• IEIE Transactions on Smart Processing and Computing
• /
• v.3 no.4
• /
• pp.246-250
• /
• 2014

Large mutual capacitance touch screen panels (TSP) are susceptible to display and ambient noise. This paper presents a multi-touch detection algorithm using an efficient noise compensation technique for large mutual capacitance TSPs. The sources of noise are presented and analyzed. The algorithm includes the steps to overcome each source of noise. The algorithm begins with a calibration technique to overcome the TSP mutual capacitance variation. The algorithm also overcomes the shadow effect of a hand close to TSP and mutual capacitance variation by dynamic threshold calculations. Time and space filters are also used to filter out ambient noise. The experimental results were used to determine the system parameters to achieve the best performance.

• Journal of the Institute of Electronics and Information Engineers
• /
• v.52 no.4
• /
• pp.62-70
• /
• 2015

Recently the demand for projected capacitance touch screens is sharply growing especially for large screens for medical devices, PC monitors and TVs. Large touch screens in general need a controller of higher complexity. They usually have a larger number of driving and sensing lines, and hence it takes longer to scan one frame for touch detection leading to a low frame scan rate. In this paper, a novel touch screen control technique is presented, which scans each frame in two steps of simultaneous multi-channel driving. The first step is to drive all driving lines simultaneously and determine which sensing lines have any touch. The second step is to sequentially rescan only the touched sensing lines, and determine exact positions of the touches. This technique can substantially increase the frame scan rate. This technique has been implemented using an FPGA and an AFE board, and tested using a commercial 23-inch touch screen panel. Experimental results show that the proposed technique improves the frame scan rate by 8.4 times for the 23-inch touch screen panel over conventional methods.

• Korean Journal of Materials Research
• /
• v.1 no.3
• /
• pp.125-131
• /
• 1991

Boron penetration phenomenon of $p^{+}$ silicon gate with as-deposited amorphous or polycrystalline Si upon high temperature annealing was investigated using high frequency C-V (Capacitance-Volt-age) analysis, CCST(Constant Current Stress Test), TEM(Transmission Electron Microscopy) and SIMS(Secondary Ion Mass Spectroscopy), C-V analysis showed that an as-deposited amorphous Si gate resulted in smaller positive shifts in flatband voltage compared wish a polycrystalline Si gate, thus giving 60-80 percent higher charge-to-breakdown of gate oxides. The reduced boron penetration of amorphous Si gate may be attributed to the fewer grain boundaries available for boron diffusion into the gate oxide and the shallower projected range of $BF_2$ implantation. The relation between electron trapping rate and flatband voltage shift was also discussed.

• Journal of the Institute of Electronics and Information Engineers
• /
• v.52 no.4
• /
• pp.71-79
• /
• 2015

This paper proposes a new touch screen sensing method that improves the drawback of conventional single-line sensing methods for mutual capacitance touch screen panels (TSPs). It introduces a dual sensing and voltage shifting method, which reduces the ambient noise effectively and enhances the touch signal strength. The dual sensing scheme reduces the detection time by doubling the integration speed using both edges of excitation pulse signals. The voltage shifting method enhances the signal-to-noise ratio (SNR) by increasing the voltage range of integrations, and maximizing the ADC's input dynamic range. Simulation and experimental results using a commercial 23" large touch screen show an SNR performance of 43dB and a scan rate 2 times faster than conventional schemes - key properties suited for a large touch screen panels. We implemented the proposed method into a TSP controller chip using Magnachip's CMOS 0.18um process.