• Journal of the Korean Institute of Telematics and Electronics D
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• v.36D no.2
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• pp.55-61
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• 1999

A soft error rate (SER) simulator for DRAM was developed. In comparison to the other SER simulator using device simulator or Monte Carlo simulator, the proposed simulator substantially reduced the CPU time using an analytical model for the alpha-particle-induced charge collection. By analysing the soft error modes in DRAM, the bit-bar mode was identified as the main cause of soft error. Using the new SER simulator, SER of 256M DRAM was investigated and it was found that the storage capacitance had a 5fF margin.

• Proceedings of the Korean Society Of Semiconductor Equipment Technology
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• 2005.05a
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• pp.63-66
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• 2005

A soft error rate neutrons is a growing problem for integrated circuits with technology scaling. In the acceleration test with high-density neutron beam, a latch-up prohibits accurate estimations of the soft error rate (SER). This paper presents results of analysis for the latch-up characteristics in the circumstance corresponding to the acceleration SER test for SRAM. Simulation results, using a two-dimensional device simulator, show that the deep p-well structure has better latch-up Immunity compared to normal twin and triple well structures. In addition, it is more effective to minimize the distance to ground power compared with controlling a path to the $V_{DD}$ power.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.6 no.1
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• pp.54-57
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• 2005

A soft error rate neutrons is a growing problem fur terrestrial integrated circuits with technology scaling. In the acceleration test with high-density neutron beam, a latch-up prohibits accurate estimations of the soft error rate (SER). This paper presents results of analysis for the latch-up characteristics in the circumstance corresponding to the acceleration SER test for SRAM. Simulation results, using a two-dimensional device simulator, show that the deep p-well structure has better latch-up immunity compared to normal twin and triple well structures. In addition, it is more effective to minimize the distance to ground power compared with controlling a path to the $V_{DD}$ power.

• Proceedings of the KAIS Fall Conference
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• 2004.11a
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• pp.203-205
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• 2004

A soft error rate neutrons is a growing problem for terrestrial integrated circuits with technology scaling. In the acceleration test with high-density neutron beam, a latch-up prohibits accurate estimations of the soft error rate (SER). This paper presents results of analysis for the latch-up characteristics in the circumstance corresponding to the acceleration SER test for SRAM. Simulation results, using a two-dimensional device simulator, show that the deep p-well structure has better latch-up immunity compared to normal twin and triple well structures. In addition, it is more effective to minimize the distance to ground power compared with controlling a path to the $V_{DD}$ power.

• Nuclear Engineering and Technology
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• v.55 no.5
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• pp.1559-1566
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• 2023

This study developed a quasi-monoenergetic neutron source (QMN) for the semiconductor device's soft error rate test (SER). Quasi-monoenergetic neutrons are generated by ⁹Be(p, n)⁹B nuclear reaction with a 1 mm beryllium target and 30 MeV protons from a cyclotron. An 8 mm water in the back of the beryllium target is used for avoiding proton penetration. The neutron spectra simulated by MCNP showed that the peak energy was around 26.5 MeV. The heat flow and mechanical properties are numerically analyzed, and the safe operating conditions are therefore determined.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.35 no.5A
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• pp.431-439
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• 2010

In this paper, multiple-relay cooperative communication network with multiple antennas is considered. Applying the soft-decision-and-forward protocol to this system, pairwise error probability(PEP) is derived and then symbol error rate(SER) is also calculated. However, in general, signals are transmitted through the orthogonal channel in the multiple-relay cooperative communication network for the prevention of interference, which is inefficient in terms of the throughput. For the improvement of throughput, the relay selection is considered, where the relay having the maximum instantaneous end-to-end signal-to-noise ratio is chosen. Performance of the system is analyzed in terms of PEP and SER. As the number of the relay increases, relay selection method outperforms the conventional multiple-relay transmission system where all relays participate in the second time slot.