• Journal of the Korea Academia-Industrial cooperation Society
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• v.10 no.4
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• pp.753-758
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• 2009

Recently the high-end CMOS image sensors are developed, conforming to the SMIA CCP2 specification, which is a high-speed low-power serial interface based on LVDS technology. But this kind of technology trend makes the existing equipments are no longer useful, although their capability is still good enough to handle the recent image sensors if there was no interfacing problem. In this paper, we propose and realize a data protocol conversion system that translates the SMIA CCP2 serial signals into the existing 10-bit parallel signals. The proposed system is composed of a de-serializer and a FPCA chip, and thus can be constructed on a small PCB which enables easy integration between the existing equipments and the new high-end image sensors. Besides, the maximum transfer rate by the SMIA specification is also achieved on the implemented system. So it is expected that the implemented system can be used as a general-purpose protocol converter in a variety of sensor-related application fields.

• Transactions of the Society of Information Storage Systems
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• v.5 no.2
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• pp.89-95
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• 2009

We setup the system to measure the noise characteristics of the 5M complementary metal-oxide semiconductor (CMOS) image sensor by generic measurement indicator of Standard mobile imaging architecture (SMIA) which is one of internal standard of mobile imaging architecture. To evaluate the effect of environment and setting parameters, such as temperature and integration time, we measure the variation of the dark signal, dynamic range and fixed pattern noise of image sensor. We also detect the number of defective pixels and cluster defects defined as adjacent single defect pixels at 5M CMOS image sensor. Then, we find the existence of some cluster defects in experiment, which are not expected in calculation.