• 제목/요약/키워드: Semi-supervised Learning

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제조 공정 결함 탐지를 위한 MixMatch 기반 준지도학습 성능 분석 (Performance Analysis of MixMatch-Based Semi-Supervised Learning for Defect Detection in Manufacturing Processes)

  • 김예준;정예은;김용수
    • 산업경영시스템학회지
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    • 제46권4호
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    • pp.312-320
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    • 2023
  • Recently, there has been an increasing attempt to replace defect detection inspections in the manufacturing industry using deep learning techniques. However, obtaining substantial high-quality labeled data to enhance the performance of deep learning models entails economic and temporal constraints. As a solution for this problem, semi-supervised learning, using a limited amount of labeled data, has been gaining traction. This study assesses the effectiveness of semi-supervised learning in the defect detection process of manufacturing using the MixMatch algorithm. The MixMatch algorithm incorporates three dominant paradigms in the semi-supervised field: Consistency regularization, Entropy minimization, and Generic regularization. The performance of semi-supervised learning based on the MixMatch algorithm was compared with that of supervised learning using defect image data from the metal casting process. For the experiments, the ratio of labeled data was adjusted to 5%, 10%, 25%, and 50% of the total data. At a labeled data ratio of 5%, semi-supervised learning achieved a classification accuracy of 90.19%, outperforming supervised learning by approximately 22%p. At a 10% ratio, it surpassed supervised learning by around 8%p, achieving a 92.89% accuracy. These results demonstrate that semi-supervised learning can achieve significant outcomes even with a very limited amount of labeled data, suggesting its invaluable application in real-world research and industrial settings where labeled data is limited.

스마트폰 로봇의 위치 인식을 위한 준 지도식 학습 기법 (Semi-supervised Learning for the Positioning of a Smartphone-based Robot)

  • 유재현;김현진
    • 제어로봇시스템학회논문지
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    • 제21권6호
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    • pp.565-570
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    • 2015
  • Supervised machine learning has become popular in discovering context descriptions from sensor data. However, collecting a large amount of labeled training data in order to guarantee good performance requires a great deal of expense and time. For this reason, semi-supervised learning has recently been developed due to its superior performance despite using only a small number of labeled data. In the existing semi-supervised learning algorithms, unlabeled data are used to build a graph Laplacian in order to represent an intrinsic data geometry. In this paper, we represent the unlabeled data as the spatial-temporal dataset by considering smoothly moving objects over time and space. The developed algorithm is evaluated for position estimation of a smartphone-based robot. In comparison with other state-of-art semi-supervised learning, our algorithm performs more accurate location estimates.

Semi-Supervised Learning Using Kernel Estimation

  • Seok, Kyung-Ha
    • Journal of the Korean Data and Information Science Society
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    • 제18권3호
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    • pp.629-636
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    • 2007
  • A kernel type semi-supervised estimate is proposed. The proposed estimate is based on the penalized least squares loss and the principle of Gaussian Random Fields Model. As a result, we can estimate the label of new unlabeled data without re-computation of the algorithm that is different from the existing transductive semi-supervised learning. Also our estimate is viewed as a general form of Gaussian Random Fields Model. We give experimental evidence suggesting that our estimate is able to use unlabeled data effectively and yields good classification.

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준지도학습 기반 반도체 공정 이상 상태 감지 및 분류 (Semi-Supervised Learning for Fault Detection and Classification of Plasma Etch Equipment)

  • 이용호;최정은;홍상진
    • 반도체디스플레이기술학회지
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    • 제19권4호
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    • pp.121-125
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    • 2020
  • With miniaturization of semiconductor, the manufacturing process become more complex, and undetected small changes in the state of the equipment have unexpectedly changed the process results. Fault detection classification (FDC) system that conducts more active data analysis is feasible to achieve more precise manufacturing process control with advanced machine learning method. However, applying machine learning, especially in supervised learning criteria, requires an arduous data labeling process for the construction of machine learning data. In this paper, we propose a semi-supervised learning to minimize the data labeling work for the data preprocessing. We employed equipment status variable identification (SVID) data and optical emission spectroscopy data (OES) in silicon etch with SF6/O2/Ar gas mixture, and the result shows as high as 95.2% of labeling accuracy with the suggested semi-supervised learning algorithm.

Semi-supervised regression based on support vector machine

  • Seok, Kyungha
    • Journal of the Korean Data and Information Science Society
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    • 제25권2호
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    • pp.447-454
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    • 2014
  • In many practical machine learning and data mining applications, unlabeled training examples are readily available but labeled ones are fairly expensive to obtain. Therefore semi-supervised learning algorithms have attracted much attentions. However, previous research mainly focuses on classication problems. In this paper, a semi-supervised regression method based on support vector regression (SVR) formulation that is proposed. The estimator is easily obtained via the dual formulation of the optimization problem. The experimental results with simulated and real data suggest superior performance of the our proposed method compared with standard SVR.

Improve the Performance of Semi-Supervised Side-channel Analysis Using HWFilter Method

  • Hong Zhang;Lang Li;Di Li
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • 제18권3호
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    • pp.738-754
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    • 2024
  • Side-channel analysis (SCA) is a cryptanalytic technique that exploits physical leakages, such as power consumption or electromagnetic emanations, from cryptographic devices to extract secret keys used in cryptographic algorithms. Recent studies have shown that training SCA models with semi-supervised learning can effectively overcome the problem of few labeled power traces. However, the process of training SCA models using semi-supervised learning generates many pseudo-labels. The performance of the SCA model can be reduced by some of these pseudo-labels. To solve this issue, we propose the HWFilter method to improve semi-supervised SCA. This method uses a Hamming Weight Pseudo-label Filter (HWPF) to filter the pseudo-labels generated by the semi-supervised SCA model, which enhances the model's performance. Furthermore, we introduce a normal distribution method for constructing the HWPF. In the normal distribution method, the Hamming weights (HWs) of power traces can be obtained from the normal distribution of power points. These HWs are filtered and combined into a HWPF. The HWFilter was tested using the ASCADv1 database and the AES_HD dataset. The experimental results demonstrate that the HWFilter method can significantly enhance the performance of semi-supervised SCA models. In the ASCADv1 database, the model with HWFilter requires only 33 power traces to recover the key. In the AES_HD dataset, the model with HWFilter outperforms the current best semi-supervised SCA model by 12%.

준지도 학습에서 꼭지점 중요도를 고려한 레이블 추론 (A Label Inference Algorithm Considering Vertex Importance in Semi-Supervised Learning)

  • 오병화;양지훈;이현진
    • 정보과학회 논문지
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    • 제42권12호
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    • pp.1561-1567
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    • 2015
  • 준지도 학습은 기계 학습의 한 분야로서, 레이블된 데이터와 레이블되지 않은 데이터 모두를 사용하여 모델을 학습함으로써 지도 학습에 비해 예측 정확도를 높일 수 있다. 최근 각광받고 있는 그래프 기반 준지도 학습은 입력 데이터를 그래프의 형태로 변환하는 그래프 구축 단계와 이를 사용하여 레이블되지 않은 데이터의 레이블을 예측하는 레이블 추론 단계로 나뉜다. 이 추론은 준지도 학습에서의 평활도 가정을 기본으로 한다. 본 연구에서는 추가로 각 꼭지점 중요도를 결합함으로써 개선된 레이블 추론 알고리즘을 제안한다. 이와 함께 알고리즘의 수렴성을 증명하고, 또한 실험을 통해 알고리즘의 우수성을 검증하였다.

점진적 능동준지도 학습 기반 고효율 적응적 얼굴 표정 인식 (High Efficiency Adaptive Facial Expression Recognition based on Incremental Active Semi-Supervised Learning)

  • 김진우;이필규
    • 한국인터넷방송통신학회논문지
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    • 제17권2호
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    • pp.165-171
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    • 2017
  • 사람의 얼굴 표정을 실제 환경에서 인식하는 데에는 여러 가지 난이한 점이 존재한다. 그래서 학습에 사용된 데이터베이스와 실험 데이터가 여러 가지 조건이 비슷할 때에만 그 성능이 높게 나온다. 이러한 문제점을 해결하려면 수많은 얼굴 표정 데이터가 필요하다. 본 논문에서는 능동준지도 학습을 통해 다양한 조건의 얼굴 표정 데이터를 쉽게 모으고 보다 빠르게 성능을 확보할 수 있는 방법을 제안한다. 제안하는 알고리즘은 딥러닝 네트워크와 능동 학습 (Active Learning)을 통해 초기 모델을 학습하고, 이후로는 준지도 학습(Semi-Supervised Learning)을 통해 라벨이 없는 추가 데이터를 확보하며, 성능이 확보될 때까지 이러한 과정을 반복한다. 위와 같은 능동준지도 학습(Active Semi-Supervised Learning)을 통해서 보다 적은 노동력으로 다양한 환경에 적합한 데이터를 확보하여 성능을 확보할 수 있다.

선별적인 임계값 선택을 이용한 준지도 학습의 SAR 분류 기술 (Semi-Supervised SAR Image Classification via Adaptive Threshold Selection)

  • 도재준;유민정;이재석;문효이;김선옥
    • 한국군사과학기술학회지
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    • 제27권3호
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    • pp.319-328
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    • 2024
  • Semi-supervised learning is a good way to train a classification model using a small number of labeled and large number of unlabeled data. We applied semi-supervised learning to a synthetic aperture radar(SAR) image classification model with a limited number of datasets that are difficult to create. To address the previous difficulties, semi-supervised learning uses a model trained with a small amount of labeled data to generate and learn pseudo labels. Besides, a lot of number of papers use a single fixed threshold to create pseudo labels. In this paper, we present a semi-supervised synthetic aperture radar(SAR) image classification method that applies different thresholds for each class instead of all classes sharing a fixed threshold to improve SAR classification performance with a small number of labeled datasets.

The use of support vector machines in semi-supervised classification

  • Bae, Hyunjoo;Kim, Hyungwoo;Shin, Seung Jun
    • Communications for Statistical Applications and Methods
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    • 제29권2호
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    • pp.193-202
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    • 2022
  • Semi-supervised learning has gained significant attention in recent applications. In this article, we provide a selective overview of popular semi-supervised methods and then propose a simple but effective algorithm for semi-supervised classification using support vector machines (SVM), one of the most popular binary classifiers in a machine learning community. The idea is simple as follows. First, we apply the dimension reduction to the unlabeled observations and cluster them to assign labels on the reduced space. SVM is then employed to the combined set of labeled and unlabeled observations to construct a classification rule. The use of SVM enables us to extend it to the nonlinear counterpart via kernel trick. Our numerical experiments under various scenarios demonstrate that the proposed method is promising in semi-supervised classification.