• Journal of radiological science and technology
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• v.44 no.5
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• pp.465-471
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• 2021

Dual-energy X-ray imaging (DEI) techniques can provide X-ray images that a certain material is suppressed or emphasized by combining two X-ray images obtained from two different x-ray spectrum. In this paper, a single-shot DEI, which uses stacked two detectors (i.e., multilayer detector), is proposed to reduce the patient dose and increase throughput in angiography. The polymethyl methacrylate (PMMA) and aluminum (Al) were selected as two basis materials for material decomposition, and material-specific images are reconstructed as a vector combination of these two materials. We investigate the contrast and noise performance of material-decomposed images using iodine phantoms with various concentrations and diameters. The single-shot DEI shows comparable performances to the conventional dual-shot DEI. In particular, the single-shot DEI shows edge enhancement in material-decomposed images due to the different spatial-resolution characteristics of upper and lower detectors. This study could be useful for designing the multilayer detector including scintillators and energy-separation filter for angiography purposes.

• Journal of Radiation Industry
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• v.9 no.3
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• pp.137-141
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• 2015

A single-shot dual-energy x-ray imaging technique has been developed using a sandwich detector by stacking two detectors, in which the front and rear detectors respectively produce relatively lower and higher x-ray energy images. Each detector layer is composed of a phosphor screen coupled with a photodiode array. The front detector layer employs a thinner phosphor screen, whereas the rear detector layer employs a thicker phosphor screen considering the quantum efficiency for x-ray photons with higher energies. We have applied the proposed method into the inspection of printed circuit boards, and obtained dual-energy images with background clutter suppressed. In addition, the single-shot dual-energy method provides sharper-edge images than the conventional radiography because of the unsharp masking effect resulting from the use of different thickness phosphors between the two detector layers. It is promising to use the single-shot dual-energy x-ray imaging for high-resolution nondestructive testing. For the reliable use of the developed method, however, more quantitative analysis is further required in comparisons with the conventional method for various types of printed circuit boards.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.11 no.9
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• pp.3517-3523
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• 2010

Single exposure dual X-ray imaging can be used to separate soft and dense-material images for medical and industrial applications. This study keep focusing baggage inspection system(BIS) specifically. New detector modules for single exposure dual X-ray imaging are consisted of low energy detector (LED) and high energy detector (HED). First, the optimized thickness of copper filter coupled HED to separate low energy and high energy was simulated by the given X-ray energy (140 kVp, 1 mA) using Monte Carlo simulation codes, MCNPX. So as a result of simulation, the copper filter thickness is 0.7 mm. For the design of PIN photodiode, ATLAS device simulation tool was used. 16 channels PIN photodiode of 1.5 mm ${\times}$ 3.2 mm for Dual X-ray imaging detector was fabricated in the process of ETRI. And its dark current and quantum efficiency, terminal capacitance were measured. It was proven that the Lanex Fast B coupled HED were a sufficient candidate to replace the CsI(Tl) commerced in dual X-ray system, since these give a strong signal, overcoming system noise. Finally dual X-ray image was acquired through correction of the LED X-ray Image and the HED X-ray Image.