• 한국지하수토양환경학회:학술대회논문집
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• 한국지하수토양환경학회 2005년도 INTERNATIONAL SYMPOSIUM ON SOIL & GROUNDWATER ENVIRONMENT
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• pp.193-194
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• 2005

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 1993년도 추계학술대회 논문집
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• pp.345-350
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• 1993

This paper presents a new method based upon the light scattering concept for on-the-machine measurement of roughness of ground surfaces. The present method utilizes fluxes of scattered lights condensed through lenses aligned along the specular direction. A theorctical analysis is preformed for the purpose of investigating the possibility of the method as well as determining the experimental condition. Experiment is also performed to show the effectiveness of the proposed method. The theoretical and experimental results show that the proposed method has a potential to identify a wide range of surface roughness and is robust enough to be useful in on-the-machine measurement of roughness of ground surfaces.

• 한국안전학회지
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• 제7권4호
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• pp.73-83
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• 1992

A new technique for the measurement of surface roughness based on the Intensity fluctuations of laser light backscattered form a moving surface has been introduced. The developed method will be quite useful for evaluating the surface quality under machining with more detailed Information by detecting the surface roughness along both directions simultaneously.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 1996년도 춘계학술대회 논문집
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• pp.232-236
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• 1996

This paper deals with an on-the-machine measurement method for roughness of ground surface by using flux ratio of scattered lights. A sensor and control unit is developed so as to e applied to surface grinding processes. The performance of the sensor is compared with that of stylus. The experimental investigation shows that not onlythe sensor has good performance as a surface roughness sensor but alsothe sensor is very useful for monitoring grinding condition in order to detect ill-conditioned grinding or dressing time.

• Journal of Mechanical Science and Technology
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• 제19권5호
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• pp.1131-1137
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• 2005

Methods for measuring surface roughness based on light reflectivity have advantages over methods based on light interference or diffraction, especially in in-situ, on-the-machine and in-process applications. However, measurement inconsistencies caused by changes in the specimen are still a drawback for field applications. In this study, we propose a new feedback-based algorithm to enhance the consistency against changes in the specimen. The algorithm is deduced from simulations based on light reflectance theory with typical modeled surfaces. The proposed method is similar to a digital controller and regulates the power of reflected light. Experiments varying heights and materials, verified the improvements in robustness of the method against measurement disturbances caused by specimen changes.

• Journal of Welding and Joining
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• 제21권7호
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• pp.65-70
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• 2003

Thermal emissivity is generally affected by surface situation of material such as roughness. In this study, the effect of surface roughness on measuring thermal emissivity is experimented. And emissivity measurement method and equipment using hemisperical mirror is also reviewed. As the result of this research, thermal emissivity increased as long as increasing surface roughness. So, surface roughness is a essential check point when we measure the emissivity.

• Korean Journal of Geomatics
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• 제3권1호
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• pp.43-51
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• 2003

This paper presents the benefits of using close-range digital photogrammetric techniques for measuring the roughness of rock surfaces, using digital stereo images obtained from a Rolleiflex 6006 metric camera. To precisely measure surface roughness, we researched on how to use the flat and curved reference surface obtained from geometrically corrected digital images of the rock surface by using the least squares method. To test the precision of the proposed technique, the surface roughness has been measured between the reference surface and sample areas of very smooth-surfaced rock. Then the results were compared with the measurements obtained from a laser sensor profilometer.

• Journal of electromagnetic engineering and science
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• 제18권2호
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• pp.136-140
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• 2018

We propose an improved semi-empirical scattering model for X-band radar backscattering from rough sea surfaces. This new model has a wider validity range of wind speeds than does the existing semi-empirical sea spectrum (SESS) model. First, we retrieved the small-roughness parameters from the sea surfaces, which were numerically generated using the Pierson-Moskowitz spectrum and measurement datasets for various wind speeds. Then, we computed the backscattering coefficients of the small-roughness surfaces for various wind speeds using the integral equation method model. Finally, the large-roughness characteristics were taken into account by integrating the small-roughness backscattering coefficients multiplying them with the surface slope probability density function for all possible surface slopes. The new model includes a wind speed range below 3.46 m/s, which was not covered by the existing SESS model. The accuracy of the new model was verified with two measurement datasets for various wind speeds from 0.5 m/s to 14 m/s.

• 한국정밀공학회지
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• 제7권3호
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• pp.37-47
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• 1990

In accordance with the high precision of mechanical elements, it has been required to high precision in surface roughness measurement and, therefore, stylus tip radius is manufa- ctured less than 2 .mu. m through ion sputter machining. In this experiment, by suing ion sputter machined stylus pf fine tip, radius and lapping machined stylus, surface roughness of standard specimens, silicon wafer were measured and then Rmax, Ra, RMS value were investi- gatedaccording to the variation of tip radius of stylus. As a result, measuring error due to the variation of stylus tip radius in surface roughness measurement was decreased by using ion sputter machined stylus and also the measuring accuracy was improved. And the measuring variation of Ra, RMS calculated from correlation coefficient lager than 0.9 on the wave of short period and amplitude using ion sputter machined stylus of fine tip radius.

• Current Optics and Photonics
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• 제1권6호
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• pp.604-612
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• 2017

An effective and precise method using a scanning white-light interferometer (SWLI) for three-dimensional surface measurements, in particular for roughness measurements, has been proposed. The measurement of a microscopically sloped area using an interferometer has limitations, due to the numerical aperture of the lens. In particular, for roughness measurements, it is challenging to obtain accurate height data for a sloped area using the interferometer, due to diffraction of the light. Owing to these optical limitations of the interferometer for roughness measurements, the Ra measurements performed using an interferometer contain errors. To overcome the limitations, we propose a method consisting of the following two steps. First, we evaluate the height data and set the invalid height area to be blank, using the characteristics of the modulus peak, which has a low peak value for signals that have low reliability in the interferogram. Next, we interpolate the blank area using the adjacent reliable area. Rubert roughness standards are used to verify the proposed method. The results obtained by the proposed method are compared to those obtained with a stylus profilometer. For the considered sinusoidal samples, Ra ranges from $0.053{\mu}m$ to $6.303{\mu}m$, and we show that the interpolation method is effective. In addition, the method can be applied to a random surface where Ra ranges from $0.011{\mu}m$ to $0.164{\mu}m$. We show that the roughness results obtained using the proposed method agree well with profilometer results. The $R^2$ values for both sinusoidal and random samples are greater than 0.995.