• 비파괴검사학회지
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• 제37권1호
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• pp.21-28
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• 2017

배열 와전류 기술은 2차원적으로 나란히 정열된 다수의 와전류 코일로 구성된 탐촉자 면적에 대하여 기계적인 이동없이 전기적으로 주사할 수 있다. 단일 코일을 사용하는 와전류 기술과 비교하여 탐촉자가 한 번의 이동으로 넓은 영역을 검사할 뿐만 아니라 데이터 해석이 용이하여 검사 속도와 신뢰성을 향상시키는 장점이 있다. 이번 연구에서는 $2{\times}16$ 코일 배열의 배열 와전류 탐촉자와 순차적으로 송수신 코일을 선택하고 송수신 모드로 동작시키는 다중화기기를 개발하였다. 이 탐촉자를 이용하여 다양한 종류의 시편을 제작하여 표면검사를 수행하고, 와전류 신호 및 C-scan을 이미지 분석을 통해 송수신 모드 배열 와전류 기술의 특성에 대해 연구하였다.

• 비파괴검사학회지
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• 제36권4호
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• pp.288-294
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• 2016

Flexible ECT (eddy current array) probe를 사용하여 판재 및 용접부에 존재하는 notch 결함을 MS-5800E와 OmniScan MX 장비로 검출능력을 비교하고, 주파수와 lift-off를 변수로 신호의 특성을 비교하고자 하였다. 실험 결과, 500, 1000, 1500 kHz를 사용하였을 때 notch 깊이가 증가할수록 신호의 진폭이 증가하는 것으로 나타났고, lift-off 변화에 따른 신호의 진폭은 선형적으로 감소하였다. 또한 용접부 결함은 probe와 시험체의 접촉면에 밀접한 관계가 있다. Probe와 시험체의 접촉면이 양호한 경우 검출감도가 우수하고 그렇지 않은 경우에는 검출감도가 떨어지는 것을 알 수 있었다.

• 한국정보기술학회 영문논문지
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• 제9권1호
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• pp.1-10
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• 2019

In recent years, information collection of attacks through stealth port scanning technology has become more sophisticated. The most commonly used Nmap port scanner supports a variety of stealth scanning technologies along with the existing scanning techniques. Nmap also supports Idle scan that is different from conventional stealth scans. This is a more sophisticated stealth scan technique by applying the SYN scan and ACK scan techniques. In previous studies, the detection of Idle scanning was on zombie system, but was not on victim system. In this paper, we propose an effective detection method of Idle scan on victim system. The Idle scanning is composed of two stages; they are probing the zombie and victim system and scanning the victim system. We analyzed the characteristics of the two stages. The characteristics, we captured, are that SYN and RST packets are different from normal packet. We applied them to detection method, then Idle scanning is detected effectively.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 1998년도 추계종합학술대회 논문집
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• pp.335-338
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• 1998

This paper presents calculated results for the infinite phased arrays of the probe-fed rectagualr microstrip patches. A numerical model that is based on a rigorous Green's function and galerkin solutionsis is described. In an arbitrary scan plane, the input impedance and the input reflection coefficient versus the scand angle are calculated. The effects of substrate parameters on the phased arry antenna are considered. The scan blindness phenomenon due to the surface wave is observed and the input impedance bandwidth in the arbitrary scan plane is calculated.

• 대한의용생체공학회:의공학회지
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• 제36권5호
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• pp.150-154
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• 2015

Long time ultrasound scan can cause a temperature rise in human tissue and affect the physical body. This is closely connected with patients' safety. So many researchers have been studied on this matter with animals such as mammals and experimental rat, because diagnostic ultrasound has been used many types of human organ to find disease. Therefore, this study is tested on bean sprouts to search how far the tissue temperature changes because of the excessive scanning consequence from ultrasound diagnosis and frequent number of ultrasonic scanning and how much affect their growth. The United States and several European countries have restrictions for number of scanning, while South Korea does not have any limitation for using ultrasound diagnosis. Comparison was that how different condition affect its' growing. The testing group is like many pregnancy moms to have 50 minutes in B-mode and color doppler mode by linear, convex and sector probe every day for a week and the other is to scan only once during the testing period. As a result, it was confirmed that there was a significant growing difference on frequent ultrasonic scanning group compared to normal one. So the final conclusion is that there needs to have a significant limitation of ultrasound scan time and a number of inspection when having for diagnostic ultrasound and recommendation like USA and a few European countries.

• Journal of Electrical Engineering and Technology
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• 제6권1호
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• pp.119-122
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• 2011

A new high speed AFM probe has been proposed and fabricated. The probe is integrated with PZT actuated cantilever realized in bulk silicon wafer using heavily boron doped silicon as an etch stop layer. The cantilever thickness can be accurately controlled by the boron diffusion process. Thick SCS cantilever and integrated PZT actuator make it possible to be operated at high speed for fast imaging. The resonant frequency of the fabricated probe is 92.9 kHz and the maximum deflection is 5.3 ${\mu}m$ at 3 V. The fabricated probe successfully measured the surface of standard sample in an AFM system at the scan speed of 600${\mu}m$/sec.

• Progress in Superconductivity
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• 제13권1호
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• pp.28-33
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• 2011

Distribution of the local critical temperature and current density in YBCO coated conductors were analyzed using Low-temperature Scanning Laser and Hall Probe Microscopy (LTSLHPM). We prepared YBCO coated conductors of various bridge types to study the spatial distribution of the critical temperature and the current density in single and multi bridges. LTSLHPM system was modified for detailed linescan or two-dimensional scan both scanning laser and scanning Hall probe method simultaneously. We analyzed the local critical temperature of single and multi bridges from series of several linescans of scanning laser microscopy. We also investigated local current density and hysteresis curve of single bridge from experimental results of scanning Hall probe microscopy.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2002년도 추계학술대회 논문집
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• pp.595-598
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• 2002

Laser scanners are getting used more and more in reverse engineering and inspection. For CNC-driven laser scanners, it is important to automate the scanning operations to improve the accuracy of capture point data and to reduce scanning time in industry. However, there are few research works on laser scan planning system. In addition, it is difficult to directly analyze multi-patched freeform models. In this paper, we propose an STL (Stereolithography) mesh based laser scan planning system for complex freeform surfaces. The scan planning system consists of three steps and it is assumed that the CAD model of the part exists. Firstly, the surface model is approximated into STL meshes. From the mesh model, normal vector of each node point is estimated. Second, scan directions and regions are determined through the region growing method. Also, scan paths are generated by calculating the minimum-bounding rectangle of points that can be scanned in each scan direction. Finally, the generated scan directions and paths are validated by checking optical constraints and the collision between the laser probe and the part to be scanned.

• Journal of Electrochemical Science and Technology
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• 제13권3호
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• pp.347-353
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• 2022

Agarose hydrogel, a solid electrolyte, was investigated voltammetrically in terms of transport properties and natural convection effects using a ferrocenyl compound as a redox probe. To confirm the diffusion properties of solute on the agarose interface, the diffusion coefficients (D) of ferrocenemethanol in agarose hydrogel were determined by cyclic voltammetry (CV) according to the concentration of agarose hydrogel. While the value of D on the agarose interface is smaller than that in the bulk solution, the square root of the scan rate-dependent peak current reveals that the mass transport behavior of the solute on the agarose surface shows negligible convection or migration effects. In order to confirm the reduced natural convection on the gel interface, scan rate-dependent CV was performed in the solution phase and on the agarose surface, respectively. Slow scan voltammetry at the gel interface can determine a conventional and reproducible diffusion-controlled current down to a scan rate of 0.3 mV/s without any complicated equipment.

• 한국레이저가공학회지
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• 제12권2호
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• pp.26-30
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• 2009

Scanning Electron Microscopy (SEM) includes high voltage generator, electron gun, column, secondary electron detector, scan coil system and image grabber. Column includes electron lenses (condenser lens and objective lens). Condenser lens generates fringe field, makes focal length and control spot size. Focal length represents property of lens. Objective lens control focus. Most of the electrons emitted from the filament, are captured by the anode. The portion of the electron current that leaves the gun through the hole in the anode is called the beam current. Electron beam probe is called the focused beam on the specimen. Because of the lens and aperture, the probe current becomes smaller than the beam current. It generate various signals(backscattered electron, secondary electron) in an interaction with the specimen atoms. In this paper, we describe the result of research to develop the core elements for low-resolution SEM.