• 제목/요약/키워드: Single crystalline

검색결과 680건 처리시간 0.03초

MOD-TFA법에 의한 YBCO 박막의 제조 (Preparation of YBCO thin films by MOD-TFA process)

  • 김영국;유재무;고재웅;허순영;이동철
    • Progress in Superconductivity
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    • 제5권1호
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    • pp.80-83
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    • 2003
  • Superconducting YBCO thin films are fabricated on single-crystalline substrates by Metallo-organic Depostion process employing Trifluoroacetic acid as a chelating agent (MOD-TFA). (100)-oriented single crystalline LaAlO$_3$ substrates were employed to grow superconducting film with high crystallinity. The fully processed YBCO thin films were characterized with XRD, SEM, EDS, etc. The microstructures of YBCO thin films show labyrinth-like patterns. The origin of this microstructure was delineated by compositional inhomogeneity during the MOD process and it was shown that the microstructure may be modified by additives. In this work, effects of additives on the microstructures and electrical properties of YBCO thin films have been investigated.

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바이오칩 제작 장치용 단결정 실리콘 마이크로 미러 어레이의 설계와 제작 (Design and fabrication of a single crystalline silicon micromirror array for biochip fabrication systems)

  • 장윤호;이국녕;김용권
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2003년도 추계학술대회 논문집 전기물성,응용부문
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    • pp.49-52
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    • 2003
  • Single crystalline silicon (SCS) was adopted for a reliable micromirror array of biochip fabrication applications. SCS has excellent mechanical properties and smooth surface, which is the best material for micromirror devices. The mirror array has $16{\times}16$ micromirrors and each mirror has a $120{\mu}m{\times}100{\mu}m$ reflective surface. The micromirror has simple torsional beam springs and electrostatic force was used for driving. The designed tilting angle was $9.6^{\circ}$, and the tilting angles were measured according to applied voltages. The surface roughness was measured by a laser profiler. The response time was measured using He-Ne laser and position sensitive diode (PSD), and the lifetime was checked for reliability proof.

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비정질 수정과 실리콘 마이크로 캔틸레버 구조물의 Q-factor 비교 연구 (A comparative study on Q-factors of fused quartz and silicon micro cantilevers)

  • 송은석;김용권;백창욱
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2009년도 제40회 하계학술대회
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    • pp.1505_1506
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    • 2009
  • In this paper, micro cantilevers which are made of two different materials - fused quartz and single crystalline silicon - and have similar dimensions were fabricated and their mechanical Q-factors were evaluated to compare intrinsic damping properties of those two materials. Resonant frequencies and Q-factors were measured for the cantilevers having fixed widths and thicknesses, and different lengths. The measured Q-values are in a range of 64,000 - 108,000 for fused quartz cantilevers, and 31,000 - 35,000 for silicon cantilevers, respectively. Experimental results support high Q-factors of fused quartz compared to single crystalline silicon due to its good intrinsic damping properties.

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양극산화 알루미나 주형 기반의 전해 증착법을 이용한 구리 나노선의 합성 및 특성 연구 (Synthesis and Characterization of Cu Nanowires Using Anodic Alumina Template Based Electrochemical Deposition Method)

  • 이영인;좌용호
    • 한국분말재료학회지
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    • 제19권5호
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    • pp.367-372
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    • 2012
  • Single crystalline Cu nanowires with controlled diameters and aspect ratios have been synthesized using electrochemical deposition within confined nanochannels of a porous anodic aluminium oxide(AAO) template. The diameters of nano-sized cylindrical pores in AAO template were adjusted by controlling the anodization conditions. Cu nanowires with diameters of approximately 38, 99, 274 nm were synthesized by the electrodeposition using the AAO templates. The crystal structure, morphology and microstructure of the Cu nanowires were systematically investigated using XRD, FE-SEM, TEM and SAED. Investigation results revealed that the Cu nanowires had the controlled diameter, high aspect ratio and single crystalline nature.

$Ar^+$ ion laser를 이용한 단결정/다결정 Si 식각 특성 분석 (Analysis of single/poly crystalline Si etching characteristics using $Ar^+$ ion laser)

  • 이현기;박정호;이천
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1998년도 추계학술대회 논문집 학회본부 C
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    • pp.1001-1003
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    • 1998
  • In this paper, $Ar^+$ ion laser etching process of single/poly crystalline silicon with $CCl_{2}F_{2}$ gas is studied for MEMS applications. To investigate the effects of process parameters, laser power, gas pressure, scanning speed were varied and multiple scanning was carried out to obtain high aspect ratio. In addition, scanning width was varied to observe the trench profile etched in repeating scanning cycle. From the etching of $2.6{\mu}m$ thick polycrystalline Si deposited on insulator, trench with flat bottom and vertical side wall was obtained and it is possible to apply this results for MEMS applications.

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정보통신 소자 응용을 위한 단결정 실리콘 마이크로 미러 어레이 (Single crystalline silicon micyomirror array for data communication applications)

  • 장윤호;이국녕;김용권
    • 한국정보통신설비학회:학술대회논문집
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    • 한국정보통신설비학회 2003년도 하계학술대회
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    • pp.93-95
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    • 2003
  • We have designed and fabricated a micromirror array using single crystalline silicon (SCS) for data communication applications. The mirror array has $16{\times}16$ micromirrors and each mirror has $120{\mu}m{\times}100{\mu}m$ reflective surface. Electrostatic force was adopted as a driving mechanism. The spring dimensions were determined using relationship between spring dimensions and driving voltage. The designed tilting angle was $9.6^{\circ}$, and measured tilting angle according to applied voltages were experimented. The response time was measured using He-Ne laser and position sensitive diode (PSD), and lifetime was checked for reliability proof.

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Design and Analysis of GAIVAE System and Application to the Growth of Semiconductor Thin Films -On the Growth of GaAs on Si-

  • Kang, Ey-Goo;Sung, Man-Young;Park, Sung-Hee
    • Journal of Electrical Engineering and information Science
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    • 제3권1호
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    • pp.110-116
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    • 1998
  • A single-crystalline epitaxial film of GaAs has been grown on Si using a gs assisted-ionized vapour beam eptaxial technique. The native oxide layer on the silicon substrate was removed at 550$^{\circ}C$ by use of an accelerated arsenic ion beam, instead of a high-temperature desorption. During the growth the substrate temperature was maintained at 550$^{\circ}C$. Transmission electron microscopy and electron diffraction data suggest that the GaAs layer is an epitaxially grown single-crystalline layer. The possibility of growing device quality GaAs on Si is able demonstrated through fabrication of GaAs MODFET on Si substrates.

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$TaSi_2$ 형성시 단결정 실리콘 기판에 이온주입된 $BF_2$의 거동 (The Behavior of $BF_2$ Implanted Single Crystalline Si Substrates During the Formation of $TaSi_2$)

  • 조현춘;양희준;최진석;백수현
    • 전자공학회논문지A
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    • 제28A권10호
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    • pp.814-820
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    • 1991
  • TaSi$_2$ was formed by rapid thermal annealing(RTA) on BF$_2$ doped single crystalline silicon substrates. The formation and various properties of TaSi$_2$ have been investigated by using 4-point probe, HP414, XRD, and SEM. And the redistribution of boron with RTA has been observed by SIMS. Implanted boron was diffused out into the TaSi$_2$ for RTA temperature but did not significantly affect the formation temperature of TaSi$_2$. Also, the contact resistance for TaSi$_2$/p$^{+}$ region had a low value 22$\Omega$, at contact size of 0.9$\mu$m, and the native oxide formed on Si-substrates by BF$_2$ implantation retarded the formation of TaSi$_2$.

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The Periods of Shubnikov-de Haas Oscillations in an Individual Single-Crystalline Bi Nanowire Grown by On-Film Formation of Nanowires

  • Kim, Jeong-Min;Ham, Jin-Hee;Lee, Seung-Hyun;Lee, Woo-Young
    • 한국자기학회:학술대회 개요집
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    • 한국자기학회 2010년도 임시총회 및 하계학술연구발표회
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    • pp.80-81
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    • 2010
  • We observed period of SdH oscillation in an individual Bi nanowire with the transverse and longitudinal magnetic fields along the axis of the nanowire grown by OFF-ON. Our results provide good qualitative description of the cyclotron behavior of the single-crystalline Bi nanowire in the ballistic regime.

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단결정 구리 나노와이어의 굽힘 특성 (Bending Characteristics of Single Crystalline Copper Nanowires)

  • 정광섭;조맹효
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2008년도 추계학술대회A
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    • pp.1896-1901
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    • 2008
  • Single crystalline copper nanowires are subjected to bending tests using molecular dynamics simulations and the embedded atom method. To observe behaviors of nanowire, bending tests are performed for various rates of deflection and different boundary conditions: fixed-free and fixed-fixed. When the deflection of nanowire becomes large, twinnings and dislocations appear, and <100> crystal structure transforms to <110>. At high rates, phase transformation occurs in whole nanowire. But, at low rates, atomic structure changes to <110> phase partially. The final deformed structures are affected by the rate of deflection and boundary conditions. These effects can be important design parameters at nanoscale.

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