• International Journal of Aeronautical and Space Sciences
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• 제4권1호
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• pp.63-74
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• 2003

The vortical flow of a 65-deg flat plate delta wing with a leading edge extension(LEX) was examined through off-surface visualization, 5-hole probe and hot-film measurements. The off-surface flow visualization technique used micro water droplets generated by a home-style ultrasonic humidifier and a laser beam sheet. The angles of attack ranged from 10 to 30 degrees, and the sideslip angles ranged from 0 to -15 degrees. The Reynolds number was $1.82{\times}10^5$ for the flow visualization, and $1.76{\times}10^6$ for the 5-hole probe and hot-film measurements. The comparison of the visualization photos and the flow field measurement showed that the two results were in a good agreement for the relative position and the structure of the wing and LEX vortices, even though the flow Reynolds numbers of the two results were much different. The wing vortex and the LEX vortex coil each other while maintaining a comparable strength and identity at zero sideslip. Neither a looping of the wing vortex around the strake vortex, nor the lopsided coiling of the stronger strake and the weaker wing vortices was observed. At non-zero sideslip, the downward movement of the LEX vortex when going downstream was enhanced on the windward side, and the downward and inboard movement of the LEX vortex when going downstream was suppressed on the leeward side. The counterclockwise coiling of the wing and LEX vortices was decreased significantly on the leeward side.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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• pp.132-132
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• 2008

Silicon carbide (SiC) is an attractive material for high-power, high-temperature, and high-frequency applications. So far, atomic force microscopy (AFM) has been extensively used to study the surface charges, dielectric constants and electrical potential distribution as well as topography in silicon-based device structures, whereas it has rarely been applied to SiC-based structures. In this work, the surface potential and topography distributions SiC with different doping levels were measured at a nanometer-scale resolution using a scanning kelvin probe force microscopy (SKPM) with a non-contact mode AFM. The measured results were calibrated using a Pt-coated tip and a metal defined electrical contacts of Au onto SiC. It is assumed that the atomically resolved surface potential difference does not originate from the intrinsic work function of the materials but reflects the local electron density on the surface. It was found that the work function of the Au deposited on SiC surface was higher than that of original SiC surface. The dependence of the surface potential on the doping levels in SiC, as well as the variation of surface potential with respect to the schottky barrier height has been investigated. The results confirm the concept of the work function and the barrier heights of metal/SiC structures.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2013년도 제45회 하계 정기학술대회 초록집
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• pp.182.1-182.1
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• 2013

Silver (Ag)는 높은 반사율을 가지고 있어 Top-Emission Organic Light Emitting Diode (T-OLED)의 반사전극으로 사용하기 적합하지만 일함수가 낮은 단점 (4.3 eV)을 가지고 있다. 이런 낮은 일함수를 증가시키기 위하여 Ag 박막 표면을 산화시켜 일함수를 증가시키기 위한 연구가 진행중에 있으며, 이 연구에서는 UV로 $O_3$을 발생시켜 Ag 박막 표면을 산화시키기 위한 연구를 진행하였다. 특히, Ag 박막 표면의 일함수 변화를 측정하기 위하여 SPM (Scanning Probe Microscopy)의 KPFM (Kelvin Probe Force Microscopy) mode를 적용하여 nano 영역에서의 일함수 변화를 surface potential로 측정하여 UV 표면 산화에 의한 표면 일함수 형상을 확인하였다. Ag 박막은 rf magnetron sputter를 사용하여, Si 기판위에 300nm 두께로 증착시켰다. 이후 $O_3$ 발생되는 UV 램프로 Ag 박막 표면 30초 간격으로 최대 5분간 산화시켰으며, 이후 KPFM mode를 사용하여 산화 시간에 따른 Ag 박막 표면의 potential 변화를 측정하였다. 0~3분간 산화된 Ag 박막 표면의 potential은 약 6 mV로 일정하였으나 3분 이후 최대 110 mV까지 급격하게 변화하는 것을 확인할 수 있었다. Ag 박막 표면의 RMS roughness는 UV 산화처리 전0.7 nm였으나, potential이 급격하게 증가하는 시점인 3분 이후 2.83 nm로 약 400% 이상 증가하였다. 이를 통해 $O_3$ 발생 UV 램프로 산화된 Ag 박막의 표면 물성은 처리 시간에 따라 급격히 변하는 것을 확인하였다.

• Tribology and Lubricants
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• 제28권5호
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• pp.203-211
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• 2012

Atomic force microscopy (AFM) has been used as a tool, not only for imaging surfaces, but also for measuring surface forces and mechanical properties at the nano-scale. Force calibration is crucial for quantitatively measuring the forces that act between the AFM probe of a force sensing cantilever and a sample. In this work, the lateral force calibrations of a V-shaped cantilever were performed using the finite element method, multiple pivot loading, and thermal noise methods. As a result, it was shown that the multiple pivot loading method was appropriate for the lateral force calibration of a V-shaped cantilever. Further, through crosschecking of the abovementioned methods, it was concluded that the thermal noise method could be used for determining the lateral spring constants as long as the lateral deflection sensitivity was accurately determined. To obtain the lateral deflection sensitivity from the sticking portion of the friction loop, the contact stiffness should be taken into account.

• 산업식품공학
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• 제22권4호
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• pp.381-385
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• 2018

즉석밥의 물성을 효율적으로 측정하기 위한 방법을 모색하고자 다양한 경도를 가진 즉석밥을 대상으로 4가지 다른 물성 기법을 적용하고 그 경도 결과를 비교 분석하였다. 이를 위해 disk, cylinder, rod, cone probe를 사용한 물성 측정법을 즉석밥에 적용하여 이들의 상관관계를 조사하였다. 모든 측정 방법에 대하여 수분함량에 따른 경도와의 상관관계를 분석한 결과 비교적 높은 음의 선형관계를 보여주어 수분함량이 증가할수록 경도가 감소하는 패턴을 명확히 보여주었다. Cone probe 측정법의 경우 압축력과 전단력을 통한 개별 밥알 시료의 변형이 가능하여 가장 높은 상관관계를 보여주었고, disk probe 측정법 또한 높은 양의 상관관계를 보였지만 죽과 같이 유동성을 가진 시료에는 적용이 어려웠다. 더 나아가 측정된 힘 값을 응력 형태로 전환시켜 상호 비교한 결과 cone과 rod probe 방법 그리고 rod와 cylinder probe 방법의 Pearson 계수가 0.9에 가까운 높은 상관관계를 보여주었다. 본 연구를 통하여 얻어진 결과는 즉석밥의 물성 측정을 위한 다양한 기법을 좀 더 이해하는데 기여할 수 있을 것으로 판단되며, 다양한 형태의 즉석밥을 개발하는데 활용될 수 있을 것으로 기대된다. 아울러, 본 연구를 통해서 얻어진 기계적 측정 결과와 관능평가 결과를 연관 지을 수 있다면 실제 식품 산업에서 활용될 수 있는 보다 의미 있는 결과를 제공할 수 있어 이에 대한 후속 연구가 필요하다.

• 한국세라믹학회지
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• 제56권4호
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• pp.340-349
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• 2019

In ferroelectric materials, piezoresponse force microscopy (PFM) has been widely used to explore ferroelectric domain switching. In this article, we review the fundamentals of nanoscale probing of ferroelectric domain switching using PFM, including the basic principles of PFM and a variety of PFM studies on local domain switching. We also introduce advanced PFM techniques for exploring switching behavior. Finally, we discuss several issues and perspectives in nanoscale probing of ferroelectric domain switching using PFM. PFM has played an important role in exploring switching behavior in ferroelectric materials, and it could be further developed to probe more detailed switching information.

• 한국소음진동공학회:학술대회논문집
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• 한국소음진동공학회 2000년도 추계학술대회논문집
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• pp.161-164
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• 2000

Currently, Atomic Force Microscope(AFM) has been widely used to measure the surface topography of a sample by detecting interaction force between atoms on the sample and extremely sharp probe tip. The vertical resolution of AFM is mainly determined by external vibration noise. The resolution of AFM shows different values for the different environment, thus it is necessary to determine relationship between the criteria and the resolution of AFM regardless of environment. In this paper, we discuss the allowable level of floor vibration for AFM equipment at given resolution. The vibration criteria can be used as reference data to design mechanical structure and to analyze the structural dynamics of AFM equipment.

• International Journal of Precision Engineering and Manufacturing
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• 제6권2호
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• pp.50-54
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• 2005

We report a simple, low cost, and reliable method for assembling a multi-walled nanotube (MWNT) to the end of a metal coated scanning probe microscopy (SPM) tip. By dropping the MWNT solution and applying an electric field between an SPM tip and an electrode, MWNTs which were dispersed into a dielectric solution were directly assembled onto the apex of the SPM tip due to the attraction by the dielectrophoretic force. The effective measurement of a MWNT -attached SPM tip was demonstrated by direct comparison with AFM images of a standard sample with a bare AFM tip.

• 정보저장시스템학회:학술대회논문집
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• 정보저장시스템학회 2005년도 추계학술대회 논문집
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• pp.185-189
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• 2005

We reported here nano-scale electrical phase-change recording in amorphous $Ge_2Sb_2Te_5$ media using an atomic force microscope (AFM) having conducting probes. In recording process, a pulse voltage is applied to the conductive probe that touches the media surface to change locally the electrical resistivity of a film. However, in contact operation, tip/media wear and contamination could major obstacles, which degraded SNR, reproducibility, and lifetime. In order to overcome tip/media wear and contamination in contact mode operation, we adopted the W incorporated diamond-like carbon (W-DLC) films as a protective layer. Optimized mutilayer media were prepared by a hybrid deposition system of PECVD and RF magnetron sputtering. When suitable electrical pulses were applied to media through the conducting probe, it was observed that data bits as small as 25 nm in diameter have been written and read with good reproducibility, which corresponds to a data density of $1 Tbit/inch^2$. We concluded that stable electrical phase-change recording was possible mainly due to W-DLC layer, which played a role not only capping layer but also resistive layer.

• 한국재료학회지
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• 제13권8호
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• pp.550-554
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• 2003

Current nanogold cluster synthesized by chemical routine with 11 or 55 atoms of gold has been widely used for immuno chemistry probe as a form of nanocluster conjugated with biomolecules. It would be an undeveloped region that the 1 nm size of nanogold could be made by materials engineering processing. Therefore, objective of this study is to minimize the size of gold nanocluster as a function of operating temperature and chamber pressure in inert gas condensation (IGC) processing. Evaporation temperature was controlled by input current from 50 A to 65 A. Chamber pressure was controlled by argon gas with a range of 0.05 to 2 torr. The gold nanocluster by IGC was evaluated by X-ray diffraction (XRD) and transmission electron microscopy (TEM). The gold nanocluster for TEM analysis was directly sampled with special in-situ method during the processing. Atomic force microscopy (AFM) was used to observe 3-D nanogold layer surfaces on a slide glass for the following biomolecule conjugation step. The size of gold nanoclusters had a close relationship with the processing condition such as evaporation temperature and chamber pressure. The approximately 1 nm size of nanogold was obtained at the processing condition for 1 torr at $1124 ^{\circ}C$.