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http://dx.doi.org/10.9725/kstle-2012.28.5.203

Quantitative Lateral Force Calibration of V-shaped AFM Cantilever  

Lee, Huijun (School of Mechanical Engineering, University of Ulsan)
Kim, Kwanghee (School of Mechanical Engineering, University of Ulsan)
Kim, Hyuntae (School of Mechanical Engineering, University of Ulsan)
Kang, Boram (School of Mechanical Engineering, University of Ulsan)
Chung, Koo-Hyun (School of Mechanical Engineering, University of Ulsan)
Publication Information
Tribology and Lubricants / v.28, no.5, 2012 , pp. 203-211 More about this Journal
Abstract
Atomic force microscopy (AFM) has been used as a tool, not only for imaging surfaces, but also for measuring surface forces and mechanical properties at the nano-scale. Force calibration is crucial for quantitatively measuring the forces that act between the AFM probe of a force sensing cantilever and a sample. In this work, the lateral force calibrations of a V-shaped cantilever were performed using the finite element method, multiple pivot loading, and thermal noise methods. As a result, it was shown that the multiple pivot loading method was appropriate for the lateral force calibration of a V-shaped cantilever. Further, through crosschecking of the abovementioned methods, it was concluded that the thermal noise method could be used for determining the lateral spring constants as long as the lateral deflection sensitivity was accurately determined. To obtain the lateral deflection sensitivity from the sticking portion of the friction loop, the contact stiffness should be taken into account.
Keywords
contact stiffness; friction loop; pivot loading method; thermal noise method;
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1 Binnig, G., Quate, C. F., and Gerber, C., "Atomic Force Microscope," Phys Rev Lett, Vol. 56, pp. 930-933, 1986.   DOI   ScienceOn
2 Chung, K. H., Bhadriraju, K., Spurlin, T. A., Cook, R. F., and Plant, A. L., "Nanomechanical Properties of Thin Films of Type I Collagen Fibrils," Langmuir, Vol. 26, pp. 3629-3636, 2010.   DOI
3 Giesbers, A. J. M., Zeitler, U., Neubeck, S., Freitag, F., Novoselov, K. S., and Maan, J. C., "Nanolithography and Manipulation of Graphene using an Atomic Force Microscope," Solid State Commun, Vol. 147, pp. 366-369, 2008.   DOI
4 Bordag, M., Ribayrol, A., Conache, G., Fröberg, L., Gray, S., Samuelson, L., Montelius, L., and Pettersson, H., "Shear Stress Measurements on InAs Nanowires by AFM Manipulation," Small, Vol. 3, pp. 1398-1401, 2007.   DOI
5 Bharat Bhushan and Kwang Joo Kwak and,Manuel Palacio, "Nanotribology and Nanomechanics of AFM Probe-Based Data Recording Technology," J Phys: Condens Matter, Vol. 20, pp. 365207, 2008.   DOI
6 Hutter, J. L. and Bechhoefer, J., "Calibration of Atomic-Force Microscope Tips," Rev. Sci. Instrum., Vol. 64, pp. 1868-1873, 1993.   DOI
7 Cleveland, J. P., Manne, S., Bocek, D., and Hansma, P. K., "A Nondestructive Method for Determining the Spring Constant of Cantilevers for Scanning Force Microscopy," Rev. Sci. Instrum., Vol. 64, pp. 403-405, 1993.   DOI
8 Sader, J. E., Chon, J. W. M., and Mulvaney, P., "Calibration of Rectangular Atomic Force Microscope Cantilevers," Rev. Sci. Instrum., Vol. 70, pp. 3967- 3969, 1999.   DOI
9 Higgins, M. J., Proksch, R., Sader, J. E., Polcik, M., Endoo, S. M., Cleveland, J. P., and Jarvis, S. P., "Noninvasive Determination of Optical Lever Sensitivity in Atomic Force Microscopy," Rev. Sci. Instrum., Vol. 77, pp. 013701, 2006.   DOI
10 Wagner, K., Cheng, P., and Vezenov, D., "Noncontact Method for Calibration of Lateral Forces in Scanning Force Microscopy," Langmuir, Vol. 27, pp. 4635-4644, 2011.   DOI
11 Cain, R. G., Biggs, S., and Page, N. W., "Force Calibration in Lateral Force Microscopy," J. Colloid Interface Sci., Vol. 227, pp. 55-65, 2000.   DOI
12 Varenberg, M., Etsion, I., and Halperin, G., "An Improved Wedge Calibration Method for Lateral Force in Atomic Force Microscopy," Rev. Sci. Instrum., Vol. 74, pp. 3362-3367, 2003.   DOI   ScienceOn
13 Torii, A., Sasaki, M., Hane, K., and Okuma, S., "A Method for Determining the Spring Constant of Cantilevers for Atomic Force Microscopy," Meas Sci Technol, Vol. 7, pp. 179-184, 1996.   DOI
14 Chung, K. H., Shaw, G. A., and Pratt, J. R., "Accurate Noncontact Calibration of Colloidal Probe Sensitivities in Atomic Force Microscopy," Rev. Sci. Instrum., Vol. 80, pp. 065107, 2009.   DOI
15 Ogletree, D. F., Carpick, R. W., and Salmeron, M., "Calibration of Frictional Forces in Atomic Force Microscopy," Rev. Sci. Instrum., Vol. 67, pp. 3298- 3306, 1996.   DOI   ScienceOn
16 Wang, F. and Zhao, X., "Effect of Contact Stiffness on Wedge Calibration of Lateral Force in Atomic Force Microscopy," Rev. Sci. Instrum., Vol. 78, pp. 043701, 2007.   DOI
17 Li, Q., Kim, K. -., and Rydberg, A., "Lateral Force Calibration of an Atomic Force Microscope with a Diamagnetic Levitation Spring System," Rev. Sci. Instrum., Vol. 77, pp. 065105, 2006.   DOI
18 Bogdanovic, G., Meurk, A., and Rutland, M. W., "Tip Friction - Torsional Spring Constant Determination," Colloid Surf B-Biointerfaces, Vol. 19, pp. 397-405, 2000.   DOI
19 Chung, K. H. and Reitsma, M. G., "Note: Lateral Force Microscope Calibration using Multiple Location Pivot Loading of Rectangular Cantilevers," Rev. Sci. Instrum., Vol. 81, pp. 026104, 2010.   DOI
20 Neumeister, J. M. and Ducker, W. A., "Lateral, Normal, and Longitudinal Spring Constants of Atomic Force Microscopy Cantilevers," Rev. Sci. Instrum., Vol. 65, pp. 2527-2531, 1994.   DOI   ScienceOn