• Title/Summary/Keyword: Quantum Hall device

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Integer and fractional quantum Hall effect in graphene heterostructure

  • Youngwook Kim
    • Progress in Superconductivity and Cryogenics
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    • v.25 no.1
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    • pp.1-5
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    • 2023
  • The study of two-dimensional electron systems with extraordinarily low levels of disorder was, for a long time, the exclusive privilege of the epitaxial thin film research community. However, the successful isolation of graphene by mechanical exfoliation has truly disrupted this field. Furthermore, the assembly of heterostructures consisting of several layers of different 2D materials in arbitrary order by exploiting van der Waals forces has been a game-changer in the field of low-dimensional physics. This technique can be generalized to the large class of strictly 2D materials and offers unprecedented parameters to play with in order to tune electronic and other properties. It has led to a paradigm shift in the field of 2D condensed matter physics with bright prospects. In this review article, we discuss three device fabrication techniques towards high mobility devices: suspended structures, dry transfer, and pick-up transfer methods. We also address state-of-the-art device structures, which are fabricated by the van der Waals pick-up transfer method. Finally, we briefly introduce correlated ground states in the fractional quantum Hall regime.

Quantum Hall Effect of CVD Graphene

  • Kim, Young-Soo;Park, Su-Beom;Bae, Su-Kang;Choi, Kyoung-Jun;Park, Myung-Jin;Son, Su-Yeon;Lee, Bo-Ra;Kim, Dong-Sung;Hong, Byung-Hee
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.454-454
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    • 2011
  • Graphene shows unusual electronic properties, such as carrier mobility as high as 10,000 $cm^2$/Vs at room temperature and quantum electronic transport, due to its electronic structure. Carrier mobility of graphene is ten times higher than that of Silicon device. On the one hand, quantum mechanical studies have continued on graphene. One of them is quantum Hall effect which is observed in graphene when high magnetic field is applied under low temperature. This is why two dimension electron gases can be formed on Graphene surface. Moreover, quantum Hall effect can be observed in room temperature under high magnetic field and shows fractional quantization values. Quantum Hall effect is important because quantized Hall resistances always have fundamental value of h/$e^2$ ~ 25,812 Ohm and it can confirm the quantum mechanical behaviors. The value of the quantized Hall resistance is extremely stable and reproducible. Therefore, it can be used for SI unit. We study to measure quantum Hall effect in CVD graphene. Graphene devices are made by using conventional E-beam lithography and RIE. We measure quantum Hall effect under high magnetic field at low temperature by using He4 gas closed loop cryostat.

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The Electrical Characterization of the Quantized Hall Device with GaAs/AlGaAs heterojunction structure (GaAs/AlGaAs 이종접합된 양자흘 소자의 전기적 특성)

  • 유광민;류제천;한권수;서경철;임국형
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.07a
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    • pp.334-337
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    • 2002
  • The Quantum Hall Resistance(QHR) device which consists of GaAs/AlGaAs heterojunction structure is used for the realization of QHR Standard based on QHE. In order to characterize electrical contact resistances and dissipations of the device, it is slowly cooled down for eliminating thermal shock and unwanted noise. Then, the two properties are measured under 1.5 K and 5.15 T. Contact resistances are all within 1.2 Ω and longitudinal resistivities are all within 1 mΩ up to DC 90${\mu}$A. The results mean the device is operated well to realize the QHR Standard. To confirm it, the QHR Standard having the device is compared using a direct current comparator bridge with a 1 Ω resistance standard which the calibrated value is known from QHR standards maintained by other countries. The difference between them is agreed well within measurement uncertainty. It is thus considered that the properties of the device is estimated well and has good performance.

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Planar Hall Effect of GaMnAs Grown via low Temperature Molecular Beam Epitaxy (저온 분자선에피탁시 방법으로 성장시킨 GaMnAs의 planar Hall 효과)

  • Kim, Gyeong-Hyeon;Park, Jong-Hun;Kim, Byeong-Du;Kim, Do-Jin;Kim, Hyo-Jin;Im, Yeong-Eon;Kim, Chang-Su
    • Korean Journal of Materials Research
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    • v.12 no.3
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    • pp.195-199
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    • 2002
  • Planar Hall effect of ferromagnetic GaMnAs thin films was investigated for the first time. The films were grown in an optimized growth condition via molecular beam epitaxy at low temperatures. For the optimization of the growth conditions, we used reflection high-energy electron diffraction, electrical conductivity, double crystal x-ray diffraction, and superconducting quantum interference device measurements techniques. We observed that the difference between the longitudinal resistance and the transverse resistance matches the planar Hall resistance. The ratio of the planar Hall resistance at saturation magnetic field to that at zero reached above 500%.

A Study of Increase External Quantum Efficiency of GaP LED with AZO Electrode (AZO 전극을 갖는 GaP LED의 외부양자효율 향상에 관한 연구)

  • Kim, Kyeong-Min;Jin, Eun-Mi;Kim, Deok-Kyu;Park, Choon-Bae
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.11a
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    • pp.77-78
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    • 2006
  • In order to increase the efficiency of LED, transparent electrodes should be also developed. also suitable anti-reflection coating (ARC) is necessary for practical device applications. In our paper, Al-doped ZnO (AZO) films were fabricated by sputtering on GaP substrate(wavelength:620nm). Choosing optimum substrate temperature and sputtering rate, high quality AZO films were formed. We confirmed that the surface and electrical properties, which implemented using the methods of AFM, Hall measurement. The properties of AZO thin films especially depended on the thickness. We presumed that the change of the increase the external quantum efficiency of LED according to the AZO thin film of thickness.

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National Measurement Standard of Electrical Resistance using a Room Temperature Resistance Bridge (실온 저항브리지를 이용한 전기저항 측정의 국가표준 기술)

  • Yu, Kwang-Min;Park, Young-Tae;Kang, Jean-Hong;Kim, Han-Jun;Ihm, G.
    • Proceedings of the KIEE Conference
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    • 2002.07b
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    • pp.669-672
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    • 2002
  • Establishment of the Quantum Hall Resistance(QHR) Standard as national resistance standard using a room temperature DCC resistance bridge is described. A simple method are used to obtain the current dependence and error of 10: 1 ratio of the bridge instead of the method using a cryogenic resistance bridge. Measurement uncertainty of the system is estimated as $0.14{\times}10^{-6}$ and it is confirmed that the QHR standard is agreed well with the QHR of other NMIs using the cryogenic resistance bridge within the uncertainty, More improvement about performance of the QHR device and 10: 1 ratio accuracy is still under progress.

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A Study on Growth and Characterization of Magnetic Semiconductor GaMnAs Using LT-MBE (저온 분자선 에피택시법을 이용한 GaMnAs 자성반도체 성장 및 특성 연구)

  • Park Jin-Bum;Koh Dongwan;Park Young Ju;Oh Hyoung-taek;Shinn Chun-Kyo;Kim Young-Mi;Park Il-Woo;Byun Dong-Jin;Lee Jung-Il
    • Korean Journal of Materials Research
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    • v.14 no.4
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    • pp.235-238
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    • 2004
  • The LT-MBE (low temperature molecular beam epitaxy) allows to dope GaAs with Mn over its solubility limit. A 75 urn thick GaMnAs layers are grown on a low temperature grown LT-GaAs buffer layer at a substrate temperature of $260^{\circ}C$ by varying Mn contents ranged from 0.03 to 0.05. The typical growth rate for GaMnAs layer is fixed at 0.97 $\mu\textrm{m}$/h and the V/III ratio is varied from 25 to 34. The electrical and magnetic properties are investigated by Hall effect and superconducting quantum interference device(SQUID) measurements, respectively. Double crystal X-ray diffraction(DCXRD) is also performed to investigate the crystallinity of GaMnAs layers. The $T_{c}$ of the $Ga_{l-x}$ /$Mn_{x}$ As films grown by LT-MBE are enhanced from 38 K to 65 K as x increases from 0.03 into 0.05 whereas the $T_{c}$ becomes lower to 45 K when the V/III ratio increases up to 34 at the same composition of x=0.05. This means that the ferromagnetic exchange coupling between Mn-ion and a hole is affected by the growth condition of the enhanced V/III ratio in which the excess-As and As-antisite defects may be easily incorporated into GaMnAs layer.