGaTe$_2$ polycrystal, it was found tetragonal structure whose lattice constant a$\_$0/ and c$\_$0/ were 6.025 ${\AA}$ and 11.931 ${\AA}$, respectively. To obtain the single crystal thin films, CuGaTe$_2$ mixed crystal was deposited on throughly etched semi-insulator GaAs(100) substrate by the Hot Wall Epitaxy (HWE) system. The source and substrate temperature were 670 $^{\circ}C$ and 410 $^{\circ}C$ respective1y, and the thickness of the single crystal thin films is 2.1 $\mu\textrm{m}$. The crystalline structure of single crystalthin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). Hall effect on this sample was measured by the method of van der Pauw and studied on carrier density and mobility dependence on temperature. The carrier density and mobility of CuGaTe$_2$ single crystal thin films deduced from Hall data are 8.72${\times}$10$\^$23/㎥, 3.42${\times}$10$\^$-2/㎡/V$.$s at 293K, respectively. From the photocurrent spectrum by illumination of perpendicular light on the c - axis of the CuGaTe$_2$ single crystal thin film, we have found that the values of spin orbit coupling Δs.o and the crystal field splitting Δcr were 0.0791 eV and 0/2463eV at 10K, respectively. From the PL spectra at 10K, the peaks corresponding to free bound excitons and D-A pair and a broad emission band due to SA is identified. The binding energy of the free excitons are determined to be 0.0470eV and the dissipation energy of the donor -bound exciton and acceptor-bound exciton to be 0.0490eV, 0.00558eV, respectively.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 추계학술대회 논문집 Vol.17
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• pp.167-170
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• 2004

The stochiometric mix of evaporating materials for the $CuGaT_2$ single crystal thin films was prepared from horizontal furnance. Using extrapolation method of X-ray diffraction patterns for the $CuGaTe_2$ polycrystal, it was found tetragonal structure whose lattice constant $a_0$ and $c_0$ were 6.025 ${\AA}$ and 11.931 ${\AA}$, respectively. To obtain the single crystal thin films, $CuGaTe_2$ mixed crystal was deposited on throughly etched semi-insulator GaAs(100) substrate by the Hot Wall Epitaxy (HWE) system. The source and substrate temperature were $670^{\circ}C$ and $410^{\circ}C$ respectively, and the thickness of the single crystal thin films is $2.1{\mu}m$. The crystalline structure of single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). From the photocurrent spectrum by illumination of perpendicular light on the c - axis of the $CuGaTe_2$ single crystal thin film, we have found that the values of spin orbit coupling ${\Delta}s.o$ and the crystal field splitting ${\Delta}cr$ were $0.079\underline{1}eV$ and $0.246\underline{3}eV$ at 10 K, respectively. From the PL spectra at 10K, the peaks corresponding to free bound excitons and D-A pair and a broad emission band due to SA is identified. The binding energy of the free excitons are determined to be $0.047\underline{0}eV$ and the dissipation energy of the donor-bound exciton and acceptor-bound exciton to be $0.049\underline{0}eV$, $0.055\underline{8}eV$, respectively.

• 한국결정성장학회지
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• 제9권2호
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• pp.197-206
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• 1999

수평 전기로에서 $AgInSe_2$다결정을 합성하여 HWE(Hot Wall Epitaxy) 방법으로 $AgInSe_2$ 단결정 박막을 반절연성 GaAs(100) 위에 성장하였다. $AgInSe_2$단결정 박막은 증발원과 기판의 온도를 각각 $610^{\circ}C$, $450^{\circ}C$로 성장하였다. 이때 성장된 단결정 박막의 두께는 3.8$\mu\textrm{m}$였다. 단결정 박막의 결정성의 조사에서 20 K에서 측정한 광발광 스펙트럼은 884.1nm(1.4024eV) 근처에서 excition emission 스펙트럼이 가장 강하게 나타났으며, 또한 이중결정 X-선 회절곡선(DCXD)의 반폭치(FWHM)도 125arcsec로 매우 작은 값으로 측정되어 최적 성장 조건임을 알 수 있었다. Hall 효과는 van der Pauw 방법에 의해 측정되었으며, 온도에 의존하는 운반자 농도와 이동도는 293K에서 각각 $9.58{\times}10^{22} electron/m^3,\; 3.42{\times}10^{-2}m^2/V{\cdot}s$였다. $AgInSe_2$단결정 박막의 광전류 단파장대 봉우리들로부터 20K에서 측정된 $\Delta$Cr(Crystal field splitting)은 0.12eV, $\Delta$So(spin orbit coupling)는 0.29 eV였다. 20K에서 얻어진 광발광 봉우리들 중에서 881.1nm(1.4071 eV)와 882.4nm(1.4051 eV)는 free exciton$E_x$의 upper polariton과 lower polariton인$E_x^U$와 $E_x^L$를 의미하며, 884.1nm(1.4024 eV)는 donor-bound exciton emission에 의한 $I_2$봉우리를, 885.9nm(1.3995 eV)는 acceptor-bound exciton emission에 의한 $I_1$ 봉우리를 각각 나타내었다. 또한 887.5nm(1.3970 eV)에서 관측된 봉우리는 DAP(donor-acceptor pair)에 기인하는 광발광 봉우리로 해석되었다.

• 한국결정성장학회지
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• 제10권3호
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• pp.189-198
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• 2000

수평전기로에서 $CuGaSe_2$다결정을 합성하여 HWE(Hot Wall Epitaxy) 방법으로 $CuGaSe_2$단결정 박막을 반절연 성 GaAs(100)기판 위에 성장하였다. $CuGaSe_2$단결정박막은 증발원의 온도를 $610^{\circ}C$, 기판의 온도를 $450^{\circ}C$로 성장하였다. 이때 성장된 단결정 박막의 두께는 2.1$\mu\textrm{m}$였다. 단결정 박막의 결정성의 조사에서 20K에서 광발광(photoluminescence) 스펙트럼이 672.6nm(1.8432 eV)에서 exciton emission 스펙트럼이 가장 강하게 나타났으며, 또한 이중결정 X-선 요동곡선(DCRC)의 반폭치(FWHM)도 138 arcsec로 가장 작아 최적 성장 조건임을 알 수 있었다. Hall 효과는 van der Pauw 방법에 의해 측정되었으며, 온도에 의존하는 운반자 농도와 이동도는 293 K에서 각각 $4.87{\times}10^{23}$ electron/$m^{23}$ , $1.29{\times}10^{-2}$$\m^2$/v-s였다. $CuGaSe_2$ 단결정 박막의 광전류 단파장대 봉우리들로부터 20K에서 측정된 $\Delta$Cr(crystal field splitting)은 약 0.0900 eV $\Delta$So(spin orbit coupling)는0.2493 eV였다. 20K에서 광발광 봉우리의 667.6nm(1.8571 eV)는 free exciton($E_x$), 672.6nm(1.8432 eV)는 acceptor-bound exciton 인 $I_2$와 679.3nm(1.8251 eV)는 donor-bound exciton인 $I_1$였다. 또한 690.9nm(1.7945 eV)는 donor-acceptor pair(DAP) 발광 $P_0$이고 702.4nm(1.7651 eV)는 DAP-replica $P_1$, 715.0nm(1.7340 eV)는 DAP-replica $P_2$, 728.9nm(1.7009 eV)는 DAP-replica $P_3$, 741.9nm(1.6711 eV)는 DAP-replica $P_4$로 고찰된다. 912.4nm(1.3589 eV)는 self activated(SA)에 기인하는 광발광 봉우리로 고찰되었다.

• 한국결정성장학회지
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• 제10권6호
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• pp.425-433
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• 2000

수평 전기로에서 $CuGaTe_2$다결정을 합성하여 HWE 방법으로 $CuGaTe_2$단결정 박막을 반절연성 GaAs (100) 위에 성장하였다. $CuGaTe_2$단결정 박막은 증발원과 기판의 온도를 각각 $670^{\circ}C$, $410^{\circ}C$로 성장하였다. 이때 단결정 박막의 결정성이 10K에서 측정한 광발광 스펙트럼은 954.5 nm(1.2989 eV) 근처에서 exciton emission 스펙트럼이 가장 강하게 나타났으며, 또한 이중결정 X-선 요동곡선(DCRC)의 반폭치(FWHM)도 139arcsec로 가장 작게 측정되어 최적 성장 조건임을 알 수 있었다. Hall효과는 van der Pauw 방법에 의해 측정되었으며, 온도에 의존하는 운반자 농도와 이동도는 293 K에서 각각 $8.72{\times}10{23}$개 $\textrm m^3$, $3.42{\times}10^{-2}$ $\textrm m^2$/V.s였다. 상온에서 $CuGaTe_2$단결정 박막의 광흡수 특성으로부터 에너지 띠간격이 1.22 eV였다. Bandedge에 해당하는 광전도도 peak의 온도 의존성은 varshni 관계식으로 설명되었으며, varshni 관계식의 상수값은 $E_g$(0) = 1.3982 eV, $\alpha$ = $4.27{\times}10^{-4}$eV/K, $\beta$ = 265.5K로 주어졌다. $CuGaTe_2$단결정 박막의 광전류 단파장대 봉우리들로부터 10K에서 측정된$\Delta$cr(crystal field splitting)은 0.0791 eV, $\Delta$s.o(spin orbit coupling)는 0.2463 eV였다. 10K에서 광발광 봉우리의 919.8nm(1.3479 eV) free exciton($E_x$), 954.5nm(1.2989 eV)는 donor-bound exciton 인 $I_2(D^0,X)$와 959.5nm(1.2921 eV)는 acceptor-bound exciton 인 $I_1(A_0, X)$이고, 964.6nm(1.2853 eV)는 donor-acceptor pair(DAP) 발광, 1341.9nm(0.9239 eV)는 self activated(SA)에 기인하는 광발광 봉우리로 고찰되었다.

• 센서학회지
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• 제10권1호
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• pp.62-70
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• 2001

CBD방법으로 성장하여 $450^{\circ}C$로 열처리한 ZnSe 박막은 회전 무늬로부터 외삽법으로 구한 격자상수 $a_0$가 $5.6678\;{\AA}$인 zinc blend임을 알았다. Van der Pauw 방법으로 측정한 Hall 데이터에 의한 이동도는 10 K에서 150 K 까지는 불순물 산란 (impurity scatterimg)에 의하여, 150 K에서 293 K까지는 격자산란 (lattice scattering)에 의하여 감소하는 경향을 나타냈다. 또한 운반자 농도의 ln n대 1/T에서 구한 활성화 에너지($E_a$)는 0.27 eV였다. 투과 곡선의 투과단으로 본 띠 간격은 293 k에서 $2,700{\underline{5}}\;eV$이었던 것이 10K에서는 $2.873{\underline{9}}\;eV$로 변하였다. 광전류 봉우리 위치를 투과단과 비교할 때 293 K에서 30 K까지 관측된 한 개의 봉우리는 가전자대 ${\Gamma}_8$에서 전도대 ${\Gamma}_6$로 전이에 의한 광전류 봉우리이고, 10K에서 관측된 단파장대 417.3 nm($2.971{\underline{4}}\;eV$)의 봉우리는 가전자대 ${\Gamma}_7$에서 전도대 ${\Gamma}_6$로, 431.5 nm($2.873{\underline{3}}\;eV$)의 봉우리는 가전자대 ${\Gamma}_8$에서 전도대 ${\Gamma}_6$로 전이에 의한 광전류 봉우리가 관측된 것으로 판단된다. 광전류 봉우리의 10K에서 단파장대의 가전자대 갈라짐(splitting)에 의해서 측정된 ${\Delta}so$(spin orbit coupling)는 $0.098{\underline{1}}\;eV$ 였다. 10 K에서 광발광 봉우리의 440.7 nm($2.812{\underline{7}}\;eV$)는 자유 엑시톤(free exciton : $E_x$), 443.5 nm ($2.795{\underline{5}}\;eV$)는 주개-얽매인 엑시톤(donor-bound exciton) 인 $I_2(D^0,\;X)$와 445.7 nm ($2.781{\underline{8}}\;eV$)는 반개-얽매인 엑시톤(acceptor-bound exciton) 인 $I_1(A^0,X)$이고, 460.5 nm ($2.692{\underline{3}}\;eV$)는 주개-받개쌍(donor-acceptor pair:DAP) 발광, 580 nm ($2.137{\underline{6}}\;eV$)는 self activated(A)에 기인하는 광발광 봉우리로 분석된다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 추계학술대회 논문집 Vol.17
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• pp.175-178
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• 2004

The stochiometric mixture of evaporating materials for the $ZnIn_2S_4$ single crystal thin film was prepared from horizontal furnace. To obtain the $ZnIn_2S_4$ single crystal thin film, $ZnIn_2S_4$ mixed crystal was deposited on throughly etched semi-insulating GaAs(100) in the Hot Wall Epitaxy(HWE) system. The source and substrate temperature were $610^{\circ}C$ and $450^{\circ}C$, respectively and the growth rate of the $ZnIn_2S_4$ sing1e crystal thin film was about $0.5\;{\mu}m/hr$. The crystalline structure of $ZnIn_2S_4$ single crystal thin film was investigated by photoluminescence and double crystal X-ray diffraction(DCXD) measurement. The carrier density and mobility of $ZnIn_2S_4$ single crystal thin film measured from Hall effect by van der Pauw method are $8.51{\times}10^{17}\;cm^{-3}$, $291\;cm^2/V{\cdot}s$ at $293_{\circ}\;K$, respectively. From the photocurrent spectrum by illumination of perpendicular light on the c - axis of the $ZnIn_2S_4$ single crystal thin film, we have found that the values of spin orbit splitting ${\Delta}S_O$ and the crystal field splitting ${\Delta}Cr$ were 0.0148 eV and 0.1678 eV at $10_{\circ}\; K$, respectively. From the photoluminescence measurement of $ZnIn_2S_4$ single crystal thin film, we observed free excition $(E_X)$ typically observed only in high quality crystal and neutral donor bound exciton $(D^{o},X)$ having very strong peak intensity The full width at half maximum and binding energy of neutral donor bound excition were 9 meV and 26 meV, respectively, The activation energy of impurity measured by Haynes rule was 130 meV.

• 한국재료학회:학술대회논문집
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• 한국재료학회 2003년도 춘계학술발표강연 및 논문개요집
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• pp.81-81
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• 2003

The stochiometric mixture of evaporating materials for the CuGaSe$_2$ single crystal thin films were prepared from horizontal furnace. Using extrapolation method of X-ray diffraction patterns for the polycrystal CuGaSe$_2$, it was found tetragonal structure whose lattice constant no and co were 5.615$\AA$ and 11.025$\AA$, respectively. To obtains the single crystal thin films, CuGaSe$_2$ mixed crystal was deposited on throughly etched GaAs(100) by the Hot Wall Epitaxy(HWE) system. The source and substrate temperature were 61$0^{\circ}C$ and 45$0^{\circ}C$ respectively, and the growth rate of the single crystal thin films was about 0.5${\mu}{\textrm}{m}$/h. The crystalline structure of single crystal thin films was investigated by the double crystal X-ray diffraction(DCXD). Hall effect on this sample was measured by the method of van der pauw and studied on carrier density and mobility depending on temperature. From Hall data, the mobility was likely to be decreased by pizoelectric scattering in the temperature range 30K to 150K and by polar optical scattering in the temperature range 150K to 293K. The optical energy gaps were found to be 1.68eV for CuGaSe$_2$ single crystal thin films at room temperature. The temperature dependence of the photocurrent peak energy is well explained by the Varshni equation then the constants in the Varshni equation are given by a=9.615$\times$ 10$^{-4}$ eV/K, and $\beta$=335K. From the photocurrent spectra by illumination of polarized light of the CuGaSe$_2$ single crystal thin films. We have found that values of spin orbit coupling ΔSo and crystal field splitting ΔCr was 0.0900eV and 0.2498eV, respectively. From the PL spectra at 20K, the peaks corresponding to free bound excitons and D-A pair and a broad emission band due to SA is identified. The binding energy of the free excitons are determined to be 0.0626eV and the dissipation energy of the acceptor-bound exciton and donor-bound exciton to be 0.0352eV, 0.0932eV, respectively.