• Title/Summary/Keyword: Scanning probe

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The Directivity Measurement of Angle Probe by Photoelastic Visualization Method (광탄성가시화법에 의한 사각탐촉자의 지향성 평가에 관한 연구)

  • Nam, Y.H.;Date, K.
    • Journal of the Korean Society for Nondestructive Testing
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    • v.14 no.2
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    • pp.83-89
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    • 1994
  • It is important for an ultrasonic testing to know the sound pressure field and the directivity of ultrasonic waves propagating in a solid. The directivity of ultrasonic wave is closely related to the sensitivity, the scanning pitch, the arrangement of angle probe, and the defect kind in ultrasonic testing. This paper describes on the directivity measurement of ultrasonic wave using ultrasonic wave visualization method. The directivity of the shear wave emitted from the angle probes were constant during propagation. The difference of directivity was existed between 2MHz and 4MHz angle probes. The centers of directivity were located backward from the incident poing and inside of the angle probe and were not changed during the wave propagation.

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Thermopiezoelectric Cantilever for Probe-Based Data Storage System

  • Jang, Seong-Soo;Jin, Won-Hyeog;Kim, Young-Sik;Cho, Il-Joo;Lee, Dae-Sung;Nam, Hyo-Jin;Bu, Jong. U.
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.6 no.4
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    • pp.293-298
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    • 2006
  • Thermopiezoelectric method, using poly silicon heater and a piezoelectric sensor, was proposed for writing and reading in a probe based data storage system. Resistively heated tip writes data bits while scanning over a polymer media and piezoelectric sensor reads data bits from the self-generated charges induced by the deflection of the cantilever. 34${\times}$34 array of thermopiezoelectric nitride cantilevers were fabricated by a single step wafer level transfer method. We analyzed the noise level of the charge amplifier and measured the noise signal. With the sensor and the charge amplifier 20mn of deflection could be detected at a frequency of 10KHz. Reading signal was obtained from the cantilever array and the sensitivity was calculated.

A Study on Space Charge of Organic Pentacene/metal Interface (유기물 Pentacene 박막과 금속 계면에서의 Space Charge 연구)

  • Yoon, Young-Woon;Babajayan, Arsen;Lee, Hoo-Neung;Kim, Song-Hui;Lee, Kie-Jin
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.20 no.1
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    • pp.41-46
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    • 2007
  • Surface potential properties at the interface of pentacene thin films on gold (Au) and aluminum (Al) surfaces were investigated by using a near-field scanning microwave microprobe (NSMM). The surface potential formed across the pentacene film was observed by measuring the microwave reflection coefficient $S_{11}$ and compared with the result of a Kelvin-probe method. The obtained reflection coefficient ${\Delta}S_{11}$ of the pentacene thin films on Al was decreased as the pentacene film thickness increased due to the increased accumulation of negative space charges, while for Au ${\Delta}S_{11}$ was essentially constant.

Defect Shape Recovering by Parameter Estimation Arising in Eddy Current Testing

  • Kojima, Fumio
    • Journal of the Korean Society for Nondestructive Testing
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    • v.23 no.6
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    • pp.622-634
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    • 2003
  • This paper is concerned with a computational method for recovering a crack shape of steam generator tubes of nuclear plants. Problems on the shape identification are discussed arising in the characterization of a structural defect in a conductor using data of eddy current inspection. A surface defect on the generator tube ran be detected as a probe impedance trajectory by scanning a pancake type coil. First, a mathematical model of the inspection process is derived from the Maxwell's equation. Second, the input and output relation is given by the approximate model by virtue of the hybrid use of the finite element and boundary element method. In that model, the crack shape is characterized by the unknown coefficients of the B-spline function which approximates the crack shape geometry. Finally, a parameter estimation technique is proposed for recovering the crack shape using data from the probe coil. The computational experiments were successfully tested with the laboratory data.

Biological Applications of Helium Ion Microscopy

  • Kim, Ki Woo
    • Applied Microscopy
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    • v.43 no.1
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    • pp.9-13
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    • 2013
  • The helium ion microscope (HIM) has recently emerged as a novel tool for imaging and analysis. Based on a bright ion source and small probe, the HIM offers advantages over the conventional field emission scanning electron microscope. The key features of the HIM include (1) high resolution (ca. 0.25 nm), (2) great surface sensitivity, (3) great contrast, (4) large depth-of-field, (5) efficient charge control, (6) reduced specimen damage, and (7) nanomachining capability. Due to the charge neutralization by flood electron beam, there is no need for conductive metal coating for the observation of insulating biological specimens by HIM. There is growing evidence that the HIM has substantial potential for high-resolution imaging of uncoated insulating biological specimens at the nanoscale.

Design of an electrostatic 2-axis MEMS stage with large area platform (대면적 플랫폼을 갖는 정전형 2 축 MEMS 스테이지의 설계)

  • 정일진;전종업;백경록;박규열
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2004.10a
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    • pp.373-378
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    • 2004
  • Recently the electrostatic 2-axis MEMS stages have been fabricated for the purpose of an application to PSD (Probebased Storage Device). However, most of them have low area efficiency, which is undesirable as data storage devices, since all of the components (springs, comb electrodes, anchors, platform, etc.) are placed in-plane. In this paper, we present a novel structure of electrostatic 2-axis MEMS stage that is characterized by having large area platform. For large area efficiency, the actuator part consisting of mainly comb electrodes and springs is placed right below the platform. In this article, the structures and operational principle of the MEMS stages are described, followed by design procedure, structural and modal analysis using FEM(Finite Element Method). The area efficiency of the MEMS stage was designed to be about 55%, that is very large compared with conventional ones having a few percentage.

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Experimental Study on the Mean Flow Characteristics of Forward-Curved Centrifugal Fans

  • Kwon, Eui-Yong;Cho, Nam-Hyo
    • Journal of Mechanical Science and Technology
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    • v.15 no.12
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    • pp.1728-1738
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    • 2001
  • Measurements have been made in an automotive HVAC b1ower for two different centrifugal fans. This work is directed at improving the performance of a conventional forward-curved centrifugal fan for a given small blower casing. Mean velocities and pressure have been measured using a miniature five-hole probe and a pressure scanning unit connected to an online data acquisition system. First, we obtained the fan performance versus flow rates showing a significant attenuation of unstable nature achieved with the new fan rotor in the surging operation range. Second, aerodynamic characterizations were carried out by investigating the velocity and pressure fields in the casing flow passage for different fan operating conditions. The measurements stowed that performance coefficients are strongly influenced by flow characteristics at the throat region. The main flow features ware common in both fans, but improved performance is achieved with tole new fan rotor, particularly in lower flow rate legions. Based on the measured results, design improvements were carried out in an acceptable operation range, which gave considerable insight into what features of flow behavior ware most important.

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Diffraction by a sub-wavelength-sized aperture in a metal plane (파장보다 작은 금속 구멍을 통한 회절)

  • ;;Arturo Chavez-Pirson
    • Proceedings of the Optical Society of Korea Conference
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    • 2000.02a
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    • pp.164-165
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    • 2000
  • 구멍에 의한 빛의 회절은 광학의 기본적인 문제로서, 최근 근접장 광학(Near-Field Optics)의 발전과 더불어서 파장보다 작은 구멍에서 일어나는 빛의 회절에 대한 관심이 고조되고 있다.$^{(1)(2)(3)}$ 본 연구에서는 그동안 주로 이론적으로 다루어지고 있던 파장보다 작은 금속 구멍을 통한 빛의 회절에 대해 실험결과들을 보고한다. 회절된 빛의 먼장(Far-field)과, 근접장(Near-field)을 모두 측정하기 위해서 고체각 주사기(Solid angle scanner)와 근접장 주사 광학 현미경(Near-field Scanning Optical Microscopy)이 사용되었다. 고체각 주사기(Solid angle scanner)를 사용하여 반구면 위에서의 빛의 이차원 세기 분포가 다양한 편광 상태에 따라서 측정되었고$^{(4)}$ 근접장 탐침(NSOM probe)으로 작은 금속 구멍주변을 주사함으로서 근접장이 측정되었다. 작은 구멍은 최근에 개발된 고출력 근접장 광섬유 탐침(High-power near-field fiber probe)구조를 이용하여 제작되었다.$^{(5)}$

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Analysis and Control f Contact Mode AFM (접촉모드 AFM의 시스템 분석 및 제어)

  • 정회원;심종엽;권대갑
    • Journal of the Korean Society for Precision Engineering
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    • v.15 no.3
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    • pp.99-106
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    • 1998
  • Recently, scientists introduced a new type of microscope capable of investigating nonconducting surfaces in an atomic scale, which is called AFM (Atomic Force Microscope). It was an innovative attempt to overcome the limitation of STM (Scanning Tunnelling Microscope) which has been able to obtain the image of conducting surfaces. Surfaces of samples are imaged with atomic resolution. The AFM is an imaging tool or a profiler with unprecedented 3-D resolution for various surface types. The AFM technology, however, leaves a lot of room for improvement due to its delicate and fragile probing mechanism. One of the room for improvements is gap control between probe tip and sample surface. Distance between probe tip and sample surface must be kept in below one Angtrom in order to measure the sample surface in Angstrom resolution. In this paper, AFM system modeling, experimental system identification and control scheme based on system identification are performed and finally sample surface is measured by home-built AFM with such a control scheme.

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Probe-based Storage Device(PSD)용 정전형 2축 MEMS 스테이지의 설계 및 제작

  • 백경록;전종업;박규열;박홍식;정주환;홍승범
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2004.05a
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    • pp.156-156
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    • 2004
  • 정보화 및 휴대화 시대에 있어서 폭증하는 정보량을 보다 작은 용기에, 보다 많이 그리고 보다 저렴하게 저장하기 위해서는, 기존 저장기기의 한계를 극복할 수 있는 새로운 개념의 차세대 정보 저장기기가 요구되어 진다. 나노미터 사이즈의 주사탐침이 기록매체표면에 근접하여 정보를 기록/재생하는 PSD는 상기한 저장기기의 대용량화, 소형화, 그리고 저가격화를 충족시킬 수 있는 신개념의 저장기기로, 그 기술적 근간을 SPM(Scanning Probe Microscope)기술과 MEMS(Micro Electro Mechanical Systems) 제작기술에 두고 있다.(중략)

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