• Proceedings of the Korean Society of Precision Engineering Conference
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• 2006.05a
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• pp.25-26
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• 2006

The method measuring the absolute position of a point diffraction source emitting a spherical wavefront in three-dimension is proposed. Two-dimensional interference of spherical wavefronts is used to overcome ambiguity of phase order. The spherical wavefront is explicated by Taylor series expansion, from which a radius of curvature of a spherical wavefront and its center position in three-dimension are obtainable. The spherical wavefront is reconstructed by a modified lateral shearing interferometer, which uses single-mode fiber as a point diffraction source.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2005.10a
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• pp.208-211
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• 2005

The volumetric interferometer, which uses the interference of wavefronts emitted from two single mode fibers, measures the target position in 3-D. In this paper, we suggest a new calculation method which doesn't need a non-linear optimization and an initial guess. We find the relationship between the coefficients of the Zernike polynomials for a spherical wavefront and its center and reconstruct a spherical wavefront by using the Zernike polynomials from two interference fringes like a lateral shearing interferometer. The target position can be obtained from the coefficients of the Zernike polynomials of the reconstructed wavefront. We can get the target position in 3-D with $sub-{\mu}m$ errors in a simulation.

• Proceedings of the Korea Electromagnetic Engineering Society Conference
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• 2000.11a
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• pp.29-33
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• 2000

The classical image reconstruction for stripmap SAR is based on the Fresnel approximation which utilizes deramping or chirp deconvolution in the synthetic aperture(slow-time) domain. Another approach in formulating stripmap SAR processing and imaging is based on the SAR wavefront reconsturction theory, and analysis of the SAR signal in the slow-time via the spherical wave Fourier decomposition of the radar radiation pattern. In this paper, we compare the Fresnel approximation and the wavefrong reconstruction methods using simulated stripmap SAR dada.

• Transactions of the Society of Information Storage Systems
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• v.3 no.3
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• pp.135-138
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• 2007

Using a Shack-Hartmann sensor and sub-wavelength sized pinhole point source, we develope an optical testing system that measures the wavefront error of high numerical aperture and small sized optical components. The subwavelength sized pinhole generates perfect spherical waves with large diffraction angle and this makes possible to test high numerical aperture optics. The Shack-Hartmann sensor reconstructs the wavefront and calculates the aberrations. We make a home-made reference plane wave source which generates nearly perfect plane waves and the calibration with this plane source gives the overall uncertainty of the optical testing system 0.010 $\lambda$ rms.

• Korean Journal of Optics and Photonics
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• v.5 no.4
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• pp.445-452
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• 1994

The automatic analysis of the wavefront of laser beam is simulated numerically, and is applied to get the wavefront of the output beam of LD-pumped cw Nd:YAG laser, experimentally. The automatic analysis tool was developed by utilizing Fourier analysis method, and its usefulness is proved through numerical simulation. The wavefront error due to the analysis tool is known to be less than A/30. In order to find the wavefront of Nd:YAG laser beam, its interference fringe is obtained from Mach-Zehnder interferometer. The wavefront calculated from the developed tool has the shape of nearly spherical wavefront and the maximum distortion is about 0.8 .A.. 8 .A..

• 정보저장시스템학회:학술대회논문집
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• 2005.10a
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• pp.160-161
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• 2005

Using a Shack-Hartmann sensor, we construct an optical testing system measuring the wavefront error of small optical components. The systematic error of the sensor is compensated with a reference plane-wave system that produces almost perfect plane waves. Several types of lenses are tested using a point source that generates spherical waves emitted from a pinhole. The results of the optical testing obtained with the Shack- Hartman sensor are compared with those measured with Zygo interferometer.

• Journal of the Optical Society of Korea
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• v.10 no.1
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• pp.16-22
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• 2006

Wavefront sensing using a Shack-Hartmann sensor has been widely used for estimating wavefront errors or distortions. The sensor combines the local slopes, which are estimated from the centroids of each lenslet image, to give the overall wavefront reconstruction. It was previously shown that the pupil-plane irradiance profile effects the centroid estimation. Furthermore, a previous study reported that the reconstructed wavefront from a planar wavefront with a Gaussian pupil irradiance profile contains large focus and spherical aberration terms when there is a focus error. However, it has not been reported yet how seriously the pupil irradiance profiles, which can occur in practical applications, effect the sensing errors. This paper considered two cases when the irradiance profiles are not uniform: 1) when the light source is Gaussian and 2) when there is a partial interference due to a double reflection by a beam splitting element. The images formed by a Shack-Hartmann sensor were simulated through fast Fourier transform and were then supposed to be detected by a noiseless CCD camera. The simulations found that sensing errors, due to the Gaussian irradiance profile and the partial interference, were found to be smaller than RMS ${\lambda}/50$ when ${\lambda}$ is $0.6328\;{\mu}m$, which can be ignored in most practical cases where the reference and test beams have the same irradiance profiles.

• Journal of the Optical Society of Korea
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• v.20 no.3
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• pp.358-362
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• 2016

We present a new scheme for optical encryption of a binary image. In our method, the original binary data page is first divided into two identical pages. In each data page, the “on” and “off” pixels are represented by two discrete phases that are 90° apart. The first page corresponds to the phase conjugation of the second page, and vice versa. In addition, the wavefront of the two data pages is changed simultaneously from planar to spherical, for better encryption. The wavefront modification is represented by an extra phase shift, which is a function of position on the wavefront. In this way the two separate pages are both encrypted, and therefore the pages cannot be distinguished in a CCD. If the first page is used as an encrypted data page, then the second page is used as the decryption key, and vice versa. The decryption can be done by simply combining the two encrypted data pages. It is shown in our experiment that encryption and decryption can be fully accomplished in the optical domain.

• Korean Journal of Optics and Photonics
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• v.12 no.4
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• pp.270-275
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• 2001

We have studied effects of annular phase apodizer and bump shapes on the read-out signal in an optical disc system, using scalar diffraction theory. In order to detennine the optimum parameters of annular phase apodizer which will minimize the influence of spherical aberration, we defined WR as the ratio between the maximum wavefront aberration and some absolute value of wavefront aberration at any position r in the pupil. A cylindric bump, a semi-conic bump and a conic bump were$.$ also considered as different types of bump shape. As the radius and shape of bump varies, the read-out signal from an optical disc system with an annular phase apodizer was similar to that from an optical disc system without apodizer. When spherical aberration increases, the maximum read-out signal of an optical disc system with an annular phase apodizer and minimum bump radii giving read-out signal higher than 0.6 rarely varied. Especially, the optimum parameters at $W_R$ = 0.4 , 0.6 gave the most compensated effect of a spherical aberration.ration.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2002.10a
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• pp.474-480
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• 2002

Aspheric optical lenses and mirrors are widely used in recent. It is more difficult to manufacture and measure the aspherical optics compared to conventional spherical ones. The interferometric optical test is common for the measurement of spherical optical surface. But the application of the interferometry to the measurement of aspheric surface is difficult because it needs a precise null corrector and very careful environmental conditions such as keeping constant temperature, humidity, atmospheric pressure and vibrations. To enhance productivity of optics manufacturing on-machine measurement and correction has been developed in this study. For practical applications, robustness of the measurement method to environments is more important. For the purpose an optical OMM(On-Machine Measurement) system has been developed using Shack-Hartmann test which has robustness to the environment. The wavefront has been reconstructed from the measured data using the primary aberration polynomial function by least square fitting. The measured result of the developed only system gives the maximum deviation only in 200 nm from the result measured by a commercial Fizeau interferometer Wyko 6000.