• Title/Summary/Keyword: Specular

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Machinining of Specular Hologram using End-mill Technology (엔드밀 가공을 이용한 스페큘러 홀로그램 제작)

  • Jeon, Eun-Chae;Cha, Jin-Ho;Lee, Je-Ryung;Choi, Hwan-Jin;Kim, Chang-Eui;Je, Tae-Jin;Kim, Hwi;Choi, Doo-Sun
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.13 no.4
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    • pp.1-6
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    • 2014
  • The specular hologram is one type of hologram, and it consists of many arcs. They are very easy to fabricate and can even be machined by hand and a compass. In this study, we designed two squares having different depths and consisting of many arcs, after which we machined the arcs using end-mill technology. The width of the machined arcs showed high repeatability. Moving tracks were observed on the bottom surface, and top burrs were noted. In spite of them, the phenomenon of the specular hologram was observed when an observer and a light source stood on the same side. The two squares seemed to have different depths when they were observed from the left and right directions. In this study, it was verified that a specular hologram can be manufactured by end-mill technology.

Image Processing for 3-D Shape Estimation of Specular Reflection (경면반사체의 3차원 형상 추정을 위한 영상처리)

  • Kim, Jee-Hong;Cho, Byung-Gwon
    • Journal of the Institute of Electronics Engineers of Korea SC
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    • v.49 no.4
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    • pp.1-9
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    • 2012
  • A method to estimate the 3-D shape of surface with specular reflection is proposed, where the difference between the images reflected from a flat surface and a curved surface is used. First, we analyzed the geometry of the spatial reflection at specular surface and the variation of reflected light due to curved surface, whose results are used to estimate 3-D shape. The proposed method is shown to be effective via experiments using the illumination with spatially distributed light source and the CCD camera to capture the light reflected from a surface. In experiments, the captured images from curved surface with specular reflection are processed to approximately estimate 3-D shape.

A curvature profilometry using white-light (백색광을 이용한 곡률 측정법 개발)

  • Kim, Byoung-Chang
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.7 no.3
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    • pp.81-86
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    • 2008
  • I present a 3-D profiler specially devised for the profile measurement of specular surfaces that requires precision shape accuracy up to a few nanometer. A profile is reconstructed from the curvature of a test part of the surface at several locations along a line. The local curvature data are acquired with White-light Scanning Interferometry. Test measurement proves that the proposed profiler is well suited for the specular surface inspection like precision mirror.

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Determining 3D-shape of specular objects by using an encoded grid pattern light source

  • Ye, Xiongying;Fujimura, Sadao
    • 제어로봇시스템학회:학술대회논문집
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    • 1991.10b
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    • pp.1758-1763
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    • 1991
  • This paper describes a new method to determine the 3D-shape of objects consisting of specular planar surfaces. This method exploits a light source which is made of a diffuse plane with a grid pattern encoded in an M-sequence and uses a single image of the light source reflected by the objects to acquiring orientations and positions of the surfaces of the objects. When grid lines of the light source are reflected by a specular planar surface and perspectively projected on an image plane, a set of lines vanishing at a point are obtained on the image plane. The orientation of the specular planar surface is determined by using the vanishing point, and the position is determined by using the correspondence between lines on the image and lines on the light source, which is obtained by employing a characteristic regularity of the M-sequence. Before the vanishing points are calculated, the lines on the image are classified and correlated with the surfaces of objects by using slopes and positions of the lines and the regularity of the M-sequence. This method requires only a single image.

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Individual Tooth Image Segmentation with Correcting of Specular Reflections (치아 영상의 반사 제거 및 치아 영역 자동 분할)

  • Lee, Seong-Taek;Kim, Kyeong-Seop;Yoon, Tae-Ho;Lee, Jeong-Whan;Kim, Kee-Deog;Park, Won-Se
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.59 no.6
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    • pp.1136-1142
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    • 2010
  • In this study, an efficient removal algorithm for specular reflections in a tooth color image is proposed to minimize the artefact interrupting color image segmentation. The pixel values of RGB color channels are initially reversed to emphasize the features in reflective regions, and then those regions are automatically detected by utilizing perceptron artificial neural network model and those prominent intensities are corrected by applying a smoothing spatial filter. After correcting specular reflection regions, multiple seeds in the tooth candidates are selected to find the regional minima and MCWA(Marker-Controlled Watershed Algorithm) is applied to delineate the individual tooth region in a CCD tooth color image. Therefore, the accuracy in segmentation for separating tooth regions can be drastically improved with removing specular reflections due to the illumination effect.

Iridescent Specular Structural Colors of Two-Dimensional Periodic Diffraction Gratings

  • Yoon, Kyungsik;Choi, Sujin;Paek, Jeongyeup;Im, Dajeong;Roh, Jinyoung;Kwon, Jaebum;Kim, Hwi
    • Journal of the Optical Society of Korea
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    • v.18 no.5
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    • pp.616-622
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    • 2014
  • Specular structural colors generated by two-dimensional periodic binary gratings are investigated theoretically. An approximate mathematical model of the grating specular structural colors is described, based on scalar nonparaxial diffraction theory, and the functional relationships of specular structural color and structural parameters of gratings are analyzed. Through this, the optimal condition for maximizing the color-representation range in the standard CIE 1931 chromaticity diagram is derived.

Measurement of Wafer Deformation using Deflectometry (편향법을 이용한 웨이퍼 변형 측정)

  • Lee, Hodong;Shin, Sanghoon;Yu, Younghun
    • Korean Journal of Optics and Photonics
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    • v.24 no.6
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    • pp.324-330
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    • 2013
  • Phase-measuring deflectometry is a full-field gradient measuring technique that lends itself very well to testing specular optical surfaces. We have measured deformation of a large specular surface by deflectometry. In this work, we have used a Fourier-transform method to get the phase from a measured deformed fringe pattern, and we have used least squares method to obtain the height information of the specular surface from the calculated slope. Experimentally, we have confirmed that deflectometry can be used for deformation measurement of a specular surface like that of a wafer.

Magnetoresistance of IrMn-Based Spin Filter Specular Spin Valves (IrMn 스핀필터 스페큘라 스핀밸브의 자기저항 특성)

  • Hwang, J.Y.;Rhee, J.R.
    • Journal of the Korean Magnetics Society
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    • v.14 no.6
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    • pp.236-239
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    • 2004
  • We studied the specular spin valve (SSV) having the spin filter layer (SFL) in contact with the ultrathin free layer composed of Ta3/NiFe2/IrMn7/CoFel/(NOLl)/CoFe2/Cu1.8/CoFe( $t_{F}$)/Cu( $t_{SF}$ )/(NOL2)/Ta3.5 (in nm) by the magnetron sputtering system. For this antiferromagnetic I $r_{22}$M $n_{78}$-pinned spin filter specular spin valve (SFSSV) films, an optimal magnetoresistance (MR) ratio of 11.9% was obtained when both the free layer thickness ( $t_{F}$) and the SFL thickness ( $t_{SF}$ ) were 1.5 nm, and the MR ratio higher than 11% was maintained even when the $t_{F}$ was reduced to 1.0 nm. It was due to increase of specular electron by the nano-oxide layer (NOL) and of current shunting through the SFL. Moreover, the interlayer coupling field ( $H_{int}$) between free layer and pinned layer could be explained by considering the RKKY and magnetostatic coupling. The coercivity of the free layer ( $H_{cf}$ ) was significantly reduced as compared to the traditional spin valve (TSV), and was remained as low as 4 Oe when the $t_{F}$ varied from 1 nm to 4 urn. It was found that the SFL made it possible to reduce the free layer thickness and enhance the MR ratio without degrading the soft magnetic property of the free layer.