• Title/Summary/Keyword: Simple X-ray

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Energy Spectrum Measurement of High Power and High Energy (6 and 9 MeV) Pulsed X-ray Source for Industrial Use

  • Takagi, Hiroyuki;Murata, Isao
    • Journal of Radiation Protection and Research
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    • v.41 no.2
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    • pp.93-99
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    • 2016
  • Background: Industrial X-ray CT system is normally applied to non-destructive testing (NDT) for industrial product made from metal. Furthermore there are some special CT systems, which have an ability to inspect nuclear fuel assemblies or rocket motors, using high power and high energy (more than 6 MeV) pulsed X-ray source. In these case, pulsed X-ray are produced by the electron linear accelerator, and a huge number of photons with a wide energy spectrum are produced within a very short period. Consequently, it is difficult to measure the X-ray energy spectrum for such accelerator-based X-ray sources using simple spectrometry. Due to this difficulty, unexpected images and artifacts which lead to incorrect density information and dimensions of specimens cannot be avoided in CT images. For getting highly precise CT images, it is important to know the precise energy spectrum of emitted X-rays. Materials and Methods: In order to realize it we investigated a new approach utilizing the Bayesian estimation method combined with an attenuation curve measurement using step shaped attenuation material. This method was validated by precise measurement of energy spectrum from a 1 MeV electron accelerator. In this study, to extend the applicable X-ray energy range we tried to measure energy spectra of X-ray sources from 6 and 9 MeV linear accelerators by using the recently developed method. Results and Discussion: In this study, an attenuation curves are measured by using a step-shaped attenuation materials of aluminum and steel individually, and the each X-ray spectrum is reconstructed from the measured attenuation curve by the spectrum type Bayesian estimation method. Conclusion: The obtained result shows good agreement with simulated spectra, and the presently developed technique is adaptable for high energy X-ray source more than 6 MeV.

A comparative study on keypoint detection for developmental dysplasia of hip diagnosis using deep learning models in X-ray and ultrasound images (X-ray 및 초음파 영상을 활용한 고관절 이형성증 진단을 위한 특징점 검출 딥러닝 모델 비교 연구)

  • Sung-Hyun Kim;Kyungsu Lee;Si-Wook Lee;Jin Ho Chang;Jae Youn Hwang;Jihun Kim
    • The Journal of the Acoustical Society of Korea
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    • v.42 no.5
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    • pp.460-468
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    • 2023
  • Developmental Dysplasia of the Hip (DDH) is a pathological condition commonly occurring during the growth phase of infants. It acts as one of the factors that can disrupt an infant's growth and trigger potential complications. Therefore, it is critically important to detect and treat this condition early. The traditional diagnostic methods for DDH involve palpation techniques and diagnosis methods based on the detection of keypoints in the hip joint using X-ray or ultrasound imaging. However, there exist limitations in objectivity and productivity during keypoint detection in the hip joint. This study proposes a deep learning model-based keypoint detection method using X-ray and ultrasound imaging and analyzes the performance of keypoint detection using various deep learning models. Additionally, the study introduces and evaluates various data augmentation techniques to compensate the lack of medical data. This research demonstrated the highest keypoint detection performance when applying the residual network 152 (ResNet152) model with simple & complex augmentation techniques, with average Object Keypoint Similarity (OKS) of approximately 95.33 % and 81.21 % in X-ray and ultrasound images, respectively. These results demonstrate that the application of deep learning models to ultrasound and X-ray images to detect the keypoints in the hip joint could enhance the objectivity and productivity in DDH diagnosis.

Microlens Micro V-groove Fabrication by the Modified LIGA Process (변형 DEEP X-ray를 이용한 마이크로 렌즈 및 V-groove 제작)

  • 이정아;이승섭;전병희
    • Transactions of Materials Processing
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    • v.13 no.3
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    • pp.290-295
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    • 2004
  • Mircolens and microlens V-groove are realized using a novel fabrication technology based on the exposure of a resist, usually PMMA, to deep X-rays and subsequent thermal treatment and inclined deep X-ray lithography, respectively. The fabrication technology is very simple and produces microlenses and microlens V-groove with good surface roughness of several nm. The molecular weight and glass transition temperature of PMMA is reduced when it is irradiated with deep X-rays. The microlenses were produced through the effects of volume change, surface tension, and reflow during thermal treatment of irradiated PMMA. Microlenses were produced with diameters ranging from 30 to $1500\mu\textrm{m}$. The surface X-ray mask is also fabricated to realize microlens arrays on PMMA sheet with a large area. The size of the micro V-groove is fabricated in the range of 12~$60\mu\textrm{m}$.

Development of a Novel Fabrication Process for Multi-layered Microstructures using a Micro Milling and Deep X-ray Lithography (마이크로 밀링과 X-선 리소그래피 공정을 이용한 다층 마이크로 구조물 제작 공정 개발)

  • Kim, Jong Hyun;Chang, Suk Sang;Lim, Geunbae
    • Journal of the Korean Society for Precision Engineering
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    • v.31 no.3
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    • pp.269-275
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    • 2014
  • Conventional machining technologies such as a milling process have limitations in accuracy to fabricate microstructures. Deep X-ray lithography using the synchrotron radiation is a promising micromachining process with an excellent accuracy, whereas there are difficulties in the fabrication of multi-layered structures. Therefore, it is mainly used for fabricating simple mono-layered microstructures with a high aspect ratio. In this study, a novel technology for fabricating multi-layered microstructures is proposed by combining two processes. In advance, an X-ray resist material is cut and machined into various shapes and heights by the micro milling process. Subsequent X-ray irradiation process facilitates the fabrication of multi-layered microstructures. The proposed technology can overcome the limitation of the pattern accuracy in conventional milling process and the difficulty of the multi-layered machining in x-ray process. The usefulness of the proposed technology is demonstrated in this study by applying the technique in the realization of various multi-layered microstructures.

DESIGN OF A RISE TIME DISCRIMINATION CIRCUIT FOR X-RAY PROPORTIONAL COUNTER (X-선 비례계수관용 상승시간 선별회로 제작)

  • 남욱원;최철성
    • Journal of Astronomy and Space Sciences
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    • v.12 no.1
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    • pp.66-77
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    • 1995
  • It is possible to distinguish X-ray events from non X-ray events in proportional conters using the method of rise time discrimination (RTD). In order to subtract non X-ray background, we have developed a simple RTD circuit which will be applied to the proportional counter planned for a sounding rocket experiment. The entire circuit consists of two parts ; the rise time measurement circuit and the time to amplitude conversion circuit which includes the self-calibration mode. From the test with X-ray detecting system, we obtained that the background can be rejected more than 80% in the energy band 2∼12 keV. However we confirmed that the RDT method is not proper to be used for the energy range above 12kV.

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The Compound Refractive Lens for Hard X-ray Focusing

  • Choi, J.;Jung, J.;Park, S.;Kwon, T.
    • Journal of the Optical Society of Korea
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    • v.11 no.2
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    • pp.76-81
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    • 2007
  • The compound refractive X-ray lens (CRL) for focusing hard X-rays is investigated to determine the parameters such as the focal length, the focal spot size, and spatial distribution at the focal spot using a simple theoretical calculations and CRLs fabricated by the self-assembly method. The number of individual compound lenses are defined for the given focal length of 1 m. The X-ray energy of 1 to 40 keV is used in the calculations. The CRL for focusing hard X-rays which generated from the X-ray tube is fabricated by nanoparticle-polymer composite in the form of circular concaves. The self-assembly method is applied to form the nanoaluminum-poly (methly meth-acrylate) composite and carbon-polymer composite CRL lenses. Aluminum nanoparticles of 100 nm and carbon microparticles are diffused in the polymer solution then the high gravity up to 6000G is applied in it to form the concave lens shape. X-ray energy at 8 keV is used for characterization of the composite CRLs. The FWHM of intensity for the fabricated nanoaluminium composite CRL system, N=10 is measured as 1.8 mm, which would give about $70{\mu}m$ in FWHM at 1 m of the focal length.

Development of Acanthial Parieto Projection for Maxillary Diagnosis in X-ray Paranasal Sinuses (X-ray 코곁굴 검사에서 위턱굴 진단을 위한 비극-두정방향 촬영법 개발)

  • Byung-Ju Ahn;Yong-Wan Kim;In-Soo Kim
    • Journal of the Korean Society of Radiology
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    • v.17 no.3
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    • pp.327-333
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    • 2023
  • In Order to Diagnose Maxillary Bone and Maxillary Sinus in the X-Ray Paranasal Sinus Projection test, this Study used Skull Rando Phantom to Change the Posture and X-ray tube Angle to 5° of the Head or 5° of ROC Who worked for more than 10 years. The Significance of the Evaluated score was Verified through SPSS Ver. 3.0, and the Cronbach value was Significantly higher at 0.712. In addition, as a Result of Calculating SNR by Setting the ROI(Receiver Operation Characteristic) of the Maxillary bone and Maxillary sinus images, it was the Highest at 6,449 in the Examination by tilting 5° toward the Head or Leg of the X-ray tube. In the study, it is believed that among the X-Ray simple Paranasal Sinus projection tests, a sharp Image can be Obtained during the Examination by Tilting the X-ray tube 5° toward the Head or Leg.

Metal Area Segmentation in X-ray CT Images Using the RNA (Relevant Neighbor Ar ea) Principle

  • Kim, Youngshin;Kwon, Hyukjoon;Kim, Joongkyu;Yi, Juneho
    • Journal of Korea Multimedia Society
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    • v.15 no.12
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    • pp.1442-1448
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    • 2012
  • The problem of Metal Area Segmentation (MAS) in X-ray CT images is a very hard task because of metal artifacts. This research features a practical yet effective method for MAS in X-ray CT images that exploits both projection image and reconstructed image spaces. We employ the Relevant Neighbor Area (RNA) idea [1] originally developed for projection image inpainting in order to create a novel feature in the projection image space that distinctively represents metal and near-metal pixels with opposite signs. In the reconstructed result of the feature image, application of a simple thresholding technique provides accurate segmentation of metal areas due to nice separation of near-metal areas from metal areas in its histogram.

The analysis and design of X-ray cross sectional imaging system for PCB solder joint inspection (PCB 납땜 검사를 위한 X선 단층 영상 시스템의 해석 및 설계)

  • 노영준;강성택;김형철;김성권
    • 제어로봇시스템학회:학술대회논문집
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    • 1996.10b
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    • pp.109-112
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    • 1996
  • The more integrated and smaller SMD are needed, new solder joints packaging technologies are developed in these days such as BGA(Ball Grid Array), Flip Chip, J-lead etc. But, it's unable to inspect solder joints in those devices by visual inspection methods, because they are hided by it's packages. To inspect those new SMD packages, an X-ray system for acquiring a cross-sectional image of a arbitrary plane is necessary. In this paper, an analysis for designing X-ray cross sectional imaging system is presented including the way for correcting the distortion of image intensifier. And we show computer simulation of that system with a simple PCB model to show it's usefulness in applying PCB solder joint inspection.

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X-Ray Fluorescence Analysis of $Ta_2O_5,\;Nb_2O_5$ and ZrO_2$ in Tin-Slag Samples using Simple Dilution Method (주석 슬랙중 $Ta_2O_5,\;Nb_2O_5$ZrO_2$의 단일희석법을 이용한 X-선 형광분석)

  • Young-Sang Kim;Hak Je Sung
    • Journal of the Korean Chemical Society
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    • v.28 no.5
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    • pp.293-301
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    • 1984
  • -ray fluorescence analysis of $Ta_2O_5$, $Nb_2O_5$ and $ZrO_2$ in tin-slag samples using the simple dilution method was studied. The method is to correct mathematically the calibration curve to the linear line by the dilution. One synthesized standard having similar composition to the sample and tin slag samples were diluted with anhydrous $Li_2B_4O_7$ at the level of 1%, 2% and 3% of the sample content respectively. The diluted samples were fused at $1150^{\circ}C$ for 30 minutes and these glass beads were finely ground and pelletized. Measuring the X-ray intensities with these pellets, analytical results were calculated by the equation derived from J. Scherman's equation for the characteristic X-ray intensity of an element. Analytical results agreed with the reference values obtained by the standard calibration method within allowable error range and were reproducible.

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