• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 1997.04a
• /
• pp.20-22
• /
• 1997

In ours study, we investigated the various properties in Te-light doped $Sb_{85}$G $e_{15}$ thin films such as the change of reflectance and transmittance according to phase change from amorphous to crystalline states In all films the transmittance was decreased, but the reflectance was increased by annealing. Particularly, the reflectance between as- deposited state and annealed state showed the largest change in the T $e_{0.5}$($Sb_{85}$G $e_{15}$ )$_{99.5}$ thin film at 780nm, which was about 40% in as-deposited state and about 70% in annealed state. Therefore, it might be considered that the T $e_{0.5}$($Sb_{85}$G $e_{15}$ )$_{99.5}$ thin film is recording medium showing to a good optical properties if it is used to optical recording of the phase change type. change type.ype.

• Proceedings of the KSRS Conference
• /
• 2004.10a
• /
• pp.196-200
• /
• 2004

The purpose of this study is to examine the image­based atmospheric correction models using the data from Landsat Enhanced Thermal Mapper Plus (ETM+) that have quite similar spectral characteristics to the forthcoming Korea Multi-Purpose SATellite (KOMPSAT)-2 Multi-Spectral Camera (MSC), and the in-situ measured surface reflectance data during satellite overflight. The main advantage of this type of correction is that it does not require in-situ measurements during each satellite overflight. While substantial differences are present between Top-Of-the Atmosphere (TOA) reflectance and in-situ measurements, the results showed that Case 1 based on COST model gives most accurate results among three cases. The accuracy of Case 2 is very close to Case 1 and its values are smaller than in-situ data. No notable features appear between some bands in the Case 3 and in-situ data. It is expected from this study that if the current methods are applied to the IKONOS high resolution data, we will be able to develop the suitable atmospheric correction methods for MSC data.

• Journal of the Korean Institute of Telematics and Electronics A
• /
• v.33A no.10
• /
• pp.98-106
• /
• 1996

A thin film of aluminum for ultra large scale integrated circuits metalization has been deposited on TiN and SiO$_{2}$ substrates by plasma assisted chemical vapor deposition using DMEAA (dimenthylethylamine alane) as a precursor. The effects of plasma on surface topology and growth characteristics were investigated. Thermal CVD Al could not be got continuous films on insulating subsrate such as SiO$_{2}$. However, it was found that Al films could be deposited on SiO$_{2}$ substate without any pretreatments by the hydrogen plasma for pyrolysis of DMEAA. Compared to the thermal CVD, PACVD films showed much better reflectance and resistance on TiN and SiO$_{2}$ substrate. We obtained mirror-like PACVD Al film of 90% reflectance and resistance on TiN and SiO$_{2}$ substrates. We obtained mirror-like PACVD Al film of 90% reflectance on TiN substrate. Excellent conformal step coverage was obtained on submicron contact holes ;by the PACVD blanket deposition.

• Proceedings of the KIEE Conference
• /
• 1993.11a
• /
• pp.258-260
• /
• 1993

Aluminum thin films were deposited on glass substrate using DC Magnetron Sputtering. Deposition rate, specular reflectance, and resistivity were investigated as a function of the input power, pressure, substrate temperature, and deposition time. Reflectance was reduced with increasing power, also with prolonging deposition time. Topography of the surface, which influences the properties such as electromigration, was observed from scanning electron microscope (SEM) and there was a close relation between the topography and measured reflectance.

• Journal of Biosystems Engineering
• /
• v.17 no.4
• /
• pp.370-381
• /
• 1992

Optical properties of fruits can provide information for nondestructive quality evaluation. An attempt is made here to develop an optical method for quality evaluation of apple using the spectral reflectance of its surface. Optical fiber was used to transmit light conveniently from light source to sample and sample to detector. Spectral reflectances of two types of Fuji variety-one of which was exposed to the sunlight directly (non-bagging) and the other was wrapped with bag (bagging) - were investigated from the wavelength ranging of 400nm to 700nm. The relationships between reflectance characteristics and quality indices such as chlorophyll content, anthocyanin content, and soluble solids were analyzed.

• Korean Journal of Optics and Photonics
• /
• v.9 no.5
• /
• pp.300-306
• /
• 1998

We have studied the optical effects in dielectric multilayer due to the interdiffusion formed during the deposition process. We suggest a numerical method to calculate the optical properties of periodical multilayer thin-films with gradient-index profiles. Using this method the spectral transmittance and reflectance were obtained for Fabry-Perot type filters, broad-band total reflectors and antireflection filters with interdiffusion layers. Interdiffusion reduced the spectral band width of high reflectance in total reflectors, and deteriorated the characteristics of multilayer AR-coatings leading to a large variation of reflectance if the number of the layers is large.

• Journal of Biosystems Engineering
• /
• v.22 no.2
• /
• pp.227-236
• /
• 1997

Manual grading and sorting of red-ginsengs are inherently unreliable due to its subjective nature. A computerized technique based on optical and geometrical characteristics was studied for the objective quality evalution. Spectral reflectance of three categories of red-ginsengs - "Chunsam", "Chisam", "Yangsam" - were measured and analyzed. Variation of reflectance among parts of a single ginseng was more significant than variation among the quality categories of ginsengs. A PC-based image processing algorithm was developed to extract geometrical features such as length and thickness of body, length and number of roots, position of head and branch point, etc. The algorithm consisted of image segmentation, calculation of Euclidean distance, skeletonization and feature extraction. Performance of the algorithm was evaluated using sample ginseng images and found to be mostly sussessful.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 1999.05a
• /
• pp.688-691
• /
• 1999

Light was of electric lamp was reflected by bulb reflector. In order to improve the efficiency of the electric lamp. it is inevitable that lamp, it is inevitable that improve the reflectance of bulb reflector. Important factors that affect the reflectance of bulb reflector is working pressure, distance between evaporation source to substrate, the situation of surface of glass. etch rate of glass, etc. In this paper. confirmed the effect of etching, working pressure etc. , and its effect for the reflectance of bulb reflector. Especially, concentration of HF in the etching solution and etching time is to be importnace for characteristic of bulb reflector.

• Bulletin of the Korean Chemical Society
• /
• v.27 no.11
• /
• pp.1832-1838
• /
• 2006

The present paper is focused on sorption concentration of silver (I) on some complex-forming ion exchangers in the initial thiocyanate form and subsequent determination of Ag(I) in the phase of anion exchanger AN-25 by diffuse reflectance spectroscopy. The sorption and kinetic characteristics of the sorbents were investigated. The apparent stability constants of thiocyanate silver complexes in the ion exchanger phase were calculated. The sorption-spectroscopic method is proposed for Ag(I) determination in aqueous solutions. The calibration curve is linear in the concentration range of 10-200 mg/L (sample volume is 10.0 mL) and the detection limit is 2 $\mu$g/mL. The presence of $Na^+,\;K^+,\;Mg^{2+}$ (macrocomponents) as well as of Ni (II), Co (II), Cu (II) do not hinder the determination of silver (I).

• Transactions of the Korean Society of Mechanical Engineers A
• /
• v.39 no.12
• /
• pp.1245-1249
• /
• 2015

This study investigated the reflection spectra of wrinkled metal/polymer multilayers. A wavy surface was self-assembled by annealing an aluminum-coated poly(methyl metacrylate) layer on a silicon substrate. The total and diffuse reflectance characteristics of the sample with additional metal coatings(aluminum or silver) were evaluated in the visible wavelength(400~800 nm) using a spectrophotometer. The results showed that the wrinkled surface enhanced the diffuse reflectance up to 40~50% in the lower-wavelength range, demonstrating its potential for applications to optical thin-film devices.