• Journal of Sensor Science and Technology
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• v.29 no.2
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• pp.82-88
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• 2020

In this paper, we propose a complementary metal-oxide semiconductor (CMOS) binary image sensor with a gate/body-tied (GBT) p-channel metal-oxide-semiconductor field-effect transistor (PMOSFET)-type photodetector using a double-tail comparator for high-speed and low-power operations. The GBT photodetector is based on a PMOSFET tied with a floating gate (n+ polysilicon) and a body that amplifies the photocurrent generated by incident light. A double-tail comparator compares an input signal with a reference voltage and returns the output signal as either 0 or 1. The signal processing speed and power consumption of a double-tail comparator are superior over those of conventional comparator. Further, the use of a double-sampling circuit reduces the standard deviation of the output voltages. Therefore, the proposed CMOS binary image sensor using a double-tail comparator might have advantages, such as low power consumption and high signal processing speed. The proposed CMOS binary image sensor is designed and simulated using the standard 0.18 ㎛ CMOS process.

• Journal of Sensor Science and Technology
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• v.30 no.2
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• pp.82-87
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• 2021

In this paper, we propose a high-speed, low-power complementary metal-oxide semiconductor (CMOS) binary image sensor featuring a gate/body-tied (GBT) p-channel metal-oxide-semiconductor field-effect transistor (PMOSFET)-type photodetector based on a double-tail comparator. The GBT photodetector forms a structure in which the floating gate (n+ polysilicon) and body of the PMOSFET are tied, and amplifies the photocurrent generated by incident light. The double-tail comparator compares the output signal of a pixel against a reference voltage and returns a binary signal, and it exhibits improved power consumption and processing speed compared with those of a conventional two-stage comparator. The proposed sensor has the advantages of a high signal processing speed and low power consumption. The proposed CMOS binary image sensor was designed and fabricated using a standard 0.18 ㎛ CMOS process.

• Proceedings of the IEEK Conference
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• 1999.11a
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• pp.963-966
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• 1999

This Paper describes the design of high speed and low power comparator based on the feed forward bias control. Major building blocks of this comparator are composed of input offset canceling circuit and feed forward bias control circuit. The usual offset canceling circuit cancels the offset voltages by storing them in capacitors using MOS switches, The comparator of this paper employs the bias control circuit which generates bias signal from the input signal. The bias signal is applied to the capacitors and keeps the transfer of chares in the capacitors in the minimal amount, therefore making the comparator operate in stable condition and reduce decision time. The comparator in this form has very samll area and power dissipation. Maximum sampling rate is 200 Ms/sec. The comparator is designed in 0.65${\mu}{\textrm}{m}$ technology and the offset is less than 0.5㎷.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.5
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• pp.212-221
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• 1996

A CMOS comparator is designed for low voltage and low power operations. The proposed comparator consists of a preadmplifier followed by a regenerative latch. The preasmplifier reduces the power consumption to a half with the power-down mode and the dynamic offsets of the latch, which is affected by each device mismatch, is statistically analyzed. The circuit is designed and simulated using a 0.8.mu.m n-well CMOS process and the dissipated power is 0.16mW at a 20MHz clock speed based on a 3V supply.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.34C no.12
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• pp.28-36
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• 1997

In this paper, system application techniques of a low-voltage low-power CMOS comparator are proposed. The proposed techniques employ poly-layer lines instead of conventional dummy cells to improve the accuracy of comparators which are located in both ends of a comparator array. This technique is easily applicable for hihg-density systems such as memory. The proposed circuits are implemented using a 0.6 um signle-poly double-metal n-well CMOS technology and the dissipated power is 0.38 mW. at a 20MHz clock speed based on a 3V supply. The comparator offsets are measured separately and compared for system applications. Using the proposed techniues, the measured comparator offsets are reduced by 40% of a conventional case.

• Transactions on Electrical and Electronic Materials
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• v.17 no.6
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• pp.317-328
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• 2016

Over the past few decades, CMOS current comparators have been used in a wide range of applications, including analogue circuits, MVL (multiple-valued logic) circuits, and various electronic products. A current comparator is generally used in an ADC (analog-to-digital) converter of sensors and similar devices, and several techniques and approaches have been implemented to design the current comparator to improve performance. To this end, this paper presents a bibliographical survey of recently-published research on different current comparator topologies for low-power and high-speed applications. Moreover, several aspects of the CMOS current comparator are discussed regarding the design implementation, parameters, and performance comparison in terms of the power dissipation and operational speed. This review will serve as a comparative study and reference for researchers working on CMOS current comparators in low-power and high-speed applications.

• The Transactions of the Korean Institute of Electrical Engineers B
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• v.51 no.11
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• pp.622-627
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• 2002

The power comparison techniques have implemented power measurements, in which a power comparator is used to balance ac against a dc power obtained from known values. The developed power standard system using the comparison techniques consists of dc sources, ac source, control switches, resistive voltage dividers, resistive shunts and a power comparator. The total uncertainty of the power standard system was proved by analysis of the component instruments. Its expanded(k=2) uncertainty is evaluated to be less than 30 uW/VA at unit power factor and 42 uW/VA at power factor 0.5

• JSTS:Journal of Semiconductor Technology and Science
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• v.15 no.6
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• pp.695-702
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• 2015

A 1-V 1.6-GS/s 5.58-ENOB flash ADC with a high-speed time-domain comparator is proposed. The proposed time-domain comparator, which consumes low power, improves the comparison capability in high-speed operations and results in the removal of preamplifiers from the first-stage of the flash ADC. The time interpolation with two factors, implemented using the proposed time-domain comparator array and SR latch array, reduces the area and power consumption. The proposed flash ADC has been implemented using a 65-nm 1-poly 8-metal CMOS process with a 1-V supply voltage. The measured DNL and INL are 0.28 and 0.41 LSB, respectively. The SNDR is measured to be 35.37 dB at the Nyquist frequency. The FoM and chip area of the flash ADC are 0.38 pJ/c-s and $620{\times}340{\mu}m^2$, respectively.

• Proceedings of the KIEE Conference
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• 1995.07b
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• pp.676-678
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• 1995

The Paper describes a dc/nc power comparator for measurement of power. Based on a thermal principle, the instrument performs ac-dc transfer and absolute power and energy measurements in the range of currents from 0 to 5 A, voltages from 60 to 240 V, power factors from 0 to 1 and frequencies from 50 to 1000 Hz. The ac-dc transfer accuracy is better than 20 ppm at unity power factor and better than 50 ppm at 0.5 power factor.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.24 no.11
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• pp.1091-1097
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• 2013

This paper presents a rectifier with comparator using unbalanced body biasing in $0.11{\mu}m$ RF CMOS process. It is composed of MOSFETs and two comparators. The comparator is used to reduce reverse leakage current which occurs when the load voltage is higher than input voltage. For the comparator, unbalanced body biasing is devised. By using unbalanced body biasing, reference voltage for comparator changing from high state to low state is increased, and it reduces time interval for leakage current to flow. 13.56 MHz 2 Vpp signal is used for input and $1k{\Omega}$ resistor and 1 nF capacitor are used for output load for simulation and experimental environment. In simulation environment, voltage conversion efficiency(VCE) is 87.5 % and Power conversion efficiency(PCE) is 50 %. When the rectifier is measured, VCE shows 90.203 % and PCE shows 45 %.