• Title/Summary/Keyword: Semiconductor Microlithography

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Fabrication of Optical Micro-Encoder Chips for Sub-Micron Displacement Measurements (발광다이오드를 이용한 초정밀 변위 측정용 마이크로 엔코더 칩 제작)

  • Kim, Keun-Joo;Kim, Yun-Goo
    • Journal of the Korean Society for Precision Engineering
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    • v.16 no.2 s.95
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    • pp.74-81
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    • 1999
  • The integrated chip of optical micro-encoder was fabricated and the feasibility as displacement measurement device was confirmed. The geometry of micro-encoder was designed to utilize the optical interference effect on the second order of diffracted beams. The hybrid-type micro-encoder consisted with light emitting diode, photodiode, polyimide wave-guide and micro-lens provides stable micro-encoding results for high speed displacements. The measurement shows the resolution of displacement of 1.00 +/- 0.02 ${\mu}m$ for the grating with scale pitch of 2.0${\mu}m$.

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