• Journal of IKEEE
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• v.25 no.2
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• pp.315-321
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• 2021

In this paper, we have developed the multiple channel measurement system for IC Socket Test. The one can test the current-voltage measurements for pitting the several device specification, which analyze the thin current from several ㎂ to 5A with very low resistor mΩ. The increasement of the IC socket channel with lead pitch under 0.25 mm be need to perform several functions, concurrently. The system to perform these functions be designed to integrate several SMU(source measure unit) on board. So, we can reduce the 2 minutes test time per channel point to 40 sec, with daisy chain test method. Using by graphic interface, I-V curve mode and data logging technologies, we can implement the test flow methods and can make economies the time and cost.