Microstructure analyses of aluminum nitride (AlN) using transmission electron microscopy (TEM) and electron back-scattered diffraction (EBSD) (투과전자현미경과 전자후방산란회절을 이용한 AlN의 미세구조 분석)
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- Journal of the Korean Crystal Growth and Crystal Technology
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- v.25 no.4
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- pp.127-134
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- 2015