• 제목/요약/키워드: Science Laboratory

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Synchrotron Grazing Incidence X-ray Scattering and Its Applications in Polymer Nanotechnology

  • Ree, Moon-Hor;Lee, Byeong-Du;Yoon, Jin-Hwan;Heo, Kyu-Young;Jin, Kyeong-Sik;Jin, Sang-Woo;Kim, Hyun-Chul;Kim, Gha-Hee;Choi, Seung-Chul;Oh, Weon-Tae;Park, Young-Hee;Hwang, Yong-Taek;Kim, Jong-Seong
    • 한국고분자학회:학술대회논문집
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    • 한국고분자학회 2006년도 IUPAC International Symposium on Advanced Polymers for Emerging Technologies
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    • pp.120-120
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    • 2006

  • In our study grazing incidence X-ray scattering (GIXS) measurements with synchrotron radiation sources were conducted statically and in-situ for a series of nanoscale thin films prepared from nanoporous dielectrics, block copolymers, brush polymers, and molecular assemblies. All GIXS measurements were performed at the Pohang Accelerator Laboratory. The measured scattering data were analyzed in detail by using newly developed GIXS scattering theory. All GIXS results will be discussed in details with considering the materials chemistry and nanostructure formation process parameters.

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